المؤلفون: Ku, T. T., Lin, C. H., Chen, C. S., Hsu, C. T., Li, C.S., Chang, Y.J.

المصدر: 2019 IEEE/IAS 55th Industrial and Commercial Power Systems Technical Conference (I&CPS) Industrial and Commercial Power Systems Technical Conference (I&CPS), 2019 IEEE/IAS 55th. :1-9 May, 2019

Relation: 2019 IEEE/IAS 55th Industrial and Commercial Power Systems Technical Conference (I&CPS)

المؤلفون: Wang, C.S., Chang, W.C., Ke, W.S., Lee, C.F., Su, K.C., Chang, Y.J., Chou, E.N., Chen, M.J.

المصدر: Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) Physical and failure analysis of integrated circuits Physical and Failure Analysis of Integrated Circuits, 2004. IPFA 2004. Proceedings of the 11th International Symposium on the. :315-318 2004

Relation: Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004

المؤلفون: Lin, M.H., Lin, Y.L., Chen, J.M., Tsai, C.C., Yeh, M.-S., Liu, C.C., Hsu, S., Wang, C.H., Sheng, Y.C., Chang, K.P., Su, K.C., Chang, Y.J., Tahui Wang

المصدر: 2004 IEEE International Reliability Physics Symposium. Proceedings Reliability physics Reliability Physics Symposium Proceedings, 2004. 42nd Annual. 2004 IEEE International. :229-233 2004

Relation: 2004 IEEE International Reliability Physics Symposium. Proceedings

المؤلفون: Chang, Y.J., Chen, Y.M., Lee, C.A., Wang, Y.H., Chen, Y.C., Wang, C.H.

المصدر: Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat. No.04CH37545) Semiconductor thermal measurement and management Semiconductor Thermal Measurement and Management Symposium, 2004. Twentieth Annual IEEE. :198-204 2004

Relation: Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium

المؤلفون: Liu, C.H., Hsiu-Shan Lin, Yu-Yin Lin, Chen, M.G., Pan, T.M., Kao, C.J., Huang, K.T., Lin, S.H., Sheng, Y.C., Wen-Tung Chang, Lee, J.H., Huang, M., Chiung-Sheng Hsiung, Huang-Lu, S., Chen-Chung Hsu, Liang, A.Y., Jenkon Chen, Hsieh, W.Y., Yen, P.W., Chien, S.C., Loh, Y.T., Chang, Y.J., Fu-Tai Liou

المصدر: 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) Reliability physics symposium Reliability Physics Symposium Proceedings, 2002. 40th Annual. :268-271 2002

Relation: 2002 IEEE International Reliability Physics Symposium Proceedings. 40th Annual

المؤلفون: Lin, M.H., Yang, G.S., Lin, Y.L., Lin, M.T., Lin, C.C., Yeh, M.S., Chang, K.P., Su, K.C., Chen, J.K., Chang, Y.J., Tahui Wang

المصدر: IEEE International Integrated Reliability Workshop Final Report, 2002. Integrated reliability Integrated Reliability Workshop Final Report, 2002. IEEE International. :50-54 2002

Relation: IEEE International Integrated Reliability Workshop

المؤلفون: Chen, Y.F., Lin, M.H., Chou, C.H., Chang, W.C., Huang, S.C., Chang, Y.J., Fu, K.Y., Lee, M.T., Liu, C.H., Fan, S.K.

المصدر: 2000 IEEE International Integrated Reliability Workshop Final Report (Cat. No.00TH8515) Integrated reliability workshop Integrated Reliability Workshop Final Report, 2000 IEEE International. :98-101 2000

Relation: 2000 IEEE International Integrated Reliability Workshop Final Report

المؤلفون: Lee, M.T., Liu, C.H., Chung-Chiang Lin, Jin-Tau Chou, Tang, H.T.H., Chang, Y.J., Fu, K.Y.

المصدر: Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) Electrical overstress/electrostatic discharge symposium Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000. :105-110 2000

Relation: Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000

المؤلفون: Liu, C.H., Chen, M.G., Shiang Huang-Lu, Chang, Y.J., Fu, K.Y.

المصدر: 1999 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Technical Papers. (Cat. No.99TH8453) VLSI technology, systems, and applications VLSI Technology, Systems, and Applications, 1999. International Symposium on. :82-85 1999

Relation: Proceedings of International Symposium on VLSI Technology Systems and Applications

المؤلفون: Chang, Y.J., Peng, J.C., Lin, S.C., Lai, F.C.

المصدر: In Journal of Electrostatics May 2020 105