المؤلفون: Laborie, Lao, Trotti, Paola, Veyret, Killian, Cagli, Carlo

المصدر: 2023 35th International Conference on Microelectronic Test Structure (ICMTS) Microelectronic Test Structure (ICMTS), 2023 35th International Conference on. :1-4 Mar, 2023

Relation: 2023 35th International Conference on Microelectronic Test Structure (ICMTS)

المؤلفون: Cagli, Carlo^Aff5, Perniola, Luca^Aff5

المساهمون: Merkle, Dieter, Managing Editor^Aff1, Rudan, Massimo, editor^Aff2, Brunetti, Rossella, editor^Aff3, Reggiani, Susanna, editor^Aff4

المصدر: Springer Handbook of Semiconductor Devices. :603-633

المؤلفون: Cagli, Carlo, Molas, Gabriel, Harrand, Michel, Bernasconi, Sophie, Charpin, Christelle, El Hajjam, Khalil, Nodin, Jean Francois, Reimbold, Gilles

المصدر: 2017 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2017 IEEE International. :1-4 May, 2017

Relation: 2017 IEEE International Memory Workshop (IMW)

المؤلفون: Nguyen, Clement, Cagli, Carlo, Molas, Gabriel, Sklenard, Benoit, Nail, Cecile, El Hajjam, Khalil, Nodin, Jean-Francois, Charpin, Christelle, Bernasconi, Sophie, Reimbold, Gilles

المصدر: 2017 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2017 IEEE International. :1-4 May, 2017

Relation: 2017 IEEE International Memory Workshop (IMW)

المؤلفون: Nguyen, Clement, Cagli, Carlo, Vianello, Elisa, Persico, Alain, Molas, Gabriel, Reimbold, Gilles, Rafhay, Quentin, Ghibaudo, Gerard

المصدر: 2015 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2015 IEEE International. :17-20 Oct, 2015

Relation: 2015 IEEE International Integrated Reliability Workshop (IIRW)

المؤلفون: Barci, Marinela, Molas, Gabriel, Toffoli, Alain, Bernard, Mathieu, Roule, Anne, Cagli, Carlo, Cluzel, Jacques, Vianello, Elisa, De Salvo, Barbara, Perniola, Luca

المصدر: 2015 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2015 IEEE International. :1-4 May, 2015

Relation: 2015 IEEE International Memory Workshop (IMW)

المؤلفون: Padovani, Andrea, Larcher, Luca, Padovani, Paolo, Cagli, Carlo, De Salvo, Barbara

المصدر: 2012 4th IEEE International Memory Workshop Memory Workshop (IMW), 2012 4th IEEE International. :1-4 May, 2012

Relation: 2012 4th IEEE International Memory Workshop (IMW)

المؤلفون: Lian, Xiaojuan, Long, Shibing, Cagli, Carlo, Buckley, Julien, Miranda, Enrique, Liu, Ming, Sune, Jordi

المصدر: 2012 13th International Conference on Ultimate Integration on Silicon (ULIS) Ultimate Integration on Silicon (ULIS), 2012 13th International Conference on. :101-104 Mar, 2012

Relation: 2012 13th International Conference on Ultimate Integration on Silicon (ULIS)

المؤلفون: Long, Shibing, Cagli, Carlo, Ielmini, Daniele, Liu, Ming, Sune, Jordi

المصدر: 2011 11th Annual Non-Volatile Memory Technology Symposium Proceeding Non-Volatile Memory Technology Symposium (NVMTS), 2011 11th Annual. :1-5 Nov, 2011

Relation: 2011 11th Annual Non-Volatile Memory Technology Symposium (NVMTS)

المؤلفون: Sassine, Gilbert, Nail, Cecile, Tillie, Luc, Robayo, Diego Alfaro, Levisse, Alexandre, Cagli, Carlo, Hajjam, Khalil El., Nodin, Jean-Francois, Vianello, Elisa, Bernard, Mathieu, Molas, Gabriel, Nowak, Etienne

المصدر: 2018 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2018 IEEE International. :P-MY.2-1-P-MY.2-5 Mar, 2018

Relation: 2018 IEEE International Reliability Physics Symposium (IRPS)