المؤلفون: Corradini, Davide, Montolli, Zeno, Pasqua, Michele, Ceccato, Mariano

مصطلحات موضوعية: Computer Science - Software Engineering

URL الوصول: http://arxiv.org/abs/2408.08594

المؤلفون: Pasqua, Michele, Ceccato, Mariano, Tonella, Paolo

المصدر: 2024 IEEE/ACM 46th International Conference on Software Engineering (ICSE) ICSE Software Engineering (ICSE), 2024 IEEE/ACM 46th International Conference on. :1409-1420 Apr, 2024

Relation: 2024 IEEE/ACM 46th International Conference on Software Engineering (ICSE)

المؤلفون: Pavanello, Fabio, Marchand, Cedric, Jimenez, Paul, Letartre, Xavier, Chaves, Ricardo, Marastoni, Niccolo, Lovato, Alberto, Ceccato, Mariano, Papadimitriou, George, Karakostas, Vasileios, Gizopoulos, Dimitris, Bardini, Roberta, Carmona, Tzamn Melendez, Di Carlo, Stefano, Savino, Alessandro, Lerch, Laurence, Ruhrmair, Ulrich, Gutierrez, Sergio Vinagrero, Di Natale, Giorgio, Vatajelu, Elena Ioana

المصدر: 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2024. :1-6 Mar, 2024

Relation: 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE)

المؤلفون: Pavanello, Fabio, Marchand, Cedric, O'Connor, Ian, Orobtchouk, Regis, Mandorlo, Fabien, Letartre, Xavier, Cueff, Sebastien, Vatajelu, Elena Ioana, Di Natale, Giorgio, Cluzel, Benot, Coillet, Aurelien, Charbonnier, Benoit, Noe, Pierre, Kavan, Frantisek, Zoldak, Martin, Szaj, Michal, Bienstman, Peter, Van Vaerenbergh, Thomas, Ruhrmair, Ulrich, Flores, Paulo, e Silva, Luis Guerra, Chaves, Ricardo, Silveira, Luis-Miguel, Ceccato, Mariano, Gizopoulos, Dimitris, Papadimitriou, George, Karakostas, Vasileios, Brando, Axel, Cazorla, Francisco J., Canal, Ramon, Closas, Pau, Gusi-Amigo, Adria, Crovetti, Paolo, Carpegna, Alessio, Carmona, Tzamn Melendez, Di Carlo, Stefano, Savino, Alessandro

المصدر: 2023 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2023 IEEE. :1-6 May, 2023

Relation: 2023 IEEE European Test Symposium (ETS)

المؤلفون: Corradini, Davide, Pasqua, Michele, Ceccato, Mariano

المصدر: 2023 IEEE/ACM 45th International Conference on Software Engineering (ICSE) ICSE Software Engineering (ICSE), 2023 IEEE/ACM 45th International Conference on. :2553-2564 May, 2023

Relation: 2023 IEEE/ACM 45th International Conference on Software Engineering (ICSE)

المؤلفون: Pavanello, Fabio, Marchand, Cedric, Jimenez, Paul, Letartre, Xavier, Chaves, Ricardo, Marastoni, Niccolò, Lovato, Alberto, Ceccato, Mariano, Papadimitriou, George, Karakostas, Vasileios, Gizopoulos, Dimitris, Bardini, Roberta, Carmona, Tzamn Melendez, Di Carlo, Stefano, Savino, Alessandro, Lerch, Laurence, Ruhrmair, Ulrich, Gutierrez, Sergio Vinagrero, Di Natale, Giorgio, Vatajelu, Elena Ioana

المصدر: 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE)

مصطلحات موضوعية: Computer Science - Cryptography and Security, Electrical Engineering and Systems Science - Signal Processing, Physics - Optics

URL الوصول: http://arxiv.org/abs/2312.09383

المؤلفون: Gaiardelli, Sebastiano, Spellini, Stefano, Pasqua, Michele, Ceccato, Mariano, Fummi, Franco

المصدر: IECON 2022 – 48th Annual Conference of the IEEE Industrial Electronics Society Industrial Electronics Society, IECON 2022 – 48th Annual Conference of the IEEE. :1-6 Oct, 2022

Relation: IECON 2022 – 48th Annual Conference of the IEEE Industrial Electronics Society

المؤلفون: Corradini, Davide, Zampieri, Amedeo, Pasqua, Michele, Ceccato, Mariano

المصدر: 2022 IEEE International Conference on Software Maintenance and Evolution (ICSME) ICSME Software Maintenance and Evolution (ICSME), 2022 IEEE International Conference on. :504-508 Oct, 2022

Relation: 2022 IEEE International Conference on Software Maintenance and Evolution (ICSME)

المؤلفون: Romdhana, Andrea, Ceccato, Mariano, Merlo, Alessio, Tonella, Paolo

المصدر: 2022 IEEE Conference on Software Testing, Verification and Validation (ICST) ICST Software Testing, Verification and Validation (ICST), 2022 IEEE Conference on. :24-34 Apr, 2022

Relation: 2022 IEEE Conference on Software Testing, Verification and Validation (ICST)

المؤلفون: Corradini, Davide, Zampieri, Amedeo, Pasqua, Michele, Ceccato, Mariano

المصدر: 2021 IEEE 21st International Working Conference on Source Code Analysis and Manipulation (SCAM) SCAM Source Code Analysis and Manipulation (SCAM), 2021 IEEE 21st International Working Conference on. :226-236 Sep, 2021

Relation: 2021 IEEE 21st International Working Conference on Source Code Analysis and Manipulation (SCAM)