المؤلفون: Prak Chang, K.P., Zakaria, A., Abdul Nasir, A.S., Yusuf, N., Thriumani, R., Shakaff, A.Y.M., Adom, A.H.

المصدر: 2014 IEEE International Conference on Control System, Computing and Engineering (ICCSCE 2014) Control System, Computing and Engineering (ICCSCE), 2014 IEEE International Conference on. :58-63 Nov, 2014

Relation: 2014 IEEE International Conference on Control System, Computing and Engineering (ICCSCE)

المؤلفون: Lin, M.H., Lin, Y.L., Yang, G.S., Yeh, M.-S., Chang, K.P., Su, K.C., Tahui Wang

المصدر: Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) Physical and failure analysis of integrated circuits Physical and Failure Analysis of Integrated Circuits, 2004. IPFA 2004. Proceedings of the 11th International Symposium on the. :177-180 2004

Relation: Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004

المؤلفون: Lin, M.H., Lin, Y.L., Chen, J.M., Tsai, C.C., Yeh, M.-S., Liu, C.C., Hsu, S., Wang, C.H., Sheng, Y.C., Chang, K.P., Su, K.C., Chang, Y.J., Tahui Wang

المصدر: 2004 IEEE International Reliability Physics Symposium. Proceedings Reliability physics Reliability Physics Symposium Proceedings, 2004. 42nd Annual. 2004 IEEE International. :229-233 2004

Relation: 2004 IEEE International Reliability Physics Symposium. Proceedings

المؤلفون: Lin, M.H., Yang, G.S., Lin, Y.L., Lin, M.T., Lin, C.C., Yeh, M.S., Chang, K.P., Su, K.C., Chen, J.K., Chang, Y.J., Tahui Wang

المصدر: IEEE International Integrated Reliability Workshop Final Report, 2002. Integrated reliability Integrated Reliability Workshop Final Report, 2002. IEEE International. :50-54 2002

Relation: IEEE International Integrated Reliability Workshop

المؤلفون: Chang, M.N., Chang, K.P., Sue, K.C.

المصدر: IEEE International Integrated Reliability Workshop Final Report, 2002. Integrated reliability Integrated Reliability Workshop Final Report, 2002. IEEE International. :192-195 2002

Relation: IEEE International Integrated Reliability Workshop

المؤلفون: Lin, M.H., Lin, Y.L., Chen, J.M., Yeh, M.-S., Chang, K.P., Su, K.C., Tahui Wang

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 52(12):2602-2608 Dec, 2005

المؤلفون: Lin, M.H., Chang, K.P., Su, K.C., Wang, T.

المصدر: 2006 IEEE International Reliability Physics Symposium Proceedings Reliability Physics Symposium Proceedings, 2006. 44th Annual., IEEE International. :671-672 Mar, 2006

Relation: 2006 IEEE International Reliability Physics Symposium Proceedings

المؤلفون: Dell’Orco, G., Curd, W., Berry, J., Chang, K.P., Ferrada, J., Gopalapillai, B., Gupta, D., Kim, S., Kuehn, I., Kumar, A., Li, F., Petrov, A., Reiersen, W.

المصدر: In Fusion Engineering and Design 2011 86(1):15-19

المؤلفون: Giancarli, L., Bede, O., Beloglazov, S., Benchikhoune, M., Chang, K.P., Chuyanov, V., Dell’Orco, G., Friconneau, J.P., Gicquel, S., Gliss, C., Hansalia, C., Iseli, M., Kim, C.S., Kuehn, I., Levesy, B., Maluta, F.T., Merola, M., Pascal, R., Patisson, L., Rigoni, G., Snipes, J., Tesini, A., Yonekawa, I.

المصدر: In Fusion Engineering and Design 2010 85(10):1829-1833

المؤلفون: Lin, M.H., Lin, Y.L., Chang, K.P., Su, K.C., Wang, Tahui

المصدر: In Microelectronics Reliability 2005 45(7):1061-1078