المؤلفون: Sicre, M., Federspiel, X., Mamdy, B., Roy, D., Calmon, F.

المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-5 Mar, 2023

Relation: 2023 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Gao, S., Issartel, D., Orobtchouk, R., Mandorlo, F., Golanski, D., Cathelin, A., Calmon, F.

المصدر: 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Simulation of Semiconductor Processes and Devices (SISPAD), 2021 International Conference on. :301-304 Sep, 2021

Relation: 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)

المؤلفون: Issartel, D., Gao, S., Hagen, S., Pittet, P., Cellier, R., Golanski, D., Cathelin, A., Calmon, F.

المصدر: 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS) Ultimate Integration on Silicon (EuroSOI-ULIS), 2021 Joint International EUROSOI Workshop and International Conference on. :1-4 Sep, 2021

Relation: 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS)

المؤلفون: Gao, S., Issartel, D., Orobtchouk, R., Mandorlo, F., Golanski, D., Cathelin, A., Calmon, F.

المصدر: 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS) Ultimate Integration on Silicon (EuroSOI-ULIS), 2021 Joint International EUROSOI Workshop and International Conference on. :1-4 Sep, 2021

Relation: 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS)

المؤلفون: Issartel, D., de Albuquerque, T. Chaves, Clerc, R., Pittet, P., Cellier, R., Golanski, D., Cathelin, A., Calmon, F.

المصدر: 2020 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) Ultimate Integration on Silicon (EUROSOI-ULIS), 2020 Joint International EUROSOI Workshop and International Conference on. :1-5 Sep, 2020

Relation: 2020 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)

المؤلفون: de Albuquerque, T. Chaves, Issartel, D., Clerc, R., Pittet, P., Cellier, R., Uhring, W., Cathelin, A., Calmon, F.

المصدر: ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), 2019 49th European. :210-213 Sep, 2019

Relation: ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC)

المؤلفون: de Albuquerque, T. Chaves, Issartel, D., Clerc, R., Pittet, P., Cellier, R., Calmon, F.

المصدر: 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) Ultimate Integration on Silicon (EUROSOI-ULIS), 2019 Joint International EUROSOI Workshop and International Conference on. :1-4 Apr, 2019

Relation: 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)

المؤلفون: de Albuquerque, T. Chaves, Calmon, F., Clerc, R., Pittet, P., Benhammou, Y., Golanski, D., Jouan, S., Rideau, D., Cathelin, A.

المصدر: 2018 48th European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), 2018 48th European. :82-85 Sep, 2018

Relation: ESSDERC 2018 - 48th European Solid-State Device Research Conference (ESSDERC)

المؤلفون: Liao, J., Kosut, O., Sankar, L., du Pin Calmon, F.

المصدر: IEEE Transactions on Information Theory IEEE Trans. Inform. Theory Information Theory, IEEE Transactions on. 65(12):8043-8066 Dec, 2019

المؤلفون: Vignetti, M. M., Calmon, F., Pittet, P., Pares, G., Cellier, R., Qmquerez, L., Savoy-Navarro, A.

المصدر: 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD) Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD), 2016. :1-7 Oct, 2016

Relation: 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD)