المؤلفون: E. Gomiero, G. Samanni, J. Jasse, C. Jahan, O. Weber, R. Berthelon, R. Ranica, L. Favennec, V. Caubet, D. Ristoiu, J. P. Reynard, L. Clement, P. Zuliani, R. Annunziata, F. Arnaud

المصدر: IEEE Journal of the Electron Devices Society, Vol 7, Pp 517-521 (2019)

مصطلحات موضوعية: Amorphous, chalcogenide, phase change memory (PCM), Ge-Sb-Te (GST) compounds, quenching time, resistance, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/8704299/; https://doaj.org/toc/2168-6734

URL الوصول: https://doaj.org/article/d32a756f1cf8471fafe70bc493d62c3c

المؤلفون: L. Grenouillet, J. Barbot, J. Laguerre, S. Martin, C. Carabasse, M. Louro, M. Bedjaoui, S. Minoret, S. Kerdilès, C. Boixaderas, T. Magis, C. Jahan, F. Andrieu, J. Coignus

المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9e8e0a386fa50f81c95c4bc7797351fd
https://doi.org/10.1109/irps48203.2023.10118099

المؤلفون: Roberto Annunziata, O. Weber, J. Jasse, Paola Zuliani, V. Caubet, Franck Arnaud, G. Samanni, Enrico Gomiero, L. Favennec, R. Berthelon, D. Ristoiu, C. Jahan, L. Clement, J. P. Reynard, R. Ranica

المصدر: IEEE Journal of the Electron Devices Society, Vol 7, Pp 517-521 (2019)

مصطلحات موضوعية: Materials science, Chalcogenide, Measure (mathematics), law.invention, resistance, chalcogenide, chemistry.chemical_compound, law, Electrical and Electronic Engineering, Crystallization, business.industry, Process (computing), quenching time, Function (mathematics), Ge-Sb-Te (GST) compounds, Electronic, Optical and Magnetic Materials, Amorphous solid, chemistry, phase change memory (PCM), Amorphous, Optoelectronics, lcsh:Electrical engineering. Electronics. Nuclear engineering, State (computer science), business, lcsh:TK1-9971, Reset (computing), Biotechnology

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::930b1b015adb15c3586cc459f3581efb
https://doi.org/10.1109/jeds.2019.2913467

المؤلفون: F. Mazen, C. Pellissier, C. Jahan, A. Roman, Laurent Grenouillet, N.-P. Tran, M. Bedjaoui, A. Seignard, S. Ricavy, Elisa Vianello, P. Besombes, V. Meli, O. Billoint, Christelle Boixaderas, M. Tessaire, S. Landis, Gabriel Molas, A. Persico, A. Magalhaes-Lucas, P. Dezest, Christelle Charpin-Nicolle, F. Gaillard, S. Bernasconi, R. Segaud, J. Arcamone, Steve W. Martin, C. Carabasse, T. Magis, N. Castellani, Etienne Nowak

المصدر: IEEE International Memory Workshop (IMW)
2021 IEEE International Memory Workshop (IMW)

مصطلحات موضوعية: Materials science, business.industry, Transistor, Spice, Monte Carlo method, Silicon on insulator, law.invention, Power (physics), Non-volatile memory, CMOS, law, Logic gate, Optoelectronics, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::738ac7f810ad2bba6fdea6405930ae0c

المؤلفون: Roberto Annunziata, L. Favennec, F. Disegni, D. Turgis, Jean-Luc Ogier, Remi Beneyton, Xavier Federspiel, N. Cherault, Fausto Piazza, A. Gandolfo, M. Molgg, E. Ciantar, Enrico Gomiero, P.O. Sassoulas, J. P. Reynard, B. Dumont, S. Delmedico, Alexandre Villaret, Olivier Weber, A. Viscuso, Franck Arnaud, L. Clement, L. Desvoivres, Paulo Ferreira, Paolo Mattavelli, C. Gallon, R. Ranica, O. Kermarrec, J. Jasse, S. Chouteau, C. Jahan, C. Boccaccio, Paolo Cappelletti, A. Souhaite, G. Samanni, Paola Zuliani, R. Berthelon, V. Caubet, Philippe Boivin, D. Ristoiu, Alfonso Maurelli, J. C. Grenier

المصدر: 2020 IEEE International Electron Devices Meeting (IEDM).

