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المؤلفون: L. Magnarin, M. Agati, A. Belmonte, S. Subhechha, N. Rassoul, C. Drijbooms, H. Dekkers, U. Celano
المصدر: 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e89205850b697b36a06b710e3b3f2caf
https://doi.org/10.1109/ipfa55383.2022.9915759 -
2
المؤلفون: N. Jourdan, Katia Devriendt, E. Dupuy, Hans Mertens, S. Paolillo, Guillaume Boccardi, F. Schleicher, E. Sanchez, Romain Ritzenthaler, Frank Holsteyns, Z. Tao, Sylvain Baudot, Sofie Mertens, Haroen Debruyn, Kevin Vandersmissen, Thomas Chiarella, P. Morin, Antony Premkumar Peter, Anshul Gupta, Erik Rosseel, Min-Soo Kim, Nouredine Rassoul, Boon Teik Chan, Christopher J. Wilson, D. Radisic, Lieve Teugels, A. De Keersgieter, D. Yakimets, I. Demonie, N. Bontemps, C. Drijbooms, Sujith Subramanian, Bilal Chehab, Paola Favia, C. Lorant, Farid Sebaai, Steven Demuynck, Frederic Lazzarino, E. Dentoni Litta, G. Mannaert, Houman Zahedmanesh, Yong Kong Siew, J. Cousserier, T. Hopf, B. Briggs, Manoj Jaysankar, Jerome Mitard, K. Kenis, A. Sepúlveda, S. Wang, Naoto Horiguchi, Goutham Arutchelvan, E. Capogreco, O. Varela Pedreira, D. Zhou, Jürgen Bömmels, Zsolt Tokei
المصدر: 2020 IEEE Symposium on VLSI Technology.
مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, chemistry.chemical_element, 02 engineering and technology, Tungsten, 021001 nanoscience & nanotechnology, 01 natural sciences, Electromigration, Cmos scaling, CMOS, chemistry, Booster (electric power), Logic gate, 0103 physical sciences, Optoelectronics, 0210 nano-technology, business, Low resistance, Scaling
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ef0e241094011f46c8657e01ebc25aeb
https://doi.org/10.1109/vlsitechnology18217.2020.9265113 -
3مؤتمر
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تسجيل الدخول للوصول الكامل. -
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المؤلفون: S. Kolling, Ajay Kumar Kambham, Andreas Schulze, Pierre Eyben, Jay Mody, Geert Eneman, G. Zschatzsch, A. De Keersgieter, T. Chiarella, Wilfried Vandervorst, Naoto Horiguchi, C. Drijbooms
المصدر: 2012 12th International Workshop on Junction Technology.
مصطلحات موضوعية: Materials science, Spreading resistance profiling, CMOS, business.industry, Logic gate, Doping, MOSFET, Microscopy, Electronic engineering, Optoelectronics, business, Scaling, High dynamic range
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::57fe33b5a3bdb6d44d155bc5829cf14f
https://doi.org/10.1109/iwjt.2012.6212818 -
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المؤلفون: T. Chiarella, G. Zschatzsch, Ajay Kumar Kambham, A. De Keersgieter, S. Kolling, Pierre Eyben, C. Drijbooms, Andreas Schulze, Wilfried Vandervorst, Jay Mody, Naoto Horiguchi, Geert Eneman, T. Y. Hoffmann
المصدر: 2011 International Electron Devices Meeting.
مصطلحات موضوعية: Materials science, Dopant, Spreading resistance profiling, business.industry, Microscopy, MOSFET, Doping, Optoelectronics, Profiling (information science), Nanotechnology, business, First order
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::626d4c115dfbc306b2bca0f24ffa1c94
https://doi.org/10.1109/iedm.2011.6131498 -
6
المؤلفون: H. Bender, C. Drijbooms, A. Radisic, David G. Seiler, Alain C. Diebold, Robert McDonald, Amal Chabli, Erik M. Secula
المصدر: AIP Conference Proceedings.
مصطلحات موضوعية: Conventional transmission electron microscope, Materials science, Silicon, chemistry, Scanning electron microscope, Scanning confocal electron microscopy, chemistry.chemical_element, Nanotechnology, Ion milling machine, Electron beam-induced deposition, Environmental scanning electron microscope, Focused ion beam
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المؤلفون: C Drijbooms, Olivier Richard, Hugo Bender, P Van Marcke
المصدر: Springer Proceedings in Physics ISBN: 9783540319146
مصطلحات موضوعية: Materials science, Air exposure, chemistry, Plasma cleaning, Transmission electron microscopy, Metallurgy, chemistry.chemical_element, Plasma treatment, Specimen preparation, Focused ion beam, Copper, Corrosion
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::39b78f384b2236b05e507d7a6fa95f31
https://doi.org/10.1007/3-540-31915-8_85 -
8دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
9دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
10مؤتمر
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.