يعرض 1 - 10 نتائج من 56 نتيجة بحث عن '"Characterization methodology"', وقت الاستعلام: 1.10s تنقيح النتائج
  1. 1
    مؤتمر

    المصدر: 2022 IEEE 31st Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS) Electrical Performance of Electronic Packaging and Systems (EPEPS), 2022 IEEE 31st Conference on. :1-3 Oct, 2022

    Relation: 2022 IEEE 31st Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)

  2. 2
    مؤتمر

    المصدر: 2018 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) ISVLSI VLSI (ISVLSI), 2018 IEEE Computer Society Annual Symposium on. :417-422 Jul, 2018

    Relation: 2018 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)

  3. 3
    مؤتمر

    المؤلفون: Meier, K., Bock, K., Roellig, M.

    المصدر: 2018 IEEE 68th Electronic Components and Technology Conference (ECTC) ECTC Electronic Components and Technology Conference (ECTC), 2018 IEEE 68th. :1050-1053 May, 2018

    Relation: 2018 IEEE 68th Electronic Components and Technology Conference (ECTC)

  4. 4
    مؤتمر

    المصدر: 2018 17th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2018 17th IEEE Intersociety Conference on. :354-359 May, 2018

    Relation: 2018 17th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm)

  5. 5
    دورية أكاديمية

    لا يتم عرض هذه النتيجة على الضيوف.

  6. 6
    مؤتمر

    المصدر: 2011 12th International Symposium on Quality Electronic Design Quality Electronic Design (ISQED), 2011 12th International Symposium on. :1-6 Mar, 2011

    Relation: 2011 International Symposium on Quality Electronic Design (ISQED)

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  9. 9
    كتاب إلكتروني

    المؤلفون: García, HernánAff28, Salazar, AugustoAff28, Aff29, Alvarez, DamiánAff28, Orozco, ÁlvaroAff28

    المساهمون: Hutchison, David, Series editorAff1, Kanade, Takeo, Series editorAff2, Kittler, Josef, Series editorAff3, Kleinberg, Jon M., Series editorAff4, Mattern, Friedemann, Series editorAff5, Mitchell, John C., Series editorAff6, Naor, Moni, Series editorAff7, Nierstrasz, Oscar, Series editorAff8, Pandu Rangan, C., Series editorAff9, Steffen, Bernhard, Series editorAff10, Sudan, Madhu, Series editorAff11, Terzopoulos, Demetri, Series editorAff12, Tygar, Doug, Series editorAff13, Vardi, Moshe Y., Series editorAff14, Weikum, Gerhard, Series editorAff15, Bebis, George, editorAff16, Boyle, Richard, editorAff17, Parvin, Bahram, editorAff18, Koracin, Darko, editorAff19, Chung, Ronald, editorAff20, Hammound, Riad, editorAff21, Hussain, Muhammad, editorAff22, Kar-Han, Tan, editorAff23, Crawfis, Roger, editorAff24, Thalmann, Daniel, editorAff25, Kao, David, editorAff26, Avila, Lisa, editorAff27

    المصدر: Advances in Visual Computing : 6th International Symposium, ISVC 2010, Las Vegas, NV, USA, November 29 - December 1, 2010, Proceedings, Part III. 6455:171-180

  10. 10
    دورية أكاديمية

    لا يتم عرض هذه النتيجة على الضيوف.