يعرض 1 - 10 نتائج من 4,274 نتيجة بحث عن '"CAPACITANCE-voltage characteristics"', وقت الاستعلام: 0.92s تنقيح النتائج
  1. 1
    مؤتمر
    A Physics-based Analytical Model for Ballistic InSe Nanotransistors

    المؤلفون: de Souza, Adelcio M., Celino, Daniel R., Ragi, Regiane, Romero, Murilo A.

    المصدر: 2024 IEEE 24th International Conference on Nanotechnology (NANO) Nanotechnology (NANO), 2024 IEEE 24th International Conference on. :185-190 Jul, 2024

    Relation: 2024 IEEE 24th International Conference on Nanotechnology (NANO)

    Full Text Finder
    أضف إلى المفضلة
  2. 2
    دورية أكاديمية
    On the Dynamic RON, Vertical Leakage and Capacitance Behavior in pGaN HEMTs With Heavily Carbon-Doped Buffers

    المؤلفون: Cioni, M., Chini, A., Zagni, N., Verzellesi, G., Giorgino, G., Cappellini, G., Miccoli, C., Toulon, G., Wakrim, T., Eloisa Castagna, M., Constant, A., Iucolano, F.

    المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 45(8):1437-1440 Aug, 2024

    Full Text Finder
    أضف إلى المفضلة
  3. 3
    دورية أكاديمية
    True Random Number Generator Using Memcapacitor With Charge Trapping Layer

    المؤلفون: Hwang, H., Suk Song, M., Youn, S., Kim, H.

    المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 45(8):1464-1467 Aug, 2024

    Full Text Finder
    أضف إلى المفضلة
  4. 4
    دورية أكاديمية
    Low-Temperature Annealing in O2 to Annihilate the Fixed Charges in 4H-SiC/SiO2 Interface Induced by High-N-Density Nitridation Process

    المؤلفون: Yang, T., Onaya, T., Kita, K.

    المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 45(7):1145-1148 Jul, 2024

    Full Text Finder
    أضف إلى المفضلة
  5. 5
    مؤتمر
    Electrophysical Properties and Thermal Stability of Pt/InAlAs Schottky Barrier Diodes

    المؤلفون: Paramonova, Maria A., Aksenov, Maxim S., Genze, Ilya Yu., Dmitriev, Dmitriy V.

    المصدر: 2024 IEEE 25th International Conference of Young Professionals in Electron Devices and Materials (EDM) Young Professionals in Electron Devices and Materials (EDM), 2024 IEEE 25th International Conference of. :210-213 Jun, 2024

    Relation: 2024 IEEE 25th International Conference of Young Professionals in Electron Devices and Materials (EDM)

    Full Text Finder
    أضف إلى المفضلة
  6. 6
    مؤتمر
    High Performance Split-Gate-Trench MOS Based on Radiation-Hardening Technology and Its Total-Ionizing-Dose Radiation Effects

    المؤلفون: Mo, Weiye, Ye, Jun, Liu, Haonan, Xiao, Xuan, Song, Yang, Huang, Wei, Wang, Tao, Zhang, Debin, Zhang, David. Wei

    المصدر: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2024 36th International Symposium on. :1-4 Jun, 2024

    Relation: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD)

    Full Text Finder
    أضف إلى المفضلة
  7. 7
    مؤتمر
    Evidence of Dynamic Input Capacitance of SiC Power MOSFETs

    المؤلفون: Nagel, Michel, Race, Salvatore, Brandl, Anja, Kovacevic-Badstuebner, Ivana, Grossner, Ulrike

    المصدر: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2024 36th International Symposium on. :128-131 Jun, 2024

    Relation: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD)

    Full Text Finder
    أضف إلى المفضلة
  8. 8
    مؤتمر
    Evaluation of Trap Parameters of RC-IGBT After Repetitive Avalanche Stress by DLTS Simulation

    المؤلفون: Yamashita, Yusuke, Watanabe, Yukihiko, Murakawa, Koichi, Yamagishi, Tetsuto

    المصدر: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2024 36th International Symposium on. :52-55 Jun, 2024

    Relation: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD)

    Full Text Finder
    أضف إلى المفضلة
  9. 9
    مؤتمر
    Analysis and Suppression of Commutation Overlap-Time for Bidirectional Switch-Based Current Source Converter

    المؤلفون: Xue, Yubin, Ming, Lei, Gu, Zihang, Wang, Peng, Li, Jiansai, Xin, Zhen

    المصدر: 2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia) Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia), 2024 IEEE 10th International. :3289-3295 May, 2024

    Relation: 2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia)

    أضف إلى المفضلة
  10. 10
    مؤتمر
    LS-SVM based capacitor anomaly identification method

    المؤلفون: Lv, Chunlin, Deng, Yuxi, Liu, Jinjun, Zhang, Xiaotong, Zhang, Yan, Chang, Fei

    المصدر: 2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia) Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia), 2024 IEEE 10th International. :4542-4546 May, 2024

    Relation: 2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia)

    أضف إلى المفضلة
أدوات البحث: أحصل على تغذية RSS – أرسل هذا البحث بالبريد الإلكتروني – حفظ البحث – جدول التنبيهات: لا شيء