المؤلفون: Li, Hui, Ieong, Meng U., Wong, Koon Lin Linnie^{Aff3, IDs10734024012359_cor3}, Zhu, Jinxin, Chen, Chi-Chen

المصدر: Higher Education: The International Journal of Higher Education Research. :1-17

المؤلفون: Chen, Chi-Chen^{Aff1, IDs40536024002098_cor1}, Tang, Chia-Wei^{Aff2, IDs40536024002098_cor2}, Jin, Kuan-Yu^{Aff3, IDs40536024002098_cor3}

المصدر: Large-scale Assessments in Education: An IEA-ETS Research Institute Journal. 12(1)

المؤلفون: Li, Hui, Ieong, Meng U., Wong, Koon Lin Linnie^{Aff3, IDs10734024012519_cor3}, Zhu, Jinxin, Chen, Chi‑Chen

المصدر: Higher Education: The International Journal of Higher Education Research. :1-2

المؤلفون: Cheng, Shou-Hsia^{Aff1, Aff2, IDs1291302309457w_cor1}, Chen, Chi-Chen, Lin, Yueh-Yun

المصدر: BMC Health Services Research. 23(1)

المؤلفون: Chen, Chi-Chen, Cheng, Shou-Hsia

المصدر: In Health policy April 2023 130

المؤلفون: Jack, Brady M. (ORCID 0000-0001-7288-3963), Chen, Chi-Chen, Smith, Thomas J.

المصدر: Journal of Psychoeducational Assessment. Jun 2021 39(3):301-314.

Peer Reviewed: Y

Page Count: 14

Descriptors: Ethics, Educational Philosophy, Error of Measurement, Interpersonal Communication, Gender Differences, High School Students, Foreign Countries, Student Interests, Construct Validity, Factor Analysis, Student Attitudes, Grade 10, Student Surveys, Social Sciences

مصطلحات جغرافية: Taiwan

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المؤلفون: Chen, Fu-Li, Chen, Peter Y., Chen, Chi-Chen, Tung, Tao-Hsin

المصدر: In Safety and Health at Work December 2022 13(4):394-400

المؤلفون: Chen, Chi-Chen, Lin, Yo-Sheng, Lee, Jen-How, Chang, Jin-Fa

المصدر: Proceedings of 2011 International Symposium on VLSI Design, Automation and Test VLSI Design, Automation and Test (VLSI-DAT), 2011 International Symposium on. :1-4 Apr, 2011

Relation: 2011 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)

المؤلفون: Chen, Chi-Chen, Lin, Yo-Sheng, Huang, Pen-Li, Chang, Jin-Fa, Lu, Shey-Shi

المصدر: 2010 IEEE MTT-S International Microwave Symposium Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International. :489-492 May, 2010

Relation: 2010 IEEE/MTT-S International Microwave Symposium - MTT 2010