المؤلفون: Kwang Hee Lee, Suk-Jin Chung, Jin Yong Kim, Ki-Chul Kim, Jae-Soon Lim, Kyuho Cho, Jinil Lee, Jeong-Hee Chung, HanJin Lim, KyungIn Choi, Sungho Han, SooIk Jang, Byeong-Yun Nam, Cha-Young Yoo, Sung-Tae Kim, U-In Chung, Joo-Tae Moon, Byung-Il Ryu

المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :841-844 2004

Relation: 2004 International Electron Devices Meeting

المؤلفون: U-In Chung, Cha-Young Yoo, Soo-Jin Hong

المصدر: 2003 International Symposium on VLSI Technology, Systems and Applications. Proceedings of Technical Papers. (IEEE Cat. No.03TH8672) VLSI technology, systems and applications VLSI Technology, Systems, and Applications, 2003 International Symposium on. :17-20 2003

Relation: 2003 International Symposium on VLSI Technology, Systems and Applications. Proceedings of Technical Papers

المؤلفون: Seok-Jun Won, Wan-Don Kim, Cha-Young Yoo, Sung-Tae Kim, Young-Wook Park, Joo-Tae Moon, Moon-Yong Lee

المصدر: International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) Electron devices meeting Electron Devices Meeting, 2000. IEDM '00. Technical Digest. International. :789-792 2000

Relation: International Electron Devices Meeting. Technical Digest. IEDM

المؤلفون: Jin-Won Kim, Sang-Don Nam, Seung-Hwan Lee, Seok-Jun Won, Wan-Don Kim, Cha-Young Yoo, Young-Wook Park, Sang-In Lee, Moon-Yong Lee

المصدر: International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) Electron devices Electron Devices Meeting, 1999. IEDM '99. Technical Digest. International. :793-796 1999

Relation: International Electron Devices Meeting 1999. Technical Digest

المؤلفون: Byoung Taek Lee, Cha Young Yoo, Han Jin Lim, Chang Seok Kang, Hong Bae Park, Wan Don Kim, Suk Ho Ju, Horii, H., Ki Hoon Lee, Hyun Woo Kim, Sang In Lee, Moon Young Lee

المصدر: International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217) Electron devices - IEDM 1998 Electron Devices Meeting, 1998. IEDM '98. Technical Digest., International. :815-818 1998

Relation: International Electron Devices Meeting 1998. Technical Digest

المؤلفون: In Seon park, Yeong Kwan Kim, Sang Min Lee, Ju Hyuck Chung, Sang Bom Kang, Chang Soo Park, Cha Young Yoo, Sang In Lee, Moon Yong Lee

المصدر: International Electron Devices Meeting. IEDM Technical Digest Electron Devices Electron Devices Meeting, 1997. IEDM '97. Technical Digest., International. :617-620 1997

Relation: International Electron Devices Meeting. IEDM Technical Digest

المؤلفون: Se-Hoon Oh, Jeong-Hee Chung, Jae-Hyoung Choi, Cha-Young Yoo, Young Sun Kim, Sung Tae Kim, U-In Chung, Joo Tae Moon

المصدر: 2003 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.03CH37407) VLSI technology VLSI Technology, 2003. Digest of Technical Papers. 2003 Symposium on. :73-74 2003

Relation: 2003 Symposium on VLSI Technology. Digest of Technical Papers

المؤلفون: Wan Don Kim, Jin Won Kim, Seok Jun Won, Sang Don Nam, Byeong Yun Nam, Cha Young Yoo, Young Wook Park, Sang In Lee, Moon Yong Lee

المصدر: 2000 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.00CH37104) VLSI technology VLSI Technology, 2000. Digest of Technical Papers. 2000 Symposium on. :100-101 2000

Relation: 2000 Symposium on VLSI Technology. Digest of Technical Papers

المؤلفون: Horii, H., Byoung Taek Lee, Han Jin Lim, Suk Ho Joo, Chang Seok Kang, Cha Young Yoo, Hong Bae Park, Wan Don Kim, Sang In Lee, Moon Yong Lee

المصدر: 1999 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.99CH36325) VLSI technology VLSI Technology, 1999. Digest of Technical Papers. 1999 Symposium on. :103-104 1999

Relation: 1999 Symposium on VLSI Technology. Digest of Technical Papers

المؤلفون: Jae Hyoung Choi, Jeong-Hee Chung, Se-Hoon Oh, Jeong Sik Choi, Cha-Young Yoo, Sung-Tae Kim, U-In Chung, Joo-Tae Moon

المصدر: IEEE International Electron Devices Meeting 2003 Electron devices IEDM'03 Electron Devices Meeting, 2003. IEDM '03 Technical Digest. IEEE International. :28.3.1-28.3.4 2003

Relation: IEEE International Electron Devices Meeting 2003