المؤلفون: Mildner, Michael, Brunner, Michaela, Gruber, Michael, Baehr, Johanna, Sigl, Georg

المصدر: 2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS) Design & Diagnostics of Electronic Circuits & Systems (DDECS), 2024 27th International Symposium on. :53-56 Apr, 2024

Relation: 2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS)

المؤلفون: Brunner, Michaela, Lee, Hye Hyun, Hepp, Alexander, Baehr, Johanna, Sigl, Georg

المصدر: 2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS) Design & Diagnostics of Electronic Circuits & Systems (DDECS), 2024 27th International Symposium on. :47-52 Apr, 2024

Relation: 2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS)

المؤلفون: Lippmann, Bernhard, Hatsch, Joel, Seidl, Stefan, Houdeau, Detlef, Subrahmanyam, Niranjana Papagudi, Schneider, Daniel, Safieh, Malek, Passarelli, Anne, Maftun, Aliza, Brunner, Michaela, Music, Tim, Pehl, Michael, Siddiqui, Tauseef, Brederlow, Ralf, Schlichtmann, Ulf, Driemeyer, Bjoern, Ortmanns, Maurits, Hesselbarth, Robert, Hiller, Matthias

المصدر: 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2023. :1-6 Apr, 2023

Relation: 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)

المؤلفون: Brunner, Michaela, Ibrahimpasic, Tarik, Li, Bing, Zhang, Grace Li, Schlichtmann, Ulf, Sigl, Georg

المصدر: 2022 IEEE Physical Assurance and Inspection of Electronics (PAINE) Physical Assurance and Inspection of Electronics (PAINE), 2022 IEEE. :1-7 Oct, 2022

Relation: 2022 IEEE Physical Assurance and Inspection of Electronics (PAINE)

المؤلفون: Baehr, Johanna, Hepp, Alexander, Brunner, Michaela, Malenko, Maja, Sigl, Georg

المصدر: 2022 25th Euromicro Conference on Digital System Design (DSD) DSD Digital System Design (DSD), 2022 25th Euromicro Conference on. :504-512 Aug, 2022

Relation: 2022 25th Euromicro Conference on Digital System Design (DSD)

المؤلفون: Brunner, Michaela, Lee, Hye Hyun, Hepp, Alexander, Baehr, Johanna, Sigl, Georg

المصدر: 2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS), Kielce, Poland, 2024, pp. 47-52

مصطلحات موضوعية: Computer Science - Cryptography and Security

URL الوصول: http://arxiv.org/abs/2305.03707

المؤلفون: Ludwig, Matthias, Hepp, Alexander, Brunner, Michaela, Baehr, Johanna

المصدر: 2021 IEEE Physical Assurance and Inspection of Electronics (PAINE) Physical Assurance and Inspection of Electronics (PAINE), 2021 IEEE. :1-8 Nov, 2021

Relation: 2021 IEEE Physical Assurance and Inspection of Electronics (PAINE)

المؤلفون: Brunner, Michaela, Gruber, Michael, Tempelmeier, Michael, Sigl, Georg

المصدر: 2020 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) ISVLSI VLSI (ISVLSI), 2020 IEEE Computer Society Annual Symposium on. :114-119 Jul, 2020

Relation: 2020 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)

المؤلفون: Brunner, Michaela, Baehr, Johanna, Sigl, Georg

المصدر: 2019 IEEE International Symposium on Hardware Oriented Security and Trust (HOST) Hardware Oriented Security and Trust (HOST), 2019 IEEE International Symposium on. :151-160 May, 2019

Relation: 2019 IEEE International Symposium on Hardware Oriented Security and Trust (HOST)

المؤلفون: Zhang, Grace Li, Li, Bing, Li, Meng, Yu, Bei, Pan, David Z., Brunner, Michaela, Sigl, Georg, Schlichtmann, Ulf

مصطلحات موضوعية: Computer Science - Cryptography and Security, Computer Science - Hardware Architecture

URL الوصول: http://arxiv.org/abs/2003.00862