المؤلفون: Schram, T., Smets, Q., Groven, B., Heyne, M. H., Kunnen, E., Thiam, A., Devriendt, K., Delabie, A., Lin, D., Lux, M., Chiappe, D., Asselberghs, I., Brus, S., Huyghebaert, C., Sayan, S., Juncker, A., Caymax, M., Radu, I. P.

المصدر: 2017 47th European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), 2017 47th European. :212-215 Sep, 2017

Relation: ESSDERC 2017 - 47th IEEE European Solid-State Device Research Conference (ESSDERC)

المؤلفون: Asselberghs, I., Smets, Q., Schram, T., Groven, B., Verreck, D., Afzalian, A., Arutchelvan, G., Gaur, A., Cott, D., Maurice, T., Brems, S., Kennes, K., Phommahaxay, A., Dupuy, E., Radisic, D., de Marneffe, J-F, Thiam, A., Li, W., Devriendt, K., Huyghebaert, C., Lin, D., Caymax, M., Morin, P., Radu, I.P.

المصدر: 2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :40.2.1-40.2.4 Dec, 2020

Relation: 2020 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Simoen, E., Dhayalan, S. K., Jayachandran, S., Gupta, S., Gencarelli, F., Hikavyy, A., Loo, R., Rosseel, E., Delabie, A., Caymax, M., Langer, R., Barla, K., Vrielinck, H., Lauwaert, J.

المصدر: 2016 China Semiconductor Technology International Conference (CSTIC) Semiconductor Technology International Conference (CSTIC), 2016 China. :1-3 Mar, 2016

Relation: 2016 China Semiconductor Technology International Conference (CSTIC)

المؤلفون: Huyghebaert, C., Schram, T., Smets, Q., Kumar Agarwal, T., Verreck, D., Brems, S., Phommahaxay, A., Chiappe, D., El Kazzi, S., Lockhart de la Rosa, C., Arutchelvan, G., Cott, D., Ludwig, J., Gaur, A., Sutar, S., Leonhardt, A., Marinov, D., Lin, D., Caymax, M., Asselberghs, I., Pourtois, G., Radu, I.P.

المصدر: 2018 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2018 IEEE International. :22.1.1-22.1.4 Dec, 2018

Relation: 2018 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Cantoro, M., Merckling, C., Jiang, S., Guo, W., Waldron, N., Bender, H., Moussa, A., Douhard, B., Vandervorst, W., Heyns, M. M., Dekoster, J., Loo, R., Caymax, M.

المصدر: 2012 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS) Compound Semiconductor Integrated Circuit Symposium (CSICS), 2012 IEEE. :1-4 Oct, 2012

Relation: 2012 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS)

المؤلفون: Schram, T., Smets, Q., Heyne, M.H., Graven, B., Kunnen, E., Thiam, A., Devriendt, K., Delabie, A., Lin, D., Chiappe, D., Asselberghs, I., Lux, M., Brus, S., Huyghebaert, C., Sayan, S., Juncker, A., Caymax, M., Radu, I.P.

المصدر: 2017 Silicon Nanoelectronics Workshop (SNW) Silicon Nanoelectronics Workshop (SNW), 2017. :139-140 Jun, 2017

Relation: 2017 Silicon Nanoelectronics Workshop (SNW)

المؤلفون: Dixit, A., Anil, K.G., Rooyackers, R., Kaiser, M., Weemaes, R., Ferain, I., De Keersgieter, A., Collaert, N., Surdeanu, R., Goodwin, M., Zimmerman, P., Loo, R., Caymax, M., Jurczak, M., Biesemans, S., De Meyer, K., Leys, F.

المصدر: Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. Solid-State Device Research Conference Solid-State Device Research Conference, 2005. ESSDERC 2005. Proceedings of 35th European. :445-448 2005

Relation: Proceedings of ESSDERC 2005. 31st European Solid-State Device Research Conference

المؤلفون: Verheyen, P., Eneman, G., Rooyackers, R., Loo, R., Eeckhout, L., Rondas, D., Leys, F., Snow, J., Shamiryan, D., Demand, M., Hoffman, Th.Y., Goodwin, M., Fujimoto, H., Ravit, C., Lee, B-C., Caymax, M., De Meyer, K., Absil, P., Jurczak, M., Biesemans, S.

المصدر: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :886-889 2005

Relation: International Electron Devices Meeting 2005

المؤلفون: De Jaeger, B., Houssa, M., Satta, A., Kubicek, S., Verheyen, P., Van Steenbergen, J., Croon, J., Kaczer, B., Van Elshocht, S., Delabie, A., Kunnen, E., Sleeckx, E., Teerlinck, I., Lindsay, R., Schram, T., Chiarella, T., Degraeve, R., Conard, T., Poortmans, J., Winderickx, G., Boullart, W., Schaekers, M., Mertens, P.W., Caymax, M., Vandervorst, W., Van Moorhem, E., Biesemans, S., De Meyer, K., Ragnarsson, L., Lee, S., Kota, G., Raskin, G., Mijlemans, P., Autran, J.-L., Afanas'ev, V., Stesmans, A., Meuris, M., Heyns, M.

المصدر: Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) Solid-state device research conference Solid-State Device Research Conference, 2004. ESSDERC 2004. Proceeding of the 34th European. :189-192 2004

Relation: Proceedings of the 34th European Solid-State Device Research Conference

المؤلفون: De Gendt, S., Chen, J., Carter, R., Cartier, E., Caymax, M., Claes, M., Conard, T., Delabie, A., Deweerd, W., Kaushik, V., Kerber, A., Kubicek, S., Maes, J.W., Niwa, M., Pantisano, L., Puurunen, R., Ragnarsson, L., Schram, T., Shimamoto, Y., Tsai, W., Rohr, E., Van Elshocht, S., Witters, T., Young, E., Zhao, C., Heyns, M.

المصدر: Extended Abstracts of International Workshop on Gate Insulator (IEEE Cat. No.03EX765) Gate insulator Gate Insulator, 2003. IWGI 2003. Extended Abstracts of International Workshop on. :10-14 2003

Relation: Extended Abstracts of International Workshop on Gate Insulator