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1مؤتمر
المؤلفون: Raiola, Pascal, Thiemann, Benjamin, Burchard, Jan, Atteya, Ahmed, Lylina, Natalia, Wunderlich, Hans-Joachim, Becker, Bernd, Sauer, Matthias
المصدر: 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2019. :1016-1021 Mar, 2019
Relation: 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE)
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2مؤتمر
المؤلفون: Neubauer, Felix, Burchard, Jan, Raiola, Pascal, Rivoir, Jochen, Becker, Bernd, Sauer, Matthias
المصدر: 2018 IEEE 36th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2018 IEEE 36th. :1-6 Apr, 2018
Relation: 2018 IEEE 36th VLSI Test Symposium (VTS)
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3مؤتمر
المؤلفون: Burchard, Jan, Erb, Dominik, Becker, Bernd
المصدر: 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2018. :385-390 Mar, 2018
Relation: 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)
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4مؤتمر
المؤلفون: Burchard, Jan, Gay, Mael, Ekossono, Ange-Salome Messeng, Horacek, Jan, Becker, Bernd, Schubert, Tobias, Kreuzer, Martin, Polian, Ilia
المصدر: 2017 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC) FDTC Fault Diagnosis and Tolerance in Cryptography (FDTC), 2017 Workshop on. :65-72 Sep, 2017
Relation: 2017 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC)
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5مؤتمر
المؤلفون: Burchard, Jan, Ekossono, Ange-Salome Messeng, Horacek, Jan, Gay, Mael, Becker, Bernd, Schubert, Tobias, Kreuzer, Martin, Polian, Ilia
المصدر: 2017 IEEE 2nd International Verification and Security Workshop (IVSW) Verification and Security Workshop (IVSW), 2017 IEEE 2nd International. :7-12 Jul, 2017
Relation: 2017 IEEE 2nd International Verification and Security Workshop (IVSW)
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6مؤتمر
المؤلفون: Burchard, Jan, Erb, Dominik, Reddy, Sudhakar M., Singh, Adit D., Becker, Bernd
المصدر: 2017 IEEE 35th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2017 IEEE 35th. :1-6 Apr, 2017
Relation: 2017 IEEE 35th VLSI Test Symposium (VTS)
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7مؤتمر
المؤلفون: Burchard, Jan, Neubauer, Felix, Raiola, Pascal, Erb, Dominik, Becker, Bernd
المصدر: 2017 18th IEEE Latin American Test Symposium (LATS) Test Symposium (LATS), 2017 18th IEEE Latin American. :1-6 Mar, 2017
Relation: 2017 18th IEEE Latin American Test Symposium (LATS)
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8مؤتمر
المؤلفون: Burchard, Jan, Erb, Dominik, Singh, Adit D., Reddy, Sudhakar M., Becker, Bernd
المصدر: Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017. :422-427 Mar, 2017
Relation: 2017 Design, Automation & Test in Europe Conference & Exhibition (DATE)
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9مؤتمر
المؤلفون: Burchard, Jan, Schubert, Tobias, Becker, Bernd
المصدر: 2016 IEEE International Conference on Cluster Computing (CLUSTER) Cluster Computing (CLUSTER), 2016 IEEE International Conference on. :326-335 Sep, 2016
Relation: 2016 IEEE International Conference on Cluster Computing (CLUSTER)
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10كتاب إلكتروني
المؤلفون: Horáček, JanAff17, Burchard, JanAff18, Becker, BerndAff18, Kreuzer, MartinAff17
المساهمون: Hutchison, David, Series editorAff1, Kanade, Takeo, Series editorAff2, Kittler, Josef, Series editorAff3, Kleinberg, Jon M., Series editorAff4, Mattern, Friedemann, Series editorAff5, Mitchell, John C., Series editorAff6, Naor, Moni, Series editorAff7, Pandu Rangan, C., Series editorAff8, Steffen, Bernhard, Series editorAff9, Terzopoulos, Demetri, Series editorAff10, Tygar, Doug, Series editorAff11, Weikum, Gerhard, Series editorAff12, Blömer, Johannes, editorAff13, Kotsireas, Ilias S., editorAff14, Kutsia, Temur, editorAff15, Simos, Dimitris E., editorAff16
المصدر: Mathematical Aspects of Computer and Information Sciences : 7th International Conference, MACIS 2017, Vienna, Austria, November 15-17, 2017, Proceedings. 10693:147-162