المؤلفون: Chang, Ruey-Dar, Liao, Hsueh-Chun, Lin, Jui-Chang, Tsai, Jung-Ruey

المصدر: 2018 22nd International Conference on Ion Implantation Technology (IIT) Ion Implantation Technology (IIT), 2018 22nd International Conference on. :86-89 Sep, 2018

Relation: 2018 22nd International Conference on Ion Implantation Technology (IIT)

المؤلفون: Chang, Ruey-Dar, Lin, Po-Heng

المصدر: 2016 21st International Conference on Ion Implantation Technology (IIT) Ion Implantation Technology (IIT), 2016 21st International Conference on. :1-4 Sep, 2016

Relation: 2016 21st International Conference on Ion Implantation Technology (IIT)

المؤلفون: Lee, Bo-Wen, Lin, Jui-Chang, Chang, Ruey-Dar, Chu, Che-Men, Woon, Wei-Yen

المصدر: In Materials Science in Semiconductor Processing April 2023 157

المؤلفون: Tsai, Jung-Ruey, Chang, Ruey-Dar, Chou, Cheng-Hui, Liao, Hsueh-Chun, Huang, Sz-Kai, Lin, Sung-Hung, Lin, Jui-Chang

المصدر: 2016 International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2016 International Conference on. :168-171 Mar, 2016

Relation: 2016 International Conference on Microelectronic Test Structures (ICMTS)

المؤلفون: Tsai, Jung-Ruey, Wen, Ting-Ting, Yang, Shao-Ming, Sheu, Gene, Chang, Ruey-Dar, Syu, Yi-Jhen, Liu, Chin-Ping, Chang, Hsiu-Fu, Wei, Zhao-Hui

المصدر: 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits (IPFA), 2015 IEEE 22nd International Symposium on the. :318-321 Jun, 2015

Relation: 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Tsai, Jung-Ruey, Chang, Yi-Sheng, Lin, Jui-Chang, Bai, Shu-Ming, Sheu, Gene, Yang, Shao-Ming, Wu, Chun-Hsien, Liao, Hsueh-Chun, Chang, Ruey-Dar

المصدر: 2014 International Symposium on Next-Generation Electronics (ISNE) Next-Generation Electronics (ISNE), 2014 International Symposium on. :1-4 May, 2014

Relation: 2014 International Symposium on Next-Generation Electronics (ISNE)

المؤلفون: Lin, Jui-Chang, Lee, Bo-Wen, Chang, Ruey-Dar, Chu, Che-Men, Woon, Wei-Yen

المصدر: In Nuclear Inst. and Methods in Physics Research, B 15 October 2021 505:58-63

المؤلفون: Liao, Hsueh-Chun, Wu, Yeh-Wei, Chang, Ruey-Dar, Tsai, Jung-Ruey

المصدر: 2013 International Symposium on Next-Generation Electronics Next-Generation Electronics (ISNE), 2013 IEEE International Symposium on. :62-64 Feb, 2013

Relation: 2013 International Symposium on Next-Generation Electronics (ISNE)

المؤلفون: Yang, Chen-Chen, Chen, Yung-Chen, Lin, Horng-Chih, Chang, Ruey-Dar, Li, Pei-Wen, Huang, Tiao-Yuan

المصدر: 2016 IEEE Silicon Nanoelectronics Workshop (SNW) Silicon Nanoelectronics Workshop (SNW), 2016 IEEE. :64-65 Jun, 2016

Relation: 2016 IEEE Silicon Nanoelectronics Workshop (SNW)

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