المؤلفون: Goel, Sandeep Kumar, Adham, Saman, Wang, Min-Jer, Chen, Ji-Jan, Huang, Tze-Chiang, Mehta, Ashok, Lee, Frank, Chickermane, Vivek, Keller, Brion, Valind, Thomas, Mukherjee, Subhasish, Sood, Navdeep, Cho, Jeongho, Lee, Hayden Hyungdong, Choi, Jungi, Kim, Sangdoo

المصدر: 2013 IEEE International Test Conference (ITC) Test Conference (ITC), 2013 IEEE International. :1-10 Sep, 2013

Relation: 2013 IEEE International Test Conference (ITC)

المؤلفون: Ye, Jing, Huang, Yu, Hu, Yu, Cheng, Wu-Tung, Guo, Ruifeng, Lai, Liyang, Tai, Ting-Pu, Li, Xiaowei, Changchien, Weipin, Lee, Daw-Ming, Chen, Ji-Jan, Eruvathi, Sandeep C., Kumara, Kartik K., Liu, Charles, Pan, Sam

المصدر: 2013 IEEE International Test Conference (ITC) Test Conference (ITC), 2013 IEEE International. :1-10 Sep, 2013

Relation: 2013 IEEE International Test Conference (ITC)

المؤلفون: Chuang, Yi-Lin, Yuan, Chung-Sheng, Chen, Ji-Jan, Chen, Ching-Fang, Yang, Ching-Shun, Changchien, Wei-Pin, Liu, Charles C. C., Lee, Frank

المصدر: 2013 IEEE 63rd Electronic Components and Technology Conference Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd. :852-859 May, 2013

Relation: 2013 IEEE 63rd Electronic Components and Technology Conference (ECTC)

المؤلفون: Deutsch, Sergej, Keller, Brion, Chickermane, Vivek, Mukherjee, Subhasish, Sood, Navdeep, Goel, Sandeep Kumar, Chen, Ji-Jan, Mehta, Ashok, Lee, Frank, Marinissen, Erik Jan

المصدر: 2012 IEEE International Test Conference Test Conference (ITC), 2012 IEEE International. :1-10 Nov, 2012

Relation: 2012 IEEE International Test Conference (ITC)

المؤلفون: Huang, Yu-Jen, Li, Jin-Fu, Chen, Ji-Jan, Kwai, Ding-Ming, Chou, Yung-Fa, Wu, Cheng-Wen

المصدر: 29th VLSI Test Symposium VLSI Test Symposium (VTS), 2011 IEEE 29th. :20-25 May, 2011

Relation: 2011 IEEE VLSI Test Symposium (VTS)

المؤلفون: Tseng, Chun-Kai, Huang, Shi-Yu, Weng, Chia-Chien, Fang, Shan-Chien, Chen, Ji-Jan

المصدر: 2011 Design, Automation & Test in Europe Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011. :1-6 Mar, 2011

Relation: 2011 Design, Automation & Test in Europe Conference & Exhibition (DATE 2011)

المؤلفون: Chou, Che-Wei, Li, Jin-Fu, Chen, Ji-Jan, Kwai, Ding-Ming, Chou, Yung-Fa, Wu, Cheng-Wen

المصدر: 2010 19th IEEE Asian Test Symposium Test Symposium (ATS), 2010 19th IEEE Asian. :377-382 Dec, 2010

Relation: 2010 19th Asian Test Symposium (ATS)

المؤلفون: Lee, Yu, Yang, Ching-Yuan, Cheng, Nai-Chen Daniel, Chen, Ji-Jan

المصدر: 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010. :1637-1640 Mar, 2010

Relation: 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)

المؤلفون: Hsu, Chen-Wei, Liao, Jia-Lu, Yeh, Jen-Chieh, Chen, Ji-Jan, Huang, Shi-Yu, Liou, Jing-Jia

المصدر: 2009 1st Asia Symposium on Quality Electronic Design Quality Electronic Design, 2009. ASQED 2009. 1st Asia Symposium on. :319-324 Jul, 2009

Relation: 2009 1st Asia Symposium on Quality Electronic Design (ASQED 2009)

المؤلفون: Cheng, Nai-Chen Daniel, Lee, Yu, Chen, Ji-Jan

المصدر: 2008 17th Asian Test Symposium Asian Test Symposium, 2008. ATS '08. 17th. :268-268 Nov, 2008

Relation: 2008 17th Asian Test Symposium (ATS)