مصطلحات موضوعية: Computer science, business.industry, Reading (computer), Transistor, Bipolar junction transistor, Automotive industry, High density, law.invention, Microcontroller, Reliability (semiconductor), law, Soldering, Electronic engineering, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::cb9d7d45a06fe3730a77e9eea337f87a
https://doi.org/10.1109/iedm13553.2020.9371934

المؤلفون: Charles M. Rice, Xianfang Wu, Stephan Urban, William M. Schneider, Y. Ni, Yingpu Yu, Eleftherios Michailidis, Ashley Acevedo, Chenhui Zou, Y.P. de Jong, C. Jahan, Pradeep M. Ambrose, Corrine Quirk, Mohanmmad Kabbani, Amir Shlomai

مصطلحات موضوعية: Hepatitis B virus, 0303 health sciences, medicine.drug_class, RNA, Drug resistance, Biology, medicine.disease, medicine.disease_cause, Virology, Virus, digestive system diseases, 3. Good health, 03 medical and health sciences, Chronic infection, 0302 clinical medicine, Viral evolution, Hepatocellular carcinoma, medicine, 030211 gastroenterology & hepatology, Antiviral drug, 030304 developmental biology

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::61de0737a4cbc48a334802f65eea8603

المؤلفون: B.-N. Bozon, J.-Ph. Reynard, Y. Le Friec, Sylvie Favier, Yann Mazel, K. Dabertrand, Patrice Gergaud, R. Famulok, Ph. Rodriguez, Fabrice Nemouchi, C. Jahan, Bernard Previtali, F. Boyer

المساهمون: Département Intégration Hétérogène sur Silicium (DIHS), Commissariat à l'énergie atomique et aux énergies alternatives (CEA), STMicroelectronics, Applied Materials France, ANR-11-EQPX-0010,CRGF,Lignes synchrotron françaises à l'ESRF(2011), ANR-10-EQPX-0030,FDSOI11,Plateforme FDSOI pour le node 11nm(2010), ANR-10-AIRT-0005,NANOELEC,NANOELEC(2010), ANR: ANR-10-AIRT-05,Programme Investissements d’Avenir

المصدر: Materials Science in Semiconductor Processing
Materials Science in Semiconductor Processing, 2017, 71, pp.433-440. ⟨10.1016/j.mssp.2017.08.033⟩
Materials Science in Semiconductor Processing, Elsevier, 2017, 71, pp.433-440. ⟨10.1016/j.mssp.2017.08.033⟩

مصطلحات موضوعية: Materials science, Interconnects, Analytical chemistry, chemistry.chemical_element, 02 engineering and technology, Substrate (electronics), Tungsten, 01 natural sciences, [SPI.MAT]Engineering Sciences [physics]/Materials, Atomic layer deposition, Plasma-enhanced chemical vapor deposition, Low resistance, Contact, 0103 physical sciences, General Materials Science, Thin film, Composite material, 010302 applied physics, Mechanical Engineering, 021001 nanoscience & nanotechnology, Condensed Matter Physics, [SPI.TRON]Engineering Sciences [physics]/Electronics, X-ray reflectivity, Tungsten film, chemistry, Mechanics of Materials, PCRAM, Liner, 0210 nano-technology, Layer (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::92b6f3a32feea7f719e44744e05d4fc6
https://doi.org/10.1016/j.mssp.2017.08.033

لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.

لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.

المؤلفون: V. Loup, G. Audoit, S. Reboh, R. Coquand, M. Vinet, M. Barlas, N. Rambal, S Barraud, A. Toffoli, E. Vianello, C. Jahan, V. Beugin, Vincent Delaye, O. Pollet, L. Brevard, C. Vizioz, O. Faynot, T. Dewolf, Nicolas Posseme, S. Chevalliez, N. Allouti, L. Perniola, Sébastien Barnola, B. Bouix, S. Bernasconi, C. Comboroure, Philippe Rodriguez, Yves Morand, C. Tallaron, L. Grenouillet

المصدر: Extended Abstracts of the 2017 International Conference on Solid State Devices and Materials.

مصطلحات موضوعية: Materials science, law, Process (engineering), Transistor, Engineering physics, law.invention

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::40e32b0961ff0b1c447494a433e2c935
https://doi.org/10.7567/ssdm.2017.d-1-04