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1دورية أكاديمية
المؤلفون: J.-C. Gardin, P. Gentelle
المساهمون: Ecole Française d'Extrême-Orient
المصدر: Bulletin de l'Ecole française d'Extrême-Orient 63(1):59-110
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2دورية أكاديمية
المؤلفون: J.-C. Gardin, Paul Garelli
المساهمون: EHESS
المصدر: Annales. Economies, sociétés, civilisations 16(5):837-876
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3دورية أكاديمية
المؤلفون: C. Gourdin, S. Bradaï, S. Courtin, J.C. Le Roux, C. Gardin
المصدر: Frattura ed Integrità Strutturale, Vol 10, Iss 38 (2016)
مصطلحات موضوعية: Design fatigue curve, Equibiaxiality, Experimental device, Austenitic steel, Mechanical engineering and machinery, TJ1-1570, Structural engineering (General), TA630-695
وصف الملف: electronic resource
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4دورية أكاديمية
المؤلفون: J.-C. Gardin
المساهمون: Institut de Recherche et d'Histoire des Textes
المصدر: Le médiéviste et l'ordinateur 16(1):48-50
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5دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
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المؤلفون: Ramiro Vázquez, Carmen Kahatt, Maria E. Riveiro, Mohamed Bekradda, C. Gardin, Sarah Mackenzie, Patrice Herait, Eric Raymond, Esteban Cvitkovic, Elodie Odore, Lucile Astorgues-Xerri, Hervé Dombret, Francesco Bertoni, François Lokiec, Keyvan Rezai, Kay Noel, Marie-Magdelaine Coudé
المصدر: Leukemia & Lymphoma. 60:3067-3070
مصطلحات موضوعية: Cancer Research, Protein family, Antineoplastic Agents, Apoptosis, chemical and pharmacologic phenomena, medicine.disease_cause, complex mixtures, BET inhibitor, Mice, 03 medical and health sciences, 0302 clinical medicine, Cell Line, Tumor, Biomarkers, Tumor, medicine, Animals, Humans, Epigenetics, Mutation, biology, Chemistry, Cell Cycle, Proteins, Drug Synergism, hemic and immune systems, Hematology, medicine.disease, Xenograft Model Antitumor Assays, Small molecule, Bromodomain, Cell biology, Disease Models, Animal, Leukemia, Histone, Oncology, 030220 oncology & carcinogenesis, biology.protein, bacteria, Acetanilides, Heterocyclic Compounds, 3-Ring, 030215 immunology
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المؤلفون: C. Gardin, L. de Baglion, V. Pelosin, Gilbert Hénaff, Stéphan Courtin, Olivier Ancelet, Paul Cussac
المصدر: Procedia Structural Integrity. 19:463-471
مصطلحات موضوعية: Work (thermodynamics), Materials science, Direct current, Fracture mechanics, 02 engineering and technology, Plasticity, engineering.material, 021001 nanoscience & nanotechnology, Residual, Fatigue limit, 020303 mechanical engineering & transports, 0203 mechanical engineering, engineering, Composite material, Austenitic stainless steel, 0210 nano-technology, Voltage drop, Earth-Surface Processes
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المؤلفون: Thiago Figueiro, Patrick Schiavone, Charles Valade, B. Le-Gratiet, Nivea Schuch, Stéphanie Audran, J. Ducote, C. Gardin, Matthieu Milléquant, R. Bouyssou, Alain Ostrovsky, Jordan Belissard
المساهمون: Laboratoire des technologies de la microélectronique (LTM ), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)
المصدر: Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV
Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV, Feb 2021, Online Only, France. pp.29, ⟨10.1117/12.2584364⟩مصطلحات موضوعية: Basis (linear algebra), business.industry, Computer science, Image processing, Overlay, Image (mathematics), Metrology, Metric (mathematics), Line (geometry), Computer vision, Artificial intelligence, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, business, Critical dimension, ComputingMilieux_MISCELLANEOUS
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3d618cd1dedb2c85efa6fd9c45b43c5d
https://hal.archives-ouvertes.fr/hal-03156590 -
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المؤلفون: L. Depre, R. La Greca, C. Gardin, J. N. Pena, E. Sungauer
المصدر: Optical Microlithography XXXIII.
مصطلحات موضوعية: Mura, Optical proximity correction, Pixel, Computer science, Metric (mathematics), Hardware_INTEGRATEDCIRCUITS, Process (computing), Node (circuits), Pattern matching, Static random-access memory, Algorithm
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f9f1ab2f4abdad9de62ce9908f369b4c
https://doi.org/10.1117/12.2551896 -
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المؤلفون: R. Bouyssou, J. Ducote, B. Le-Gratiet, Alain Ostrovsky, Paolo Petroni, Charlotte Beylier, Vincent Annezo, Matthieu Milléquant, C. Gardin, L. Schneider, Thiago Figueiro, Patrick Schiavone, Nivea Schuch
المساهمون: STMicroelectronics [Crolles] (ST-CROLLES), Aselta-nanographics [Grenoble], Minatec, Laboratoire des technologies de la microélectronique (LTM ), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)
المصدر: Proceedings SPIE Volume 11325
Metrology, Inspection, and Process Control for Microlithography XXXIV
Metrology, Inspection, and Process Control for Microlithography XXXIV, Feb 2020, San Jose, United States. pp.3, ⟨10.1117/12.2551907⟩مصطلحات موضوعية: Coupling, Computer science, Rounding, Process (computing), 02 engineering and technology, Measure (mathematics), 030218 nuclear medicine & medical imaging, Image (mathematics), Metrology, 03 medical and health sciences, 020210 optoelectronics & photonics, 0302 clinical medicine, 0202 electrical engineering, electronic engineering, information engineering, Key (cryptography), Standard algorithms, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Algorithm, ComputingMilieux_MISCELLANEOUS
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::13ae227f5f46b56000f77b09b27ff4f9
https://hal.archives-ouvertes.fr/hal-03093860