-
1
المؤلفون: E. Brezza, F. Deprat, C. de Buttet, A. Gauthier, M. Gregoire, D. Guiheux, V. Guyader, M. Juhel, I. Berbezier, E. Assaf, L. Favre, P. Chevalier, C. Gaquière, N. Defrance
المساهمون: STMicroelectronics [Crolles] (ST-CROLLES), Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)-JUNIA (JUNIA), Université catholique de Lille (UCL)-Université catholique de Lille (UCL), Puissance - IEMN (PUISSANCE - IEMN), Université catholique de Lille (UCL)-Université catholique de Lille (UCL)-Centrale Lille-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)-JUNIA (JUNIA), Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Laboratoire Cycles Géochimiques et ressources (LCG), Géosciences Marines (GM), Institut Français de Recherche pour l'Exploitation de la Mer (IFREMER)-Institut Français de Recherche pour l'Exploitation de la Mer (IFREMER), Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS), Hôpital Louis Pradel [CHU - HCL], Hospices Civils de Lyon (HCL), Declaration of competing interestThe authors declare that they have no known competing financial interests or personal relationships that could have appeared toinfluence the work reported in this paper., NO FUNDING FOUND, Laboratoire commun STMicroelectronics-IEMN T1
المصدر: Solid-State Electronics
Solid-State Electronics, 2023, 204, pp.108654. ⟨10.1016/j.sse.2023.108654⟩مصطلحات موضوعية: [PHYS]Physics [physics], [SPI]Engineering Sciences [physics], Materials Chemistry, Heterojunction Bipolar Transistor, Thermal treatment, Electrical and Electronic Engineering, Interface, SiconiTM etching, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, Hydrofluoric acid etching
-
2
المؤلفون: C. de Buttet, E. Deloffre, S. Mermoz, B. Ayoub, E. Leon Perez, Hélène Fremont, Y. Exbrayat, C. Euvard, P. Lamontagne, Stephane Moreau, Sandrine Lhostis, V. Balan, Joris Jourdon
المساهمون: STMicroelectronics [Crolles] (ST-CROLLES), Laboratoire de l'intégration, du matériau au système (IMS), Université Sciences et Technologies - Bordeaux 1 (UB)-Institut Polytechnique de Bordeaux-Centre National de la Recherche Scientifique (CNRS), Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Université Sciences et Technologies - Bordeaux 1-Institut Polytechnique de Bordeaux-Centre National de la Recherche Scientifique (CNRS)
المصدر: 2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC)
2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC), Dec 2020, Singapore, France. pp.453-458, ⟨10.1109/EPTC50525.2020.9315028⟩مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, Semiconductor device modeling, 02 engineering and technology, Conductivity, 01 natural sciences, Capacitance, 020202 computer hardware & architecture, Process variation, Electrical resistance and conductance, Electrical resistivity and conductivity, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Optoelectronics, Wafer, Electrical measurements, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, business, ComputingMilieux_MISCELLANEOUS
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::139d737a878cac01a854ac411c1755cf
https://hal.science/hal-03203851 -
3دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
4
المؤلفون: Loan Pham-Nguyen, Stephane Denorme, P. Gros, Pascal Gouraud, Pierre Perreau, Sébastien Barnola, Sebastien Haendler, A. Margain, Y. Campidelli, F. Boedt, Olivier Weber, Christian Arvet, Daniel Delprat, J. Vetier, Francois Leverd, Remi Beneyton, C. Fenouillet-Beranger, C. Perrot, Tomasz Skotnicki, Stephane Monfray, Bich-Yen Nguyen, O. Faynot, F. Baron, Konstantin Bourdelle, C. de Buttet, A. Torres, Francois Andrieu, L. Pinzelli, L. Tosti, C. Borowiak, C. Laviron, F. Abbate
المصدر: Solid-State Electronics. 54:849-854
مصطلحات موضوعية: Materials science, business.industry, Electrical engineering, Silicon on insulator, Condensed Matter Physics, Subthreshold slope, Electronic, Optical and Magnetic Materials, PMOS logic, Threshold voltage, Materials Chemistry, Optoelectronics, Electrical and Electronic Engineering, business, Metal gate, NMOS logic, High-κ dielectric, Ground plane
-
5
المؤلفون: S. Joblot, C. De-Buttet, Sébastien Petitdidier, F. Abbate, C. Jenny, Didier Celi, B. Ramadout, Thomas Quemerais, Sebastien Haendler, Laurent Favennec, Daniel Gloria, O. Robin, C. Richard, E. Canderle, B. Borot, K. Haxaire, N. Derrier, Remi Beneyton, Julien Rosa, G. Ribes, O. Saxod, P. Brun, Y. Campidelli, Pascal Chevalier, Cedric Durand, A. Montagne, Francois Leverd, G. Imbert, Olivier Gourhant, M. Guillermet, E. Gourvest, L. Berthier, Clement Tavernier, J. Cossalter, M. Buczko, C. Deglise, Mickael Gros-Jean, C. Julien, Jean-Damien Chapon, K. Courouble, D. Ney, G. Avenier, Patrick Maury, Y. Carminati, R. Bianchini, F. Foussadier
المصدر: 2014 IEEE International Electron Devices Meeting.
