يعرض 1 - 5 نتائج من 5 نتيجة بحث عن '"Brooks, Irene"', وقت الاستعلام: 0.97s تنقيح النتائج
  1. 1
    مؤتمر
    Advanced industrial S/TEM automation and metrology: Boundary of precision

    المؤلفون: Tan, Haiyan, Weng, Weihao, Rai, Raghaw, Kang, Chris, Dumas, Laurent, Brooks, Irene, Katnani, Ahmad, Zhong, Zhenxin, Hakala, Chris, Lu, Yinggang, Fretwell, John, Johnson, Timothy A.

    المصدر: 2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2018 29th Annual. :131-135 Apr, 2018

    Relation: 2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)

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  2. 2
    مؤتمر
    CD-TEM: Characterizing impact of TEM sample preparation on CD metrology

    المؤلفون: Kenslea, Anne, Hakala, Chris, Zhong, Zhenxin, Lu, Yinggang, Fretwell, John, Hager, Jack, Kang, Chris, Tan, Haiyan, Weng, Weihao, Dumas, Laurent, Brooks, Irene

    المصدر: 2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2018 29th Annual. :324-327 Apr, 2018

    Relation: 2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)

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  3. 3
    دورية أكاديمية
    An Evaluation of Beam-Damage Zone in Si Wafer Machined by Gatan MicroPREPTM Laser-Ablation.

    المؤلفون: Zhao, Wayne, Bennett, Corbin, Pichumani, Pradip Sairam, Walker, Gerald, Eaton, Kevin, Shearer, Michael Hassel, Dumas, Laurent, Brooks, Irene, Wang, Ying

    المصدر: Microscopy & Microanalysis; Aug2019 Supplement, p1146-1147, 2p

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  4. 4
    دورية أكاديمية
    An Evaluation of Beam-Damage Zone in Si Wafer Machined by Gatan MicroPREPTM Laser-Ablation.

    المؤلفون: Zhao, Wayne, Bennett, Corbin, Pichumani, Pradip Sairam, Walker, Gerald, Eaton, Kevin, Shearer, Michael Hassel, Dumas, Laurent, Brooks, Irene, Wang, Ying

    المصدر: Microscopy & Microanalysis; 2018Supplement1, Vol. 24, p1146-1147, 2p

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  5. 5
    دورية أكاديمية
    A Novel Strategy to Effectively Characterize FinFET Device by Multidirectional Comprehensive Analytical TEM in Semiconductor Wafer-foundries.

    المؤلفون: Wayne Zhao, Bianzhu Fu, Yong Wei, Brooks, Irene

    المصدر: Microscopy & Microanalysis; 2017 Special issue, Vol. 23, p336-337, 2p, 1 Color Photograph, 2 Maps

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