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المؤلفون: F. Sy, C. Besset, Philippe Grosse, Quentin Rafhay, Julien Poette, David Roy, G. Beylier, G. Grosa, Jean-Emmanuel Broquin
المساهمون: Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC ), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019]), Département d'Optronique (DOPT), Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), STMicroelectronics [Crolles] (ST-CROLLES), poette, julien
المصدر: IRPS
2019 IEEE International Reliability Physics Symposium (IRPS)
2019 IEEE International Reliability Physics Symposium (IRPS), Mar 2019, Monterey, United States. pp.1-5مصطلحات موضوعية: 010302 applied physics, Photocurrent, Silicon photonics, Materials science, [SPI.OPTI] Engineering Sciences [physics]/Optics / Photonic, business.industry, Photodetector, Carrier lifetime, 7. Clean energy, 01 natural sciences, Responsivity, Reliability (semiconductor), 0103 physical sciences, [SPI.OPTI]Engineering Sciences [physics]/Optics / Photonic, Optoelectronics, Diffusion (business), business, ComputingMilieux_MISCELLANEOUS, Dark current
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4b627ddaaa417313d498164bc6b92db0
https://doi.org/10.1109/irps.2019.8720483 -
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المؤلفون: Quentin Rafhay, G. Beylier, F. Sy, Philippe Grosse, Jean-Emmanuel Broquin, David Roy, C. Besset
المصدر: 2018 International Integrated Reliability Workshop (IIRW).
مصطلحات موضوعية: Silicon photonics, Materials science, Silicon, business.industry, chemistry.chemical_element, Photodetector, Germanium, Photodiode, law.invention, Reliability (semiconductor), chemistry, law, Optoelectronics, Photonics, business, Dark current
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9857f2e7b3cb2e93153515d200a2f23f
https://doi.org/10.1109/iirw.2018.8727087 -
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المؤلفون: S. Lhostis, A. Farcy, E. Deloffre, F. Lorut, S. Mermoz, Y. Henrion, L. Berthier, F. Bailly, D. Scevola, F. Guyader, F. Gigon, C. Besset, S. Pellissier, L. Gay, N. Hotellier, A. -L. Le Berrigo, S. Moreau, V. Balan, F. Fournel, A. Jouve, S. Cheramy, M. Arnoux, B. Rebhan, G. A. Maier, L. Chitu
المصدر: 2016 IEEE 66th Electronic Components and Technology Conference (ECTC).
مصطلحات موضوعية: 010302 applied physics, Wire bonding, Interconnection, Materials science, Copper interconnect, 02 engineering and technology, Direct bonding, 021001 nanoscience & nanotechnology, 01 natural sciences, Die (integrated circuit), CMOS, 0103 physical sciences, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Wafer, Image sensor, 0210 nano-technology
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e802e06becc6637eabb0931ccd7563e4
https://doi.org/10.1109/ectc.2016.202 -
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المؤلفون: E. Vincent, Sylvie Bruyere, Serge Blonkowski, Sebastien Cremer, C. Besset
المصدر: Microelectronics Reliability. 43:1237-1240
مصطلحات موضوعية: Materials science, Condensed matter physics, Differential capacitance, business.industry, Electrical engineering, Physics::Optics, Linearity, Relative permittivity, Dielectric, Condensed Matter::Mesoscopic Systems and Quantum Hall Effect, Condensed Matter Physics, Diffusion capacitance, Capacitance, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Stress (mechanics), Reliability (semiconductor), Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business
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المؤلفون: John Holton, C Besset, Dino Vaira, P Youinou
المصدر: Emerging Therapeutic Targets. 2:107-123
مصطلحات موضوعية: biology, business.industry, Immunology, Medicine, Helicobacter pylori, biology.organism_classification, business
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المؤلفون: W. Arfaoui, S. Renard, C. Besset, Emmanuel Vincent, Florian Cacho, Y. Mamy Randriamihaja, M. Saliva, Vincent Huard, P. Mora, Xavier Federspiel, Alain Bravaix, D. Angot, David Roy
المصدر: 2013 IEEE International Reliability Physics Symposium (IRPS).
