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1مؤتمر
المؤلفون: Shuqing Duan, Ruijuan Qi, Ming Li, Yanli Zhao, Liu Chen, Qinqin Yu, Guo, Annie, Chang, Venson, Wu, Jeff, Chien, Kary
المصدر: Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2013 20th IEEE International Symposium on the. :99-102 Jul, 2013
Relation: 2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
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2مؤتمر
المؤلفون: Wang, Dulin, Zhao, Atman Yong, Yu, Lisa, Wu, Jeff, Chang, Venson, Chien, Wei-Ting Kary
المصدر: 2013 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2013 IEEE International. :EM.1.1-EM.1.3 Apr, 2013
Relation: 2013 IEEE International Reliability Physics Symposium (IRPS)
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3دورية أكاديمية
المؤلفون: Zhao, XiangFu, Wu, Jeff, Chang, Venson
المصدر: In Microelectronic Engineering 5 November 2014 129:86-90
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4دورية أكاديمية
المؤلفون: KARY CHIEN, WEI-TING, ATMAN, ZHAO YONG, CHANG, VENSON, WU, JEFF
المصدر: International Journal of Reliability, Quality & Safety Engineering; Aug2013, Vol. 20 Issue 4, p-1, 20p, 2 Diagrams, 1 Chart, 8 Graphs
مصطلحات موضوعية: RISK assessment, SEMICONDUCTOR device reliability, SEMICONDUCTOR failures, SEMICONDUCTOR device testing, DIELECTRICS, RELIABILITY of electronics, SEMICONDUCTOR manufacturing
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5دورية
المؤلفون: Zheng, Pengfei, Dong, Weichun, Chang, Venson, Liu, Yunhai, Li, Gang, and, Chunkui Ji, Li, Ming
المصدر: ECS Transactions; November 2010, Vol. 27 Issue: 1 p269-273, 5p
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6دورية
المؤلفون: Ma, Jinyi J., Wang, Xiaotao J., Gong, Excimer B., Chang, Venson
المصدر: ECS Transactions; November 2010, Vol. 27 Issue: 1 p261-267, 7p
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7دورية
المؤلفون: Zhao, Xiang Fu, Wu, Jeff, Chang, Venson
المصدر: ECS Transactions; February 2014, Vol. 60 Issue: 1