المؤلفون: Wan, Wei, Cao, Linjun, Yin, Shuang, Luo, Junrong, Zhang, Yeming, Zhang, Jiaxu, Ouyang, Yuejun

المصدر: In Ceramics International July 2024

المؤلفون: Premachandran, C.S., Cimino, Salvatore, Ogdan, Sean, Wu, Zhuo-Jie, Smith, Daniel, Kannan, Sukesh, Cao, Linjun, Prabhu, Manjunatha, Yao, Walter, Ranjan, Rakesh, England, Luke, Justison, Patrick

المصدر: 2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM) Electron Devices Technology and Manufacturing Conference (EDTM), 2018 IEEE 2nd. :37-40 Mar, 2018

Relation: 2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM)

المؤلفون: Zhang, Haojun, Lee, Jian-Hsing, Iyer, Natarajan Mahadeva, Cao, Linjun

المصدر: 2017 IEEE Electron Devices Technology and Manufacturing Conference (EDTM) Electron Devices Technology and Manufacturing Conference (EDTM), 2017 IEEE. :39-41 Feb, 2017

Relation: 2017 IEEE Electron Devices Technology and Manufacturing Conference (EDTM)

المؤلفون: Hu, Szu-Tung, Ho, Paul S., Cao, Linjun, Spinella, Laura

المصدر: 2018 IEEE International Interconnect Technology Conference (IITC) Interconnect Technology Conference (IITC), 2018 IEEE International. :46-47 Jun, 2018

Relation: 2018 IEEE International Interconnect Technology Conference (IITC)

المؤلفون: Hu, Szu-Tung, Cao, Linjun, Spinella, Laura, Ho, Paul S.

المصدر: 2018 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2018 IEEE International. :5.4.1-5.4.3 Dec, 2018

Relation: 2018 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Zhao, Pei, Pandey, Shesh Mani, Banghart, Edmund, He, Xiaoli, Asra, Ram, Mahajan, Vinayak, Zhang, Haojun, Zhu, Baofu, Yamada, Kenta, Cao, Linjun, Balasubramaniam, Pala, Joshi, Manoj, Eller, Manfred, Benistant, Francis, Samavedam, Srikanth

المصدر: 2017 Symposium on VLSI Technology VLSI Technology, 2017 Symposium on. :T228-T229 Jun, 2017

Relation: 2017 Symposium on VLSI Technology

المؤلفون: Choi, Seungman, Christiansen, Cathryn, Cao, Linjun, Zhang, James, Filippi, Ronald, Shen, Tian, Yeap, Kong Boon, Ogden, Sean, Zhang, Haojun, Fu, Bianzhu, Justison, Patrick

المصدر: 2018 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2018 IEEE International. :4F.4-1-4F.4-6 Mar, 2018

Relation: 2018 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Kannan, Sukeshwar, Premachandran, C. S., Smith, Daniel, Ranjan, Rakesh, Cimino, Salvatore, Yeap, Kong Boon, Wu, George, Cao, Linjun, Prabhu, Manjunatha, Agarwal, Rahul, Yao, Walter, England, Luke, Justison, Patrick

المصدر: 2017 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS),2017 IEEE International. :4A-2.1-4A-2.7 Apr, 2017

Relation: 2017 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Cao, Linjun, Zhang, Lijuan, Ho, Paul S., Justison, Patrick, Hauschildt, Meike

المصدر: 2014 IEEE International Reliability Physics Symposium Reliability Physics Symposium, 2014 IEEE International. :5A.5.1-5A.5.5 Jun, 2014

Relation: 2014 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Cao, Linjun, Ho, Paul S., Justison, Patrick

المصدر: 2013 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2013 IEEE International. :EM.5.1-EM.5.4 Apr, 2013

Relation: 2013 IEEE International Reliability Physics Symposium (IRPS)