المؤلفون: Shuqing Duan, Ruijuan Qi, Ming Li, Yanli Zhao, Liu Chen, Qinqin Yu, Guo, Annie, Chang, Venson, Wu, Jeff, Chien, Kary

المصدر: Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2013 20th IEEE International Symposium on the. :99-102 Jul, 2013

Relation: 2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Wang, Dulin, Zhao, Atman Yong, Yu, Lisa, Wu, Jeff, Chang, Venson, Chien, Wei-Ting Kary

المصدر: 2013 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2013 IEEE International. :EM.1.1-EM.1.3 Apr, 2013

Relation: 2013 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Zhao, XiangFu, Wu, Jeff, Chang, Venson

المصدر: In Microelectronic Engineering 5 November 2014 129:86-90

المؤلفون: KARY CHIEN, WEI-TING, ATMAN, ZHAO YONG, CHANG, VENSON, WU, JEFF

المصدر: International Journal of Reliability, Quality & Safety Engineering; Aug2013, Vol. 20 Issue 4, p-1, 20p, 2 Diagrams, 1 Chart, 8 Graphs

مصطلحات موضوعية: RISK assessment, SEMICONDUCTOR device reliability, SEMICONDUCTOR failures, SEMICONDUCTOR device testing, DIELECTRICS, RELIABILITY of electronics, SEMICONDUCTOR manufacturing

المؤلفون: Zheng, Pengfei, Dong, Weichun, Chang, Venson, Liu, Yunhai, Li, Gang, and, Chunkui Ji, Li, Ming

المصدر: ECS Transactions; November 2010, Vol. 27 Issue: 1 p269-273, 5p

المؤلفون: Ma, Jinyi J., Wang, Xiaotao J., Gong, Excimer B., Chang, Venson

المصدر: ECS Transactions; November 2010, Vol. 27 Issue: 1 p261-267, 7p

المؤلفون: Zhao, Xiang Fu, Wu, Jeff, Chang, Venson

المصدر: ECS Transactions; February 2014, Vol. 60 Issue: 1