المؤلفون: Rana, U., Brunco, D. P., Raman, S., Triyoso, D.H., Stoker, M.W., Johnson, J. B., Pantisano, L., Seo, K. D., Zhao, M., Reznicek, A., Krishnan, R., Moser, B., Freeman, J., Jang, L., Kaganer, E.

المصدر: 2019 Device Research Conference (DRC) Device Research Conference (DRC), 2019. :251-252 Jun, 2019

Relation: 2019 Device Research Conference (DRC)

المؤلفون: Eneman, G., De Jaeger, B., Simoen, E., Brunco, D. P., Hellings, G., Mitard, J., De Meyer, K., Meuris, M., Heyns, M. M.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 56(12):3115-3122 Dec, 2009

المؤلفون: Maji, D., Crupi, F., Amat, E., Simoen, E., De Jaeger, B., Brunco, D. P., Manoj, C. R., Rao, V. R., Magnone, P., Giusi, G., Pace, C., Pantisano, L., Mitard, J., Rodriguez, R., Nafria, M.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 56(5):1063-1069 May, 2009

المؤلفون: Eneman, G., Wiot, M., Brugere, A., Sicart I Casain, O., Sonde, S., Brunco, D. P., De Jaeger, B., Satta, A., Hellings, G., De Meyer, K., Claeys, C., Meuris, M., Heyns, M. M., Simoen, E.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 55(9):2287-2296 Sep, 2008

المؤلفون: Nicholas, G., De Jaeger, B., Brunco, D. P., Zimmerman, P., Eneman, G., Martens, K., Meuris, M., Heyns, M. M.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 54(9):2503-2511 Sep, 2007

المؤلفون: Nicholas, G., Brunco, D. P., Dimoulas, A., Van Steenbergen, J., Bellenger, F., Houssa, M., Caymax, M., Meuris, M., Panayiotatos, Y., Sotiropoulos, A.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 54(6):1425-1430 Jun, 2007

المؤلفون: Crupi, I., Degraeve, R., Govoreanu, B., Brunco, D. P., Roussel, P., Van Houdt, J.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 6(4):509-516 Dec, 2006

المؤلفون: Mertens, H., Ritzenthaler, R., Hikavyy, A., Franco, J., Lee, J. W., Brunco, D. P., Eneman, G., Witters, L., Mitard, J., Kubicek, S., Devriendt, K., Tsvetanova, D., Milenin, A. P., Vrancken, C., Geypen, J., Bender, H., Groeseneken, G., Vandervorst, W., Barla, K., Collaert, N., Horiguchi, N., Thean, A.V-Y

المصدر: 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers VLSI Technology (VLSI-Technology): Digest of Technical Papers, 2014 Symposium on. :1-2 Jun, 2014

Relation: 2014 IEEE Symposium on VLSI Technology

المؤلفون: Mitard, J., Witters, L., Loo, R., Lee, S.H., Sun, J.W., Franco, J., Ragnarsson, L.-A., Brand, A., Lu, X., Yoshida, N., Eneman, G., Brunco, D. P., Vorderwestner, M., Storck, P., Milenin, A.P., Hikavyy, A., Waldron, N., Favia, P., Vanhaeren, D., Vanderheyden, A., Olivier, R., Mertens, H., Arimura, H., Sonja, S., Vrancken, C., Bender, H., Eyben, P., Barla, K., Lee, S-G, Horiguchi, N., Collaert, N., Thean, A.V-Y.

المصدر: 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers VLSI Technology (VLSI-Technology): Digest of Technical Papers, 2014 Symposium on. :1-2 Jun, 2014

Relation: 2014 IEEE Symposium on VLSI Technology

المؤلفون: Eneman, G., Sicart i Casain, O., Simoen, E., Brunco, D. P., De Jaeger, B., Satta, A., Nicholas, G., Claeys, C., Meuris, M., Heyns, M. M.

المصدر: ESSDERC 2007 - 37th European Solid State Device Research Conference Solid State Device Research Conference, 2007. ESSDERC 2007. 37th European. :454-457 Sep, 2007

Relation: ESSDERC 2007 - 37th European Solid State Device Research Conference