مصطلحات موضوعية: Bit cell, Materials science, business.industry, Heterojunction bipolar transistor, Electrical engineering, Ring oscillator, BiCMOS, Inductor, law.invention, Capacitor, CMOS, law, Extremely high frequency, Optoelectronics, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1a267063e241381b03eefae310424668
https://doi.org/10.1109/iedm.2014.7046978 -
6
المؤلفون: Etienne Snoeck, C. de Buttet, François Montaigne, Coriolan Tiusan, Gregory Malinowski, Michel Hehn
المصدر: The European Physical Journal B - Condensed Matter and Complex Systems. 40:19-23
مصطلحات موضوعية: Free electron model, Materials science, Condensed matter physics, Magnetoresistance, Magnesium, Analytical chemistry, chemistry.chemical_element, Giant magnetoresistance, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, Tunnel magnetoresistance, Tunnel effect, chemistry, Tunnel junction, Sputtering
-
7
المؤلفون: P. Perreau, C. Fenouillet-Beranger, Frederic Boeuf, C. Perrot, Sébastien Barnola, C. de Buttet, F. Boedt, Konstantin Bourdelle, O. Faynot, Olivier Weber, Francois Andrieu, F. Abbate, Tomasz Skotnicki, S. Peru, L. Pinzelli, Thierry Poiroux, Pascal Gouraud, P. Boulenc, Y. Campidelli, L. Tosti, Remi Beneyton, A. Margain, Bich-Yen Nguyen
المصدر: 2011 Proceedings of the European Solid-State Device Research Conference (ESSDERC).
مصطلحات موضوعية: Materials science, business.industry, Bipolar junction transistor, Electrical engineering, Silicon on insulator, Biasing, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, Gate oxide, MOSFET, Materials Chemistry, Optoelectronics, Breakdown voltage, sense organs, Electrical and Electronic Engineering, business, Metal gate, High-κ dielectric, Communication channel, Ground plane
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fb4c010aab7814a296036ee1e69c503a
https://doi.org/10.1109/essderc.2011.6044222 -
8
المؤلفون: Frederic Boeuf, Sébastien Barnola, J.-L. Huguenin, Francois Andrieu, F. Martin, C. Perrot, F. Abbate, Olivier Weber, Stephane Denorme, L. Clement, M. Casse, Remi Beneyton, Konstantin Bourdelle, F. Boedt, A. Bajolet, L. Pinzelli, P. Perreau, O. Faynot, Charles Leroux, Pascal Gouraud, C. de Buttet, L. Tosti, C. Borowiak, Bich-Yen Nguyen, R. Gassilloud, C. Fenouillet-Beranger, X. Garros, Thomas Skotnicki, B. Pernet, Y. Campidelli, S. Peru, Roland Pantel
المصدر: Proceedings of 2011 International Symposium on VLSI Technology, Systems and Applications.
مصطلحات موضوعية: Materials science, CMOS, business.industry, Gate oxide, Electrical engineering, Optoelectronics, NAND gate, Time-dependent gate oxide breakdown, business, Metal gate, AND gate, NMOS logic, PMOS logic
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::31de5a868e19fe106912a406873a24d3
https://doi.org/10.1109/vtsa.2011.5872254 -
9
المؤلفون: Francois Leverd, B. Le-Gratiet, C. Borowiak, Thomas Ernst, Frederic Boeuf, L. Pinzelli, S. Barraud, T. Morel, Stephane Denorme, J.-L. Huguenin, Romain Wacquez, Sébastien Barnola, Pascal Gouraud, J. Bustos, G. Bidal, Stephane Monfray, M.-P. Samson, O. Faynot, Jf. Dalemcourt, K. Benotmane, B. Icard, Christian Arvet, Laurent Pain, Y. Campidelli, Thomas Skotnicki, P. Perreau, M. Martin, Remi Beneyton, C. De-Buttet
المصدر: 2010 International Electron Devices Meeting.
مصطلحات موضوعية: Very-large-scale integration, Materials science, Silicon, business.industry, Transistor, Electrical engineering, chemistry.chemical_element, Silicon-germanium, law.invention, chemistry.chemical_compound, Planar, CMOS, chemistry, Direct exposure, law, Logic gate, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8f28f8ef509130416e0f809c762831fb
https://doi.org/10.1109/iedm.2010.5703339 -
10
المؤلفون: F. Abbate, L. Tosti, C. Borowiak, C. Perrot, Sébastien Barnola, A. Bajolet, Francois Andrieu, F. Baron, Pascal Gouraud, Konstantin Bourdelle, C. de Buttet, C. Fenouillet-Beranger, Remi Beneyton, Olivier P. Thomas, B. Pernet, Thomas Skotnicki, Stephane Denorme, Olivier Weber, Bich-Yen Nguyen, Y. Campidelli, J.-P. Noel, M. Casse, Frederic Boeuf, O. Faynot, L. Pinzelli, F. Boedt, Sebastien Haendler, P. Perreau
المصدر: 2010 Symposium on VLSI Technology.
مصطلحات موضوعية: Engineering, business.industry, Low-power electronics, Logic gate, Circuit design, Electrical engineering, Electronic engineering, Silicon on insulator, Biasing, Static random-access memory, Integrated circuit design, business, Leakage (electronics)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b7dd0787eeb44a38951b5d2a38f76d10
https://doi.org/10.1109/vlsit.2010.5556118
Find this article in full text from Springer Verlag.