يعرض 1 - 10 نتائج من 142 نتيجة بحث عن '"Byung-il Ryu"', وقت الاستعلام: 1.07s تنقيح النتائج
  1. 1
    مؤتمر
    Nanoscale Si-based 3-dimensional MOSFETs

    المؤلفون: Donggun Park, Dong-Won Kim, Byung-Il Ryu

    المصدر: 2006 IEEE International Conference on IC Design and Technology Integrated Circuit Design and Technology, 2006. ICICDT '06. 2006 IEEE International Conference on. :1-4 2006

    Relation: 2006 IEEE International Conference on IC Design and Technology

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  2. 2
    مؤتمر
    Hot carrier generation and reliability of BT(body-tied)-Fin type SRAM cell transistors (W/sub fin/=20/spl sim/70 nm)

    المؤلفون: Young Joon Ahn, Hye Jin Cho, Hee Soo Kang, Choong-Ho Lee, Chul Lee, Jae-man Yoon, Tae Yong Kim, Eun Suk Cho, Suk-Kang Sung, Donggun Park, Kinam Kim, Byung-Il Ryu

    المصدر: 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. Reliability physics Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. 2005 IEEE International. :352-355 2005

    Relation: 2005 IEEE International Reliability Physics Symposium. Proceedings 43rd Annual

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  3. 3
    مؤتمر
    Test structure for performance evaluation of 3 dimensional FinFETs

    المؤلفون: Young Joon Ahn, Hye Jin Cho, Hee Soo Kang, Choong-Ho Lee, Chul Lee, Jae-man Yoon, Tae Yong Kim, Eun Suk Cho, Suk-kang Sung, Donggun Park, Kinam Kim, Byung-Il Ryu

    المصدر: Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005. Microelectronic Test Structures Microelectronic Test Structures, 2005. ICMTS 2005. Proceedings of the 2005 International Conference on. :59-62 2005

    Relation: ICMTS 2005. Proceedings of the 2005 International Conference on Microelectronic Test Structures

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  4. 4
    مؤتمر
    High performance 5nm radius Twin Silicon Nanowire MOSFET (TSNWFET) : fabrication on bulk si wafer, characteristics, and reliability

    المؤلفون: Sung Dae Suk, Sung-Young Lee, Sung-Min Kim, Eun-Jung Yoon, Min-Sang Kim, Ming Li, Chang Woo Oh, Kyoung Hwan Yeo, Sung Hwan Kim, Dong-Suk Shin, Kwan-Heum Lee, Heung Sik Park, Jeong Nam Han, Park, C.J., Jong-Bong Park, Dong-Won Kim, Donggun Park, Byung-Il Ryu

    المصدر: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :717-720 2005

    Relation: International Electron Devices Meeting 2005

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  5. 5
    مؤتمر
    Interface states as an active component for 20 nm gate-length planar MOSFET with electrostatic channel extension (ESCE)

    المؤلفون: Buh, G.H., Park, T., Yon, G.H., Kim, D.C., Koo, B.Y., Ryoo, C.W., Hong, S.J., Yoo, J.R., Lee, J.W., Shin, Y.G., U-In Chung, Moon, J.T., Byung-Il Ryu

    المصدر: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :832-835 2005

    Relation: International Electron Devices Meeting 2005

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  6. 6
    مؤتمر
    Robust multi-bit programmable flash memory using a resonant tunnel barrier

    المؤلفون: Shieun Kim, Seung Jae Baik, Zongliang Huo, Young-Jin Noh, Chulsung Kim, Jeong Hee Han, In-Seok Yeo, U-In Chung, Joo Tae Moon, Byung-Il Ryu

    المصدر: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :861-864 2005

    Relation: International Electron Devices Meeting 2005

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  7. 7
    مؤتمر
    Effect of a noble annealing system on nickel silicide formation

    المؤلفون: Sug-Woo Jung, Hyun-Su Kim, Eun-Ji Jung, Seong-Hwee Cheong, Jong-Ho Yun, Kwan-Jong Roh, Ja-Hum Ku, Gil-Heyun Choi, Sung-Tae Kim, U-In Chung, Joo-Tae Moon, Byung-Il Ryu

    المصدر: 12th IEEE International Conference on Advanced Thermal Processing of Semiconductors, 2004. RTP 2004. Advanced thermal processing of semiconductors Advanced Thermal Processing of Semiconductors, 2004. RTP 2004. 12th IEEE International Conference on. :121-124 2004

    Relation: 12th IEEE International Conference on Advanced Thermal Processing of Semiconductors

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  8. 8
    مؤتمر
    3-dimensional nano-CMOS transistors to overcome scaling limits

    المؤلفون: Donggun Park, Kinam Kim, Byung-Il Ryu

    المصدر: Proceedings. 7th International Conference on Solid-State and Integrated Circuits Technology, 2004. Solid-state and integrated circuits technology Solid-State and Integrated Circuits Technology, 2004. Proceedings. 7th International Conference on. 1:35-40 vol.1 2004

    Relation: 2004 7th International Conference on Solid-State and Integrated Circuits Technology Proceedings

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  9. 9
    مؤتمر
    Enhanced data retention of damascene-finFET DRAM with local channel implantation and fin surface orientation engineering

    المؤلفون: Chul Lee, Jae-man Yoon, Choong-Ho Lee, Jong Chul Park, Tae Yong Kim, Hee Soo Kang, Suk Kang Sung, Eun Suk Cho, Hye Jin Cho, Young Joon Ahn, Donggun Park, Kinam Kim, Byung-Il Ryu

    المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :61-64 2004

    Relation: 2004 International Electron Devices Meeting

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  10. 10
    مؤتمر
    Highly area efficient and cost effective double stacked S/sup 3/ (stacked single-crystal Si) peripheral CMOS SSTFT and SRAM cell technology for 512M bit density SRAM

    المؤلفون: Soon-Moon Jung, Hoon Lim, Wonseok Cho, Hoosung Cho, Chadong Yeo, Yongha Kang, Daegi Bae, Jonghoon Na, Kunho Kwak, Bonghyun Choi, Sungjin Kim, Jaehun Jeong, Youngchul Chang, Jaehoon Jang, Jonghyuk Kim, Kinam Kim, Byung-Il Ryu

    المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :265-268 2004

    Relation: 2004 International Electron Devices Meeting

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