المؤلفون: P. Scholl, H. J. Williams, G. Bornet, F. Wallner, D. Barredo, L. Henriet, A. Signoles, C. Hainaut, T. Franz, S. Geier, A. Tebben, A. Salzinger, G. Zürn, T. Lahaye, M. Weidemüller, A. Browaeys

المصدر: PRX Quantum, Vol 3, Iss 2, p 020303 (2022)

مصطلحات موضوعية: Physics, QC1-999, Computer software, QA76.75-76.765

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2691-3399

URL الوصول: https://doaj.org/article/3483d06a8a7b4b0db179f8fa488afaa4

المؤلفون: P. Scholl, H. J. Williams, G. Bornet, F. Wallner, D. Barredo, L. Henriet, A. Signoles, C. Hainaut, T. Franz, S. Geier, A. Tebben, A. Salzinger, G. Zürn, T. Lahaye, M. Weidemüller, A. Browaeys

المساهمون: European Commission, Agence Nationale de la Recherche (France), German Research Foundation, Alexander von Humboldt Foundation, University of Heidelberg, Agencia Estatal de Investigación (España), Ministerio de Ciencia, Innovación y Universidades (España), Research and Art Baden-Württemberg

المصدر: Phys. Rev. X. Quantum
Digital.CSIC. Repositorio Institucional del CSIC
instname

مصطلحات موضوعية: Quantum Physics, Quantum Gases (cond-mat.quant-gas), Atomic Physics (physics.atom-ph), General Engineering, FOS: Physical sciences, General Earth and Planetary Sciences, Quantum Physics (quant-ph), Condensed Matter - Quantum Gases, General Environmental Science, Physics - Atomic Physics

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c4d992cc70747865eee648797db238b1
http://arxiv.org/abs/2107.14459

المؤلفون: François Marc, Jean Godin, Brice Grandchamp, Nathalie Labat, Thomas Zimmer, Virginie Nodjiadjim, Muriel Riet, G. A. Koné, Cristell Maneux, C. Hainaut

المصدر: Microelectronics Reliability. 51:1730-1735

مصطلحات موضوعية: Work (thermodynamics), Materials science, business.industry, Heterojunction bipolar transistor, Drop (liquid), Electrical engineering, Activation energy, Condensed Matter Physics, Accelerated aging, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Reliability (semiconductor), Thermal, Optoelectronics, Electrical and Electronic Engineering, Current (fluid), Safety, Risk, Reliability and Quality, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::382f82e3a555e6303af4d4b59879db7e
https://doi.org/10.1016/j.microrel.2011.07.073

المؤلفون: C. Hainaut, François Marc, Jean Godin, G. A. Koné, Cristell Maneux, Virginie Nodjiadjim, Brice Grandchamp, Nathalie Labat, Thomas Zimmer

المصدر: Microelectronics Reliability. 50:1548-1553

مصطلحات موضوعية: Materials science, business.industry, Heterojunction bipolar transistor, Doping, Test method, Condensed Matter Physics, Accelerated aging, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Stress (mechanics), chemistry.chemical_compound, Reliability (semiconductor), chemistry, Chemical-mechanical planarization, Indium phosphide, Electronic engineering, Optoelectronics, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f43aaf5b7e4e76629f324d1fd0364e5f
https://doi.org/10.1016/j.microrel.2010.07.141

المؤلفون: J. L. Beuzit, M. C. Hainaut, Eduardo L. Martín, Francois Roddier, T. Forveille, Michel Mayor, C. Roddier, C. Perrier, X. Delfosse, D. Segransan, Stéphane Udry

المساهمون: Laboratoire d'Astrophysique de Grenoble (LAOG), Université Joseph Fourier - Grenoble 1 (UJF)-Institut national des sciences de l'Univers (INSU - CNRS)-Centre National de la Recherche Scientifique (CNRS), Observatoire Astronomique de l'Université de Genève (ObsGE), Université de Genève (UNIGE), arXiv, Import

المصدر: Astronomy and Astrophysics-A&A
Astronomy and Astrophysics-A&A, EDP Sciences, 2004, 425, pp.997-1008

مصطلحات موضوعية: Population, Brown dwarf, FOS: Physical sciences, Minimum mass, Astrophysics::Cosmology and Extragalactic Astrophysics, Astrophysics, [SDU.ASTR] Sciences of the Universe [physics]/Astrophysics [astro-ph], 01 natural sciences, Luminosity, [PHYS.ASTR.CO]Physics [physics]/Astrophysics [astro-ph]/Cosmology and Extra-Galactic Astrophysics [astro-ph.CO], 0103 physical sciences, Astrophysics::Solar and Stellar Astrophysics, Adaptive optics, education, 010303 astronomy & astrophysics, Astrophysics::Galaxy Astrophysics, Physics, education.field_of_study, [SDU.ASTR]Sciences of the Universe [physics]/Astrophysics [astro-ph], 010308 nuclear & particles physics, Astrophysics (astro-ph), Astronomy and Astrophysics, Stars, Amplitude, [PHYS.ASTR.CO] Physics [physics]/Astrophysics [astro-ph]/Cosmology and Extra-Galactic Astrophysics [astro-ph.CO], Space and Planetary Science, Astrophysics::Earth and Planetary Astrophysics, Statistical evidence

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::623ec65c7e45fecebe3e183572da7f70
https://doi.org/10.1051/0004-6361:20048006

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المؤلفون: Thomas Zimmer, Muriel Riet, N. Labat, Cristell Maneux, Jean Godin, C. Hainaut, Jean-Yves Dupuy, B. Grandchamp, F. Marc, G. A. Kone, Virginie Nodjiadjim

المساهمون: Laboratoire de l'intégration, du matériau au système (IMS), Université Sciences et Technologies - Bordeaux 1 (UB)-Institut Polytechnique de Bordeaux-Centre National de la Recherche Scientifique (CNRS), NANOELECTRONIQUE/FICEI, Université Sciences et Technologies - Bordeaux 1 (UB)-Institut Polytechnique de Bordeaux-Centre National de la Recherche Scientifique (CNRS)-Université Sciences et Technologies - Bordeaux 1 (UB)-Institut Polytechnique de Bordeaux-Centre National de la Recherche Scientifique (CNRS), NANOELECTRONIQUE/MODEL, Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF), Nanoélectronique/MODEL, CPU, Université Sciences et Technologies - Bordeaux 1-Institut Polytechnique de Bordeaux-Centre National de la Recherche Scientifique (CNRS), Université Sciences et Technologies - Bordeaux 1-Institut Polytechnique de Bordeaux-Centre National de la Recherche Scientifique (CNRS)-Université Sciences et Technologies - Bordeaux 1-Institut Polytechnique de Bordeaux-Centre National de la Recherche Scientifique (CNRS)

المصدر: IEEE Transactions on Electron Devices
IEEE Transactions on Electron Devices, 2013, 60 (3), pp.1068-1074. ⟨10.1109/TED.2013.2241067⟩
IEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers, 2013, 60 (3), pp.1068-1074. ⟨10.1109/TED.2013.2241067⟩

مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, Heterojunction bipolar transistor, Thermal resistance, Electrical engineering, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Electronic, Optical and Magnetic Materials, Gallium arsenide, chemistry.chemical_compound, Reliability (semiconductor), chemistry, 0103 physical sciences, Optoelectronics, Junction temperature, Electrical and Electronic Engineering, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, 0210 nano-technology, business, Current density, ComputingMilieux_MISCELLANEOUS, Common emitter, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a72a9536402b7c8e81ebdea96804f886
https://hal.science/hal-00909053