-
1
المؤلفون: J. Kanyandekwe, D. Barge, P. Morin, L. Grenouillet, M. Labrot, S. Maitrejean, E. Augendre, V. Lapras, Y. Morand, D. Dutartre, M. Gros-Jean, O. Gourhant, C. Gaumer, N. Rambal, D. Cooper, L. Clement
المصدر: Extended Abstracts of the 2018 International Conference on Solid State Devices and Materials.
مصطلحات موضوعية: Planar, Materials science, CMOS, business.industry, Optoelectronics, Epitaxy, business, PMOS logic
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0d11f975f51d0660963a7b263064dacb
https://doi.org/10.7567/ssdm.2018.c -3-03 -
2
المؤلفون: F. Abbate, E Baylac, Clement Pribat, D. Barge, Marc Juhel, C. Gaumer, A. Pofelski, Vincent Mazzocchi, Germain Serventon, Olivier Gourhant, Francois Andrieu, Maud Bidaud
المصدر: ECS Transactions. 64:469-478
مصطلحات موضوعية: Thermal oxidation, Materials science, Chemical engineering, business.industry, Condensation, Substrate (printing), Structural engineering, business
-
3
المؤلفون: Jean-Francois Nodin, Philippe Candelier, C. Gaumer, Vincent Jousseaume, Jacques Cluzel, Barbara De Salvo, Elise Le-Roux, Carlo Cagli, Mickael Gros-Jean, C. Carabasse, T. Diokh, S. Jeannot, M. Mellier
المصدر: Thin Solid Films. 533:24-28
مصطلحات موضوعية: Materials science, business.industry, Metals and Alloys, Oxide, chemistry.chemical_element, Nanotechnology, Surfaces and Interfaces, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Resistive random-access memory, chemistry.chemical_compound, chemistry, CMOS, Stack (abstract data type), Materials Chemistry, Optoelectronics, Thermal stability, Tin, business, Low voltage, Voltage
-
4
المؤلفون: Julien Buckley, S. Jeannot, C. Mannequin, Patrice Gonon, Mickael Gros-Jean, Anne-Claire Salaün, H. Grampeix, C. Vallée, C. Gaumer, Vincent Jousseaume
المصدر: Thin Solid Films. 525:20-27
مصطلحات موضوعية: Resistive touchscreen, Materials science, Annealing (metallurgy), Metals and Alloys, Analytical chemistry, chemistry.chemical_element, Surfaces and Interfaces, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, Amorphous solid, Atomic layer deposition, chemistry, law, Materials Chemistry, Thin film, Crystallization, Tin, High-κ dielectric
-
5
المؤلفون: Fausto Sirotti, Olivier Renault, Sandrine Lhostis, Eugénie Martinez, Mathieu G. Silly, C. Gaumer, Christophe Licitra
المصدر: Applied Surface Science. 258:2107-2112
مصطلحات موضوعية: Fabrication, Materials science, Passivation, Diffusion, Analytical chemistry, General Physics and Astronomy, chemistry.chemical_element, Surfaces and Interfaces, General Chemistry, Condensed Matter Physics, Oxygen, Nitrogen, Surfaces, Coatings and Films, chemistry, X-ray photoelectron spectroscopy, Tin, Metal gate
-
6
المؤلفون: P. Ruault, Gong Bo, O. Hinsinger, B. van Schravendijk, D. Winandy, C. Fenouillet-Beranger, D. Galpin, D. Vo-Thanh, S. Lagrasta, Romain Duru, Remi Beneyton, C. Gaumer, J. Mazurier, S. Chhun, N. Chauvet, Bhadri N. Varadarajan, D. Barge, P. Meijer, N. Sun, Daniel Benoit
المصدر: 2015 IEEE International Electron Devices Meeting (IEDM)
مصطلحات موضوعية: 010302 applied physics, Very-large-scale integration, Materials science, business.industry, 020209 energy, Effective capacitance, Oxide, Nanotechnology, 02 engineering and technology, 7. Clean energy, 01 natural sciences, chemistry.chemical_compound, chemistry, Low temperature deposition, Logic gate, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Optoelectronics, Electrical performance, Breakdown voltage, business, NMOS logic
-
7
المؤلفون: Fabien Boulanger, M. Casse, Laurent Brunet, Francois Andrieu, C. Gaumer, Olivier Weber, Xavier Garros, Gilles Reimbold, D. Lafond
المصدر: ECS Transactions. 35:515-530
مصطلحات موضوعية: Materials science, business.industry, Electronic engineering, Optoelectronics, business, Stability (probability), Scaling, High-κ dielectric
-
8
المؤلفون: François Bertin, Eugénie Martinez, C. Gaumer, Christophe Licitra, Jean-Paul Barnes, Névine Rochat, Sandrine Lhostis, M. J. Guittet, Mickael Gros-Jean, Amal Chabli, Nicholas Barrett
المصدر: Microelectronic Engineering. 88:72-75
مصطلحات موضوعية: Band gap, Electron energy loss spectroscopy, Analytical chemistry, chemistry.chemical_element, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, chemistry, X-ray photoelectron spectroscopy, Electrode, Electrical and Electronic Engineering, Tin, Metal gate, Layer (electronics), High-κ dielectric
-
9
المؤلفون: Mathieu Charbonnier, N. Benedetto, F. Fillot, C. Guedj, C. Gaumer, Eugénie Martinez, Sandrine Lhostis, Christophe Licitra, Charles Leroux
المصدر: ECS Transactions. 16:161-169
مصطلحات موضوعية: Dipole, Materials science, Stack (abstract data type), X-ray photoelectron spectroscopy, Ellipsometry, Electron affinity, Drop (liquid), Thermal, Analytical chemistry, Electrical measurements
-
10
المؤلفون: Jean-Marc Fabbri, Claudia Wiemer, Dominique Lafond, C. Gaumer, Sandrine Lhostis, Michele Perego, Eugénie Martinez, Virginie Loup
المصدر: 214th Meeting of the Electrochemical-Society, pp. 99–110, Honolulu, OCT 13-15, 2008
info:cnr-pdr/source/autori:C. Gaumer, E. Martinez, S. Lhostis, C. Wiemer, M. Perego, V. Loup, D. Lafond, J.-M. Fabbri/congresso_nome:214th Meeting of the Electrochemical-Society/congresso_luogo:Honolulu/congresso_data:OCT 13-15, 2008/anno:2008/pagina_da:99/pagina_a:110/intervallo_pagine:99–110مصطلحات موضوعية: chemistry.chemical_compound, Materials science, Tantalum nitride, chemistry, Interface (Java), business.industry, Gate stack, Optoelectronics, business, High-κ dielectric, Hafnium oxide