المؤلفون: Chao, C.Y., Wu, M., Yeh, S., Chang, C., Lee, C., Yin, C., Chou, K., Tu, H.

المصدر: IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 9:972-984 2021

المؤلفون: Chao , C.Y., Wu , T.M., Yeh , S., Chou , K., Tu , H., Lee , C., Yin , C., Paillet , P., Goiffon , V.

المصدر: IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 7:227-238 2019

المؤلفون: Yeh, S., Chou, K., Tu, H., Chao, C.Y., Hsueh, F.

المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 53(2):527-537 Feb, 2018

المؤلفون: Jommi, C., Chao, C.Y., Muraro, S., Zhao, H.F.

المصدر: In Geomechanics for Energy and the Environment September 2021 27

المؤلفون: Liu, C.W., Lee, M.H., Chao, C.Y., Chen, C.Y., Yang, C.C., Chang, Y.

المصدر: 1998 Semiconductor Manufacturing Technology Workshop (Cat. No.98EX133) Semiconductor manufacturing technology Semiconductor Manufacturing Technology Workshop, 1998. :61-70 1998

Relation: 1998 Semiconductor Manufacturing Technology Workshop

المؤلفون: Chao, C.Y., Tu, H., Wu, T., Chou, K., Yeh, S., Hsueh, F.

المصدر: IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 5(1):79-89 Jan, 2017

المؤلفون: Ma, H.K., Chen, B. R., Lan, H.W., Lin, K.T., Chao, C.Y.

المصدر: 2009 25th Annual IEEE Semiconductor Thermal Measurement and Management Symposium Semiconductor Thermal Measurement and Management Symposium, 2009. SEMI-THERM 2009. 25th Annual IEEE. :267-272 Mar, 2009

Relation: 2009 IEEE/CPMT 25th Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM)

المؤلفون: Ilyas, M., Syed, M., Chao, C.Y.

المصدر: IEEE Proceedings on Southeastcon Southeastcon '90. Proceedings., IEEE. :404-407 vol.2 1990

Relation: IEEE Proceedings on Southeastcon

المؤلفون: Chao, C.Y., Chen, Y., Chou, K., Sze, J., Hsueh, F., Wuu, S.

المصدر: IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 2(4):59-64 Jul, 2014

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