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المؤلفون: Rick Carter, Joseph Versaggi, Jack M. Higman, Randy W. Mann, Shesh Mani Pandey, Meixiong Zhao, Sanjay Parihar, Carl J. Radens, Qun Gao, Ankur Arya
المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 27:1819-1827
مصطلحات موضوعية: Very-large-scale integration, Hardware_MEMORYSTRUCTURES, Materials science, business.industry, Drain-induced barrier lowering, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, 020202 computer hardware & architecture, Hardware and Architecture, Logic gate, MOSFET, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Technology scaling, Optoelectronics, Static noise margin, Static random-access memory, Electrical and Electronic Engineering, business, Software, Leakage (electronics)
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المؤلفون: Tao Li, Chris A. Mack, Frougier Julien, Andrew M. Greene, Daniel J. Dechene, Chris Waskiewicz, Veeraraghavan S. Basker, Jingyun Zhang, Stuart A. Sieg, Carl J. Radens, Prateek Hundekar, Tsung-Sheng Kang, Indira Seshadri, Nelson Felix, Jennifer Church, Eric R. Miller, Mary Breton
المصدر: Extreme Ultraviolet (EUV) Lithography XII.
مصطلحات موضوعية: Materials science, Resist, business.industry, Extreme ultraviolet lithography, Multiple patterning, Optoelectronics, Node (circuits), business, Critical dimension, Scaling, AND gate, Nanosheet
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ecd35b8cc836ad368baf97505bac549a
https://doi.org/10.1117/12.2583897 -
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المؤلفون: Pietro Montanini, Stuart A. Sieg, Andrew M. Greene, Nelson Felix, Xu Wenyu, Daniel J. Dechene, Jingyun Zhang, Eric R. Miller, Yann Mignot, Carl J. Radens, Indira Seshadri, Praveen Joseph, Veeraraghavan S. Basker, Mary Breton, Tao Li
المصدر: Design-Process-Technology Co-optimization for Manufacturability XIV.
مصطلحات موضوعية: Front and back ends, Materials science, business.industry, Extreme ultraviolet lithography, Multiple patterning, Optoelectronics, Node (circuits), Surface finish, Edge (geometry), business, AND gate, Nanosheet
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6c1657e32b8611133cff6f9ccc289143
https://doi.org/10.1117/12.2552159 -
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المؤلفون: Yang Liu, Rouwaida Kanj, Karthik Yogendra, Sudesh Saroop, Carl J. Radens, Weike Wang, Rajiv V. Joshi, Yue Tan
المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 24:968-978
مصطلحات موضوعية: Engineering, business.industry, 020208 electrical & electronic engineering, Transistor, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, Predictive failure analysis, Capacitance, 020202 computer hardware & architecture, law.invention, Threshold voltage, Parasitic capacitance, Hardware and Architecture, law, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Parasitic extraction, Static random-access memory, Electrical and Electronic Engineering, business, Technology CAD, Software, Computer hardware
