المؤلفون: Tekin, S.B., Das, P., Weerakkody, A.D., Sedghi, N., Hall, S., Mitrovic, I.Z., Chalker, P.R., Werner, M., Wrench, J.S.

المصدر: 2020 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) Ultimate Integration on Silicon (EUROSOI-ULIS), 2020 Joint International EUROSOI Workshop and International Conference on. :1-4 Sep, 2020

Relation: 2020 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)

المؤلفون: Jin, J., Wrench, J.S., Gibbon, J.T., Hesp, D., Shaw, A., Mitrovic, I.Z., Sedghi, N., Phillips, L.J., Zou, J., Dhanak, V.R., Chalker, P.R., Hall, S.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 64(3):1225-1230 Mar, 2017

المؤلفون: Nemr Noureddine, I., Sedghi, N., Wrench, J.S., Mitrovic, I.Z., Chalker, P.R., Hall, S.

المصدر: In Solid State Electronics August 2022 194

المؤلفون: Tekin, S.B., Weerakkody, A.D., Sedghi, N., Hall, S., Werner, M., Wrench, J.S., Chalker, P.R., Mitrovic, I.Z.

المصدر: In Solid State Electronics November 2021 185

المؤلفون: Garmendia, X., Chalker, S., Bilton, M., Sutcliffe, C.J., Chalker, P.R.

المصدر: In Materialia March 2020 9

المؤلفون: Mu, Y., Fang, Y., Zhao, C.Z., Zhao, C., Lu, Q., Qi, Y., Yi, R., Yang, L., Mitrovic, I.Z., Taylor, S., Chalker, P.R.

المصدر: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 64(12):2913-2921 Dec, 2017

المؤلفون: Lu, Q., Qi, Y., Zhao, C.Z., Liu, C., Zhao, C., Taylor, S., Chalker, P.R.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 17(3):526-530 Sep, 2017

المؤلفون: Roberts, J.W., Chalker, P.R., Ding, B., Oliver, R.A., Gibbon, J.T., Jones, L.A.H., Dhanak, V.R., Phillips, L.J., Major, J.D., Massabuau, F.C.-P.

المصدر: In Journal of Crystal Growth 15 December 2019 528

المؤلفون: Mu, Y., Zhao, C.Z., Lu, Q., Zhao, C., Qi, Y., Lam, S., Mitrovic, I.Z., Taylor, S., Chalker, P.R.

المصدر: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 64(1):673-682 Jan, 2017

المؤلفون: Zhao, C.Z., Werner, M., Taylor, S., Chalker, P.R., Potter, R.J., Gaskell, J.

المصدر: 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits, 2009. IPFA 2009. 16th IEEE International Symposium on the. :628-630 Jul, 2009

Relation: 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)