مصطلحات موضوعية: Materials science, Silicon, business.industry, Transistor, Electrical engineering, chemistry.chemical_element, PMOS logic, law.invention, chemistry, CMOS, law, MOSFET, Optoelectronics, Node (circuits), business, NMOS logic, High-κ dielectric
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b9384c483bf0e23a4654151df5b1342f
https://doi.org/10.1109/irps.2013.6531961 -
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المؤلفون: J.-M. Chaix, David Roy, G. Beylier, F. Volpi, E. Chery, C. Besset, Xavier Federspiel
المساهمون: STMicroelectronics [Crolles] (ST-CROLLES), Institut des Sciences Chimiques de Rennes (ISCR), Centre National de la Recherche Scientifique (CNRS)-Institut de Chimie du CNRS (INC)-Université de Rennes 1 (UR1), Université de Rennes (UNIV-RENNES)-Université de Rennes (UNIV-RENNES)-Ecole Nationale Supérieure de Chimie de Rennes (ENSCR)-Institut National des Sciences Appliquées - Rennes (INSA Rennes), Institut National des Sciences Appliquées (INSA)-Université de Rennes (UNIV-RENNES)-Institut National des Sciences Appliquées (INSA), Science et Ingénierie des Matériaux et Procédés (SIMaP), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut National Polytechnique de Grenoble (INPG)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Université de Rennes (UR)-Institut National des Sciences Appliquées - Rennes (INSA Rennes), Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Ecole Nationale Supérieure de Chimie de Rennes (ENSCR)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)
المصدر: IEEE International Reliability Physics
IEEE International Reliability Physics, 2012, pp.3A.5.1-3A.5.6. ⟨10.1109/IRPS.2012.6241804⟩مصطلحات موضوعية: Materials science, Time-dependent gate oxide breakdown, 02 engineering and technology, Metal-insulator-metal, Dielectric, dielectric relaxation, 01 natural sciences, Capacitance, Stress (mechanics), Reliability (semiconductor), mental disorders, 0103 physical sciences, integrated circuit interconnections, Composite material, dielectric devices, 010302 applied physics, business.industry, stress effects, Electrical engineering, tantalum compounds, [CHIM.MATE]Chemical Sciences/Material chemistry, integrated circuit reliability, 021001 nanoscience & nanotechnology, electric breakdown, Duty cycle, zirconium compounds, Relaxation (physics), silicon compounds, 0210 nano-technology, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1a99844da80e681bfdc5f5de9f922edb
https://doi.org/10.1109/irps.2012.6241804 -
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المؤلفون: B, Fleuchot, C, Gitton, A, Guillot, J, Vidic, P, Nicolas, C, Besset, L, Fontaine, P, Hols, N, Leblond-Bourget, V, Monnet, R, Gardan
المصدر: Molecular microbiology. 80(4)
مصطلحات موضوعية: Transcription, Genetic, Streptococcaceae, Quorum Sensing, Electrophoretic Mobility Shift Assay, Gene Expression Regulation, Bacterial, Sequence Analysis, DNA, Surface Plasmon Resonance, Mass Spectrometry, Pheromones, DNA-Binding Proteins, Bacterial Proteins, Trans-Activators, Amino Acid Sequence, Promoter Regions, Genetic, Hydrophobic and Hydrophilic Interactions, Phylogeny, Signal Transduction
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المؤلفون: C. Guerin, C. Besset, Alain Bravaix, Y. Mamy Randriamihaja, Vincent Huard, David Roy, S. Renard, Didier Goguenheim, Emmanuel Vincent
المصدر: 2010 IEEE International Reliability Physics Symposium.
مصطلحات موضوعية: Materials science, CMOS, business.industry, Subthreshold conduction, Logic gate, Electrical engineering, Semiconductor device modeling, Optoelectronics, Waveform, Node (circuits), business, Energy (signal processing), Degradation (telecommunications)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5a33326228bbd0bc99c1e755fe3ee885
https://doi.org/10.1109/irps.2010.5488852 -
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المؤلفون: Sébastien Petitdidier, J.-M. Chaix, M. Mellier, J. Guillan, Y. Le Friec, David Roy, G. Imbert, M. Vilmay, F. Volpi, P. Vannier, Lucile Arnaud, O. Robin, C. Besset, C. Monget, S. Chhun, D. Galpin
المصدر: 2009 IEEE International Interconnect Technology Conference.
مصطلحات موضوعية: Interconnection, Materials science, Dielectric reliability, Robustness (computer science), Chemical-mechanical planarization, Electronic engineering, Polishing, Dielectric, Capacitance, Engineering physics
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5102fbeb7de653539d0cb6f65955b400
https://doi.org/10.1109/iitc.2009.5090359
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