المؤلفون: Prasad, Divya, Kini, Girish, Chandrasekaran, Sriram, Gurumurthi, Sudhanva, Novak, Amy, Burd, Tom

المصدر: 2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023

Relation: 2023 International Electron Devices Meeting (IEDM)

المؤلفون: Shukla, Prachi, Aguren, Derrick, Burd, Tom, Coskun, Ayse K., Kalamatianos, John

المصدر: 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2023. :1-6 Apr, 2023

Relation: 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)

المؤلفون: Munger, Benjamin, Wilcox, Kathy, Sniderman, Jeshuah, Tung, Chuck, Johnson, Brett, Schreiber, Russell, Henrion, Carson, Gillespie, Kevin, Burd, Tom, Fair, Harry, Johnson, David, White, Jonathan, McLelland, Scott, Bakke, Steven, Olson, Javin, McCracken, Ryan, Pickett, Matthew, Horiuchi, Aaron, Nguyen, Hien, Jackson, Tim H

المصدر: 2023 IEEE International Solid-State Circuits Conference (ISSCC) Solid-State Circuits Conference (ISSCC), 2023 IEEE International. :38-39 Feb, 2023

Relation: 2023 IEEE International Solid-State Circuits Conference (ISSCC)

المؤلفون: Bartolotti, Richard, Burd, Tom, McMinn, Brian, Chandra, Arun

المصدر: 2009 10th International Workshop on Microprocessor Test and Verification Microprocessor Test and Verification (MTV), 2009 10th International Workshop on. :107-113 Dec, 2009

Relation: 2009 10th International Workshop on Microprocessor Test and Verification (MTV)

المؤلفون: Grenat, Aaron, Sundaram, Sriram, Kosonocky, Stephen, Rachala, Ravinder, Sambamurthy, Sriram, Liepe, Steven, Rodriguez, Miguel, Burd, Tom, Clark, Adam, Austin, Michael, Naffziger, Samuel

المصدر: 2016 IEEE International Solid-State Circuits Conference (ISSCC) Solid-State Circuits Conference (ISSCC), 2016 IEEE International. :74-75 Jan, 2016

Relation: 2016 IEEE International Solid-State Circuits Conference (ISSCC)

المؤلفون: Guo, Weiqing, Zhong, Yu, Burd, Tom

المصدر: 2008 IEEE/ACM International Conference on Computer-Aided Design Computer-Aided Design, 2008. ICCAD 2008. IEEE/ACM International Conference on. :797-802 Nov, 2008

Relation: 2008 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)

المؤلفون: Kosonocky, Stephen, Burd, Tom, Kasprak, Keith, Schultz, Rich, Stephany, Ray

المصدر: 2012 Symposium on VLSI Technology (VLSIT) VLSI Technology (VLSIT), 2012 Symposium on. :147-148 Jun, 2012

Relation: 2012 IEEE Symposium on VLSI Technology

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تسجيل الدخول للوصول الكامل.

المؤلفون: Sundaram, Sriram, Grenat, Aaron, Naffziger, Samuel, Burd, Tom, Kosonocky, Stephen, Liepe, Steve, Rachala, Ravinder, Rodriguez, Miguel, Austin, Michael, Sambamurthy, Sriram

المصدر: IEEE Journal of Solid-State Circuits; Jan2017, Vol. 52 Issue 1, p89-97, 9p

مصطلحات موضوعية: MICROPROCESSORS, MULTICORE processors, SYSTEMS on a chip