المؤلفون: Franco, J., Arimura, H., de Marneffe, J.-F., Brus, S., Ritzenthaler, R., Litta, E. Dentoni, Croes, K., Kaczer, B., Horiguchi, N.

المصدر: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023

Relation: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)

المؤلفون: Arimura, H., Brus, S., Franco, J., Oniki, Y., Vandooren, A., Conard, T., Chan, B.-T., Kannan, B., Samiee, M., Li, W., Deminskyi, P., Shero, E., Bakke, J., Jourdan, N., Verni, G. Alessio, Maes, J. W., Givens, M., Ragnarsson, L.-A., Mitard, J., Litta, E. Dentoni, Horiguchi, N.

المصدر: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023

Relation: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)

المؤلفون: Franco, J., Arimura, H., De Marneffe, J.-F., Claes, D., Brus, S., Vandooren, A., Litta, E. Dentoni, Horiguchi, N., Croes, K., Kaczer, B.

المصدر: 2022 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2022 International. :30.4.1-30.4.4 Dec, 2022

Relation: 2022 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Capogreco, E., Arimura, H., Ritzenthaler, R., Brus, S., Oniki, Y., Dupuy, E., Sebaai, F., Radisic, D., Chan, B. T., Zhou, D., Machkaoutsan, V., Yoon, S., Itokawa, H., Yamaguchi, M., Gao, Z., Fazan, P., Chen, Y., Subramanian, S., Ragnarsson, L.-A., Spessot, A., Litta, E. Dentoni, Horiguchi, N.

المصدر: 2022 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2022 International. :26.2.1-26.2.4 Dec, 2022

Relation: 2022 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Porret, C., Everaert, J.-L., Schaekers, M., Ragnarsson, L.-A., Hikavyy, A., Rosseel, E., Rengo, G., Loo, R., Khazaka, R., Givens, M., Piao, X., Mertens, S., Heylen, N., Mertens, H., De Carvalho Cavalcante, C. Toledo, Sterckx, G., Brus, S., Mehta, A. Nalin, Korytov, M., Batuk, D., Favia, P., Langer, R., Pourtois, G., Swerts, J., Litta, E. Dentoni, Horiguchi, N.

المصدر: 2022 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2022 International. :34.1.1-34.1.4 Dec, 2022

Relation: 2022 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Veloso, A., Eneman, G., Matagne, P., Vermeersch, B., Jourdain, A., Arimura, H., O'Sullivan, B., Chen, R., De Keersgieter, A., Simoen, E., Radisic, D., Oniki, Y., Laffitte, A., Brus, S., Beyne, E., Litta, E. Dentoni, Horiguchi, N.

المصدر: 2022 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2022 International. :23.3.1-23.3.4 Dec, 2022

Relation: 2022 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Franco, J., Arimura, H., Brus, S., Dentoni Litta, E., Croes, K., Horiguchi, N., Kaczer, B.

المصدر: In Solid State Electronics June 2024 216

المؤلفون: Arimura, H., Ragnarsson, L.-A., Oniki, Y., Franco, J., Vandooren, A., Brus, S., Leonhardt, A., Sippola, P., Ivanova, T., Verni, G. Alessio, Chang, R.-J., Xie, Q., Givens, M., Mitard, J., Biesemans, S., Litta, E. Dentoni, Horiguchi, N.

المصدر: 2021 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2021 IEEE International. :13.5.1-13.5.4 Dec, 2021

Relation: 2021 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Schram, T., Smets, Q., Groven, B., Heyne, M. H., Kunnen, E., Thiam, A., Devriendt, K., Delabie, A., Lin, D., Lux, M., Chiappe, D., Asselberghs, I., Brus, S., Huyghebaert, C., Sayan, S., Juncker, A., Caymax, M., Radu, I. P.

المصدر: 2017 47th European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), 2017 47th European. :212-215 Sep, 2017

Relation: ESSDERC 2017 - 47th IEEE European Solid-State Device Research Conference (ESSDERC)

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