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1دورية أكاديمية
المؤلفون: Chen, P.S., Liu, J.Y.
المصدر: In New Astronomy January 2024 105
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2دورية أكاديمية
المؤلفون: Liao, Y.C., Chen, P.S., Tsai, P.H., Jang, J.S.C., Hsieh, K.C., Chen, C.Y., Huang, J.C., Wu, H.J., Tsao, I.Y.
المصدر: In Results in Materials December 2022 16
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3دورية أكاديمية
المؤلفون: Liao, Y.C., Chen, P.S., Tsai, P.H., Jang, J.S.C., Hsieh, K.C., Chang, H.W