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المؤلفون: Dhruv Singh, A. Gassaria, V. Chauhan, A. da Silva, P. Lindo, Daniel J. Dechene, M. Gribelyuk, I. Ahsan, M. Hasan, Judson R. Holt, Rod Augur, Jaeger Daniel, G. Northrop, G. Gomba, Ghosh Somnath, H. Narisetty, Basanth Jagannathan, Ting-Hsiang Hung, P. Liu, Y. Zhong, T. Gordon, Y. Fan, C. Schiller, A. Blauberg, O. Patterson, B. Morganfeld, Andres Bryant, J. Choo, T. Nigam, B. Senapati, V. Sardesai, N. Baliga, C. An, I. Ramirez, Rishikesh Krishnan, Arkadiusz Malinowski, S. Lucarini, Z. Sun, Sadanand V. Deshpande, R. Bhelkar, Mahender Kumar, Kong Boon Yeap, D. Conklin, Q. Fang, R. Gauthier, Purushothaman Srinivasan, S. Crown, M. Ozbek, Linjun Cao, G. Han, Z. Song, L. Huang, C. Serrau, R. Sweeney, M. Tan, Keith Donegan, Souvick Mitra, A. Zainuddin, P. Agnello, Balasubramanian S. Haran, Haifeng Sheng, B. Greene, A. Hassan, Tabakman Keith, Xin Wang, Sanjay Parihar, L. Cheng, M. Lagus, Jessica Dechene, D. Xu, G. Gifford, M. Zhao, Jeyaraj Antony Johnson, Y. Yan, Rick Carter, Manoj Joshi, W. Kim, Gabriela Dilliway, Jack M. Higman, S. Kalaga, Kai Zhao, Jinping Liu, A. Ogino, M. Lipinski, Amanda L. Tessier, Garo Jacques Derderian, S. Madisetti, N. Shah, Christopher Ordonio, M. Aminpur, Rakesh Ranjan, S. Saudari, Christa Montgomery, Tony Tae-Hyoung Kim, Jeric Sarad, Jae Gon Lee, Bharat Krishnan, Joseph F. Shepard, L. Hu, J. Sporre, Akil K. Sutton, Eswar Ramanathan, Cathryn Christiansen, J.H. Han, J. Lemon, Patrick Justison, Natalia Borjemscaia, Scott C. Johnson, B. Cohen, Kan Zhang, Srikanth Samavedam, G. Xu, T. Xuan, Unoh Kwon, C. Meng, Katsunori Onishi, Y. Shi, C. Huang, R. Coleman, Manfred Eller, Shreesh Narasimha, B. Kannan, J. Yang, Vivek Joshi, W. Ma, Christopher D. Sheraw, A. K. M. Mahalingam, Craig Child, E. Woodard, Tao Chu, Y. Jin, D. K. Sohn, Hasan M. Nayfeh, Mary Claire Silvestre, M. Lingalugari, G. Biery, Tian Shen, Carl J. Radens, E. Kaste, C-H. Lin, K. Han, K. Anil, Ankur Arya, Mehta Jaladhi, Jia Zeng, S.L. Liew, Michael V. Aquilino, M. Yu, M. Chen, Rohit Pal, E. Maciejewski, Stephan Grunow, Robert Fox, Rinus T. P. Lee
المصدر: 2017 IEEE International Electron Devices Meeting (IEDM).
مصطلحات موضوعية: 010302 applied physics, Computer science, Extreme ultraviolet lithography, Process (computing), 02 engineering and technology, 021001 nanoscience & nanotechnology, Low voltage sram, 01 natural sciences, Capacitance, CMOS, Computer architecture, Logic gate, 0103 physical sciences, Leverage (statistics), 0210 nano-technology, Immersion lithography
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5545f519d7dcbb19a8a64d95e77053fd
https://doi.org/10.1109/iedm.2017.8268476 -
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المؤلفون: Terence B. Hook, Matthew M. Ziegler, Keunwoo Kim, Phil Oldiges, Sudesh Saroop, Carl J. Radens, Chun-Chen Yeh, Robert C. Wong, Rajiv V. Joshi, Pranita Kerber, Ajay N. Bhoj, Rouwaida Kanj
المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 23:534-543
مصطلحات موضوعية: Speedup, Hardware and Architecture, Computer science, MOSFET, Electronic engineering, Hardware_PERFORMANCEANDRELIABILITY, Static random-access memory, Parasitic extraction, Electrical and Electronic Engineering, Technology CAD, Capacitance, Software, Electronic circuit
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المؤلفون: Shang-Bin Ko, Harold Pilo, Igor Arsovski, Steve Lamphier, Geordie Braceras, John A. Gabric, Robert M. Houle, Liang-Yu Chen, Frank Pavlik, Kevin A. Batson, Adnan Seferagic, Carl J. Radens
المصدر: ISSCC
مصطلحات موضوعية: Reduction (complexity), Footprint (electronics), Engineering, business.industry, Logic gate, Electrical engineering, Silicon on insulator, Equivalent oxide thickness, Static random-access memory, Electrical and Electronic Engineering, business, High-κ dielectric, Voltage
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المؤلفون: Steven P. Kowalczyk, Matthew M. Ziegler, Stephen V. Kosonocky, Carl J. Radens, Kevin Stawiasz, Yuen Chan, Azeez Bhavnagarwala, Uma Srinivasan
المصدر: IEEE Journal of Solid-State Circuits. 43:946-955
مصطلحات موضوعية: Materials science, business.industry, Transistor, Electrical engineering, Silicon on insulator, Biasing, Hardware_PERFORMANCEANDRELIABILITY, Integrated circuit, law.invention, CMOS, Nanoelectronics, law, MOSFET, Hardware_INTEGRATEDCIRCUITS, Static random-access memory, Electrical and Electronic Engineering, business
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المؤلفون: E. Engbrecht, Edward P. Maciejewski, Christopher D. Sheraw, R. Divakaruni, Zhengwen Li, Allen H. Gabor, L. Economikos, Fernando Guarin, N. Zhan, H-K Lee, MaryJane Brodsky, Kenneth J. Stein, Siyuranga O. Koswatta, Y. Yang, Byeong Y. Kim, J. Hong, A. Bryant, Herbert L. Ho, Ruqiang Bao, Nicolas Breil, Babar A. Khan, E. Woodard, W-H. Lee, C-H. Lin, A. Levesque, Kevin McStay, V. Basker, Viraj Y. Sardesai, C. Tran, A. Ogino, Reinaldo A. Vega, C. DeWan, Shreesh Narasimha, J-J. An, Amit Kumar, A. Aiyar, Ravikumar Ramachandran, W. Wang, X. Wang, W. Nicoll, D. Hoyos, A. Friedman, Barry Linder, Yongan Xu, E. Alptekin, Cathryn Christiansen, S. Polvino, Han Wang, Scott R. Stiffler, G. Northrop, S. Saudari, J. Rice, Saraf Iqbal Rashid, Sunfei Fang, Michael V. Aquilino, Z. Ren, B. Kannan, Geng Wang, Noah Zamdmer, T. Kwon, Paul D. Agnello, Hasan M. Nayfeh, S. Jain, Robert R. Robison, M. Hasanuzzaman, J. Cai, L. Lanzerotti, D. Wehelle-Gamage, Basanth Jagannathan, J. Johnson, E. Kaste, Kai Zhao, Huiling Shang, Carl J. Radens, Shariq Siddiqui, Y. Ke, D. Ferrer, Ximeng Guan, D. Conklin, K. Boyd, K. Henson, Siddarth A. Krishnan, Bernard A. Engel, H. Dong, S. Mahajan, Unoh Kwon, Dominic J. Schepis, William Y. Chang, Liyang Song, Brian J. Greene, Chengwen Pei, S.-J. Jeng, Clevenger Leigh Anne H, Vijay Narayanan, C. Zhu, Wai-kin Li, Henry K. Utomo, Wei Liu, Dureseti Chidambarrao
المصدر: 2014 IEEE International Electron Devices Meeting.
مصطلحات موضوعية: Engineering, Subthreshold conduction, business.industry, Processor design, Copper interconnect, Soi finfet, Hardware_PERFORMANCEANDRELIABILITY, Thread (computing), Planar, CMOS, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, business, Dram
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6233530b0b3fd6ddc14276a018716523
https://doi.org/10.1109/iedm.2014.7046977 -
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المؤلفون: R. Divakaruni, J. Mandelman, Gary B. Bronner, R. H. Dennard, Carl J. Radens, Ying Li, John K. DeBrosse
المصدر: IBM Journal of Research and Development. 46:187-212
مصطلحات موضوعية: Dynamic random-access memory, General Computer Science, Computer science, Transistor, Emphasis (telecommunications), Mode (statistics), Variety (cybernetics), law.invention, Capacitor, Hardware_GENERAL, law, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Scaling, Dram