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المؤلفون: Seki Kim, Hyongmin Lee, Yongjin Lee, Dongha Lee, Byeongbae Lee, Jahoon Jin, Susie Kim, Miri Noh, Kwonwoo Kang, Sangho Kim, Takahiro Nomiyama, Ji-Seon Paek, Jongwoo Lee
المصدر: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6f7de608d3f0dc07160d50fe1bf24882
https://doi.org/10.1109/vlsitechnologyandcir46769.2022.9830252