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    المساهمون: Raunvísindastofnun (HÍ), Science Institute (UI), Verkfræði- og náttúruvísindasvið (HÍ), School of Engineering and Natural Sciences (UI), Háskóli Íslands, University of Iceland

    المصدر: Scientific Reports
    Scientific reports (Nature Publishing Group) 7 (2017): 8234. doi:10.1038/s41598-017-08275-5
    info:cnr-pdr/source/autori:R. Mantovan 1, R. Fallica 1,11, A. Mokhles Gerami 2,3, T. E. Mølholt 2, C. Wiemer 1, M. Longo 1, H. P. Gunnlaugsson 4, K. Johnston 2, H. Masenda 5, D. Naidoo 5, M. Ncube 5, K. Bharuth-Ram 6,7, M. Fanciulli 1,8, H. P. Gislason 4, G. Langouche 9, S. Ólafsson 4 & G. Weyer 10/titolo:Atomic-scale study of the amorphous-to-crystalline phase transition mechanism in GeTe thin films/doi:10.1038%2Fs41598-017-08275-5/rivista:Scientific reports (Nature Publishing Group)/anno:2017/pagina_da:8234/pagina_a:/intervallo_pagine:8234/volume:7
    Mantovan, R, Fallica, R, Gerami, A M, Molholt, T E, Wiemer, C, Longo, M, Gunnlaugsson, H P, Johnston, K, Masenda, H, Naidoo, D, Ncube, M, Bharuth-Ram, K, Fanciulli, M, Gislason, H P, Langouche, G, Olafsson, S & Weyer, G 2017, ' Atomic-scale study of the amorphous-to-crystalline phase transition mechanism in GeTe thin films ', Scientific Reports, vol. 7, 8234 . https://doi.org/10.1038/s41598-017-08275-5
    Scientific Reports, Vol 7, Iss 1, Pp 1-12 (2017)

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