المؤلفون: C. E. James, M. Tingaud, G. Laera, C. Guedj, S. Zuber, R. Diambrini Palazzi, S. Vukovic, J. Richiardi, M. Kliegel, D. Marie

المصدر: BMC Complementary Medicine and Therapies, Vol 24, Iss 1, Pp 1-22 (2024)

مصطلحات موضوعية: Child development, Executive functions, Randomized controlled trial, Musical instrumental training, Visual arts, Magnetic Resonance Imaging (MRI), Other systems of medicine, RZ201-999

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2662-7671

URL الوصول: https://doaj.org/article/739a58c091e542c4b0f3367fa772b5f3

المؤلفون: C. E. James, M. Tingaud, G. Laera, C. Guedj, S. Zuber, R. Diambrini Palazzi, S. Vukovic, J. Richiardi, M. Kliegel, D. Marie

المصدر: BMC Complementary Medicine and Therapies, Vol 24, Iss 1, Pp 1-1 (2024)

مصطلحات موضوعية: Other systems of medicine, RZ201-999

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2662-7671

URL الوصول: https://doaj.org/article/95c32a2b89b44e64baa9298c47cf0021

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المؤلفون: A. Benoist, S. Bernasconi, G. Audoit, C. Guedj, Philippe Candelier, C. Fenouillet-Beranger, T. Dewolf, L. Perniola, E. Jalaguier, S. Jeannot, C. Charpin, Stephane Denorme, E. Vianello, M. Azzaz, Daniele Garbin, C. Cagli

المصدر: Solid-State Electronics. 125:182-188

مصطلحات موضوعية: 010302 applied physics, Stack-based memory allocation, Materials science, Equivalent series resistance, business.industry, Bilayer, chemistry.chemical_element, Nanotechnology, 02 engineering and technology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Electronic, Optical and Magnetic Materials, Resistive random-access memory, chemistry, CMOS, 0103 physical sciences, Materials Chemistry, Optoelectronics, Electrical and Electronic Engineering, 0210 nano-technology, Tin, business, Layer (electronics), Quantum tunnelling

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::69d5eccfc71c5f64a81a84ad88c54bc6
https://doi.org/10.1016/j.sse.2016.07.007

المؤلفون: C. Guedj, Eugénie Martinez, G. Auvert

المصدر: Microelectronic Engineering. 156:78-81

مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, Non-blocking I/O, Nanotechnology, 02 engineering and technology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Focused ion beam, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Characterization (materials science), Resistive random-access memory, 0103 physical sciences, Optoelectronics, Electrical measurements, Tomography, Electrical and Electronic Engineering, 0210 nano-technology, High-resolution transmission electron microscopy, business, Image resolution

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2b973ddd2d7813fcf7973bf9104ccdd4
https://doi.org/10.1016/j.mee.2015.10.020

المؤلفون: Olivier Pollet, G. Audoit, C. Guedj, Sébastien Barnola, Daniel Benoit, Maxime Garcia-Barros, Francois Leverd, Audrey Jannaud, Nicolas Posseme

المساهمون: Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), STMicroelectronics [Crolles] (ST-CROLLES), Département Plate-Forme Technologique (DPFT), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Direction de Recherche Technologique (CEA) (DRT (CEA)), SERMA Technologies

المصدر: Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures
Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures, 2018, 36 (5), pp.052201. ⟨10.1116/1.5038617⟩
Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures, American Vacuum Society (AVS), 2018, 36 (5), pp.052201. ⟨10.1116/1.5038617⟩

مصطلحات موضوعية: Materials science, Plasma parameters, Silicon on insulator, 02 engineering and technology, 01 natural sciences, chemistry.chemical_compound, [SPI]Engineering Sciences [physics], Hydrofluoric acid, X-ray photoelectron spectroscopy, Etching (microfabrication), 0103 physical sciences, Materials Chemistry, Electrical and Electronic Engineering, Instrumentation, 010302 applied physics, business.industry, Process Chemistry and Technology, Wet cleaning, Biasing, 021001 nanoscience & nanotechnology, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, chemistry, Optoelectronics, 0210 nano-technology, business, Layer (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::25bad278b7bb95f625fbfd1e6f332c7e
https://cea.hal.science/cea-02185184/document

المؤلفون: Sébastien Barnola, Névine Rochat, Olivier Pollet, C. Guedj, Vincent Ah-Leung, Maxime Garcia Barros, Nicolas Posseme, G. Audoit

المساهمون: Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), STMicroelectronics [Crolles] (ST-CROLLES), Département Plate-Forme Technologique (DPFT), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Direction de Recherche Technologique (CEA) (DRT (CEA))

المصدر: Journal of Vacuum Science and Technology A
Journal of Vacuum Science and Technology A, American Vacuum Society, 2017, 35 (2), pp.021408. ⟨10.1116/1.4977077⟩
Journal of Vacuum Science & Technology A
Journal of Vacuum Science & Technology A, 2017, 35 (2), pp.021408. ⟨10.1116/1.4977077⟩

مصطلحات موضوعية: 010302 applied physics, Materials science, Plasma etching, business.industry, Analytical chemistry, 02 engineering and technology, Surfaces and Interfaces, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Surfaces, Coatings and Films, chemistry.chemical_compound, [SPI]Engineering Sciences [physics], Ion implantation, Hydrofluoric acid, Silicon nitride, chemistry, Etching (microfabrication), 0103 physical sciences, Optoelectronics, Dry etching, Reactive-ion etching, 0210 nano-technology, business, Buffered oxide etch

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e844d17b1b01ae815b10d13a0f71f224
https://hal-cea.archives-ouvertes.fr/cea-02202455

المؤلفون: C. Guedj, Eugénie Martinez, V. Gorbenko, R. Cipro, Jean-Paul Barnes, Thierry Baron, Wael Hourani, Sylvain David, Franck Bassani, J. Moeyaert

المساهمون: Laboratoire des technologies de la microélectronique (LTM ), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019]), Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)

المصدر: Journal of Electron Spectroscopy and Related Phenomena
Journal of Electron Spectroscopy and Related Phenomena, 2016, 213, pp.1-10. ⟨10.1016/j.elspec.2016.09.008⟩
Journal of Electron Spectroscopy and Related Phenomena, Elsevier, 2016, 213, pp.1-10. ⟨10.1016/j.elspec.2016.09.008⟩

مصطلحات موضوعية: Photoluminescence, Materials science, Analytical chemistry, 02 engineering and technology, 01 natural sciences, Auger, Sputtering, 0103 physical sciences, Scanning transmission electron microscopy, Physical and Theoretical Chemistry, Spectroscopy, ComputingMilieux_MISCELLANEOUS, 010302 applied physics, [PHYS]Physics [physics], Radiation, business.industry, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Dark field microscopy, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Secondary ion mass spectrometry, Transmission electron microscopy, Optoelectronics, 0210 nano-technology, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c0a85fcc12371887940af9fc8cbb6b3c
https://hal.univ-grenoble-alpes.fr/hal-01881946