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1مؤتمر
المؤلفون: Mirabella, N., Floridia, A., Cantoro, R., Grosso, M., Reorda, M. Sonza
المصدر: 2023 26th Euromicro Conference on Digital System Design (DSD) DSD Digital System Design (DSD), 2023 26th Euromicro Conference on. :214-219 Sep, 2023
Relation: 2023 26th Euromicro Conference on Digital System Design (DSD)
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2دورية أكاديمية
المؤلفون: Deligiannis, N.I., Faller, T., Cantoro, R., Paxian, T., Becker, B., Reorda, M.S.
المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 42(11):4270-4281 Nov, 2023
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3دورية أكاديمية
المؤلفون: Anghel, L., Cantoro, R., Masante, R., Portolan, M., Sartoni, S., Reorda, M.S.
المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 42(11):4246-4259 Nov, 2023
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4دورية أكاديمية
المؤلفون: Bellarmino, N., Cantoro, R., Huch, M., Kilian, T., Martone, R., Schlichtmann, U., Squillero, G.
المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 42(10):3436-3449 Oct, 2023
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5مؤتمر
المؤلفون: Mirabella, N., Floridia, A., Cantoro, R., Grosso, M., Reorda, M. Sonza
المصدر: 2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS) Electronics, Circuits and Systems (ICECS), 2022 29th IEEE International Conference on. :1-4 Oct, 2022
Relation: 2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS)
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6مؤتمر
المؤلفون: Bernardi, P., Cantoro, R., Coyette, A., Dobbeleare, W., Fieback, M., Floridia, A., Gielen, G., Gomez, J., Grosso, M., Guerriero, A.M., Guglielminetti, I., Hamdioui, S., Insinga, G., Mautone, N., Mirabella, N., Sartoni, S., Reorda, M.S., Ullmann, R., Vanhooren, R., Xama, N., Wu, L.
المصدر: 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2022 IEEE 28th International Symposium on. :1-10 Sep, 2022
Relation: 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS)
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7مؤتمر
المؤلفون: Angione, F., Appello, D., Aribido, J., Athavale, J., Bellarmino, N., Bernardi, P., Cantoro, R., De Sio, C., Foscale, T., Gavarini, G., Guerrero, J., Huch, M., Iaria, G., Kilian, T., Mariani, R., Martone, R., Ruospo, A., Sanchez, E., Schlichtmann, U., Squillero, G., Reorda, M. Sonza, Sterpone, L., Tancorre, V., Ugioli, R.
المصدر: 2022 IEEE European Test Symposium (ETS) Test Symposium (ETS), 2022 IEEE European. :1-10 May, 2022
Relation: 2022 IEEE European Test Symposium (ETS)
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8مؤتمر
المؤلفون: Bernardi, P., Insinga, G., Paganini, G., Cantoro, R., Beer, P., Coppetta, M., Mautone, N., Carnevale, G., Scaramuzza, P., Ullmann, R.
المصدر: 2022 IEEE European Test Symposium (ETS) Test Symposium (ETS), 2022 IEEE European. :1-6 May, 2022
Relation: 2022 IEEE European Test Symposium (ETS)
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9مؤتمر
المؤلفون: Abbati, L. Degli, Ullmann, R., Paganini, G., Coppetta, M., Zaia, L., Huard, V., Montfort, O., Cantoro, R., Insinga, G., Venini, F., Calao, P., Bernardi, P.
المصدر: 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2021 IEEE International Symposium on. :1-6 Oct, 2021
Relation: 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
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10مؤتمر
المؤلفون: Cantoro, R., Deligiannis, N.I., Reorda, M.S., Traiola, M., Valea, E.
المصدر: 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2020 IEEE International Symposium on. :1-4 Oct, 2020
Relation: 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)