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المؤلفون: R. N. Jacobs, Priyalal Wijewarnasuriya, C. M. Lennon, J. K. Markunas, Andrew J. Stoltz, L. O. Bubulac, J. M. Arias, Jeffrey M. Peterson, Kelly A. Jones, D. D. Lofgreen, M. Reddy, M. Jaime-Vasquez, J. D. Benson, P. J. Smith, L. A. Almeida, Scott M. Johnson
المصدر: Journal of Electronic Materials. 45:4502-4510
مصطلحات موضوعية: 010302 applied physics, Materials science, Solid-state physics, Analytical chemistry, Polishing, 02 engineering and technology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Electronic, Optical and Magnetic Materials, Impurity, 0103 physical sciences, Materials Chemistry, Wafer, Electrical and Electronic Engineering, 0210 nano-technology, Molecular beam epitaxy
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المؤلفون: A. Yulius, C. M. Lennon, L. A. Almeida, Priyalal Wijewarnasuriya, R. N. Jacobs, Jeffrey M. Peterson, M. Jaime-Vasquez, R. Hirsch, Andrew J. Stoltz, S. Motakef, M. Reddy, J. D. Benson, M. F. Vilela, P. J. Smith, M. Carmody, J. K. Markunas, L. O. Bubulac, J. M. Arias, D. D. Lofgreen, J. Fiala, Scott M. Johnson
المصدر: Journal of Electronic Materials. 44:3082-3091
مصطلحات موضوعية: Materials science, Analytical chemistry, Polishing, chemistry.chemical_element, Substrate (electronics), Contamination, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, Crystallography, chemistry, Impurity, Materials Chemistry, Wafer, Electrical and Electronic Engineering, Inclusion (mineral), Tellurium, Molecular beam epitaxy
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المؤلفون: C. Nozaki, M. Jaime Vasquez, C. M. Lennon, B. Wissman, R. N. Jacobs, C. Taylor, Joseph G. Pellegrino, L. A. Almeida, J. Arias
المصدر: Journal of Electronic Materials. 44:3076-3081
مصطلحات موضوعية: Materials science, Solid-state physics, business.industry, Annealing (metallurgy), Condensed Matter Physics, Curvature, Cadmium telluride photovoltaics, Thermal expansion, Electronic, Optical and Magnetic Materials, Residual stress, Materials Chemistry, Optoelectronics, Electrical and Electronic Engineering, Thin film, business, Molecular beam epitaxy
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المؤلفون: K. Brogden, C. M. Lennon, P. J. Smith, N. Supola, R. N. Jacobs, Patrick Maloney, Andrew J. Stoltz, M. Jaime-Vasquez, Alexander Brown, J. D. Benson, L. A. Almeida, J. K. Markunas
المصدر: Journal of Electronic Materials. 43:3708-3717
مصطلحات موضوعية: Materials science, business.industry, Sensing applications, Material system, Condensed Matter Physics, Cadmium telluride photovoltaics, Electronic, Optical and Magnetic Materials, Characterization (materials science), High surface, Materials Chemistry, Surface roughness, Optoelectronics, Electrical and Electronic Engineering, business, Surface reconstruction
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المؤلفون: R. N. Jacobs, Joseph G. Pellegrino, S. Sivananthan, J. Arias, L. A. Almeida, A. E. Brown, M. Jaime-Vasquez, C. M. Lennon
المصدر: Journal of Electronic Materials. 42:3224-3230
مصطلحات موضوعية: Electron mobility, Materials science, Condensed matter physics, Annealing (metallurgy), Doping, Analytical chemistry, Atmospheric temperature range, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, Gallium arsenide, chemistry.chemical_compound, chemistry, Hall effect, Materials Chemistry, Surface layer, Electrical and Electronic Engineering, Molecular beam epitaxy
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المؤلفون: J. K. Markunas, Joseph G. Pellegrino, J. D. Benson, R. N. Jacobs, C. M. Lennon, P. J. Smith, L. A. Almeida, J. Arias
المصدر: Journal of Electronic Materials. 42:3344-3348
مصطلحات موضوعية: Materials science, Solid-state physics, Annealing (metallurgy), Kinetics, Analytical chemistry, Activation energy, Condensed Matter Physics, Cadmium telluride photovoltaics, Electronic, Optical and Magnetic Materials, Electron diffraction, Materials Chemistry, Sublimation (phase transition), Electrical and Electronic Engineering, Molecular beam epitaxy
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المؤلفون: M. F. Vilela, David R. Rhiger, Jeffrey M. Peterson, L. O. Bubulac, Y. Chen, J. A. Arias, M. Jaime-Vasquez, P. J. Smith, C. M. Lennon, J. W. Bangs, R. N. Jacobs, J. D. Benson, E. A. Patten, Scott M. Johnson, J. K. Markunas, G. Brill, Priyalal Wijewarnasuriya, L. A. Almeida, D. D. Lofgreen, Andrew J. Stoltz
المصدر: Journal of Electronic Materials. 42:3217-3223
مصطلحات موضوعية: Materials science, Annealing (metallurgy), business.industry, chemistry.chemical_element, Condensed Matter Physics, Cadmium telluride photovoltaics, Electronic, Optical and Magnetic Materials, Crystallography, Etch pit density, chemistry, Impurity, Getter, Scanning transmission electron microscopy, Materials Chemistry, Optoelectronics, Electrical and Electronic Engineering, business, Indium, Molecular beam epitaxy
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المؤلفون: S. Farrell, R. N. Jacobs, Y. Chen, G. Brill, M. Salmon, L. A. Almeida, J. D. Benson, J. Zu, Andrew J. Stoltz, C. M. Lennon, P. J. Smith, Priyalal Wijewarnasuriya
المصدر: Journal of Electronic Materials. 42:3148-3155
مصطلحات موضوعية: Materials science, business.industry, Annealing (metallurgy), Detector, Condensed Matter Physics, Focused ion beam, Cadmium telluride photovoltaics, Electronic, Optical and Magnetic Materials, Optics, Etch pit density, Getter, Scanning transmission electron microscopy, Materials Chemistry, Optoelectronics, Electrical and Electronic Engineering, Dislocation, business
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المؤلفون: C. M. Lennon
المصدر: 2nd Topical Meeting on Coherent Laser Radar: Technology and Applications.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::eb3f3ce45d086a14743436e5c8be5eb2
https://doi.org/10.1364/clr.1983.mc7