المؤلفون: Hermes, C., Lentz, F., Waser, R., Bruchhaus, R., Menzel, S., Fleck, K., Bottger, U., Wimmer, M., Salinga, M., Wuttig, M.

المصدر: 2011 11th Annual Non-Volatile Memory Technology Symposium Proceeding Non-Volatile Memory Technology Symposium (NVMTS), 2011 11th Annual. :1-4 Nov, 2011

Relation: 2011 11th Annual Non-Volatile Memory Technology Symposium (NVMTS)

المؤلفون: Linn, E., Menzel, S., Rosezin, R., Bottger, U., Bruchhaus, R., Waser, R.

المصدر: 2011 11th IEEE International Conference on Nanotechnology Nanotechnology (IEEE-NANO), 2011 11th IEEE Conference on. :1474-1478 Aug, 2011

Relation: 2011 IEEE 11th International Conference on Nanotechnology (IEEE-NANO)

المؤلفون: Scheithauer, U., Hösler, W., Bruchhaus, R.

مصطلحات موضوعية: Condensed Matter - Materials Science

URL الوصول: http://arxiv.org/abs/1502.03413

المؤلفون: Schreiter, M., Bruchhaus, R., Pitzer, D., Wersing, W.

المصدر: ISAF 1998. Proceedings of the Eleventh IEEE International Symposium on Applications of Ferroelectrics (Cat. No.98CH36245) Ferroelectrics applications Applications of Ferroelectrics, 1998. ISAF 98. Proceedings of the Eleventh IEEE International Symposium on. :181-185 1998

Relation: ISAF 1998. Proceedings of the Eleventh IEEE International Symposium on Applications of Ferroelectrics

المؤلفون: Thomas, D.J., Song, Y.P., Powell, K., Bruchhaus, R.

المصدر: 2001 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (IEEE Cat. No.01CH37160) Advanced semiconductor manufacturing Advanced Semiconductor Manufacturing Conference, 2001 IEEE/SEMI. :81-83 2001

Relation: 2001 IEEE/SEMI Advanced Semiconductor Manufacturing Conference

المؤلفون: Hermes, C., Bruchhaus, R., Waser, R.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 32(11):1588-1590 Nov, 2011

المؤلفون: Hermes, C., Wimmer, M., Menzel, S., Fleck, K., Bruns, G., Salinga, M., Bottger, U., Bruchhaus, R., Schmitz-Kempen, T., Wuttig, M., Waser, R.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 32(8):1116-1118 Aug, 2011

المؤلفون: Rosezin, R., Linn, E., Kugeler, C., Bruchhaus, R., Waser, R.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 32(6):710-712 Jun, 2011

المؤلفون: Rosezin, R., Linn, E., Nielen, L., Kugeler, C., Bruchhaus, R., Waser, R.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 32(2):191-193 Feb, 2011

المؤلفون: Symanczyk, R., Bruchhaus, R., Dittrich, R., Kund, M.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 30(8):876-878 Aug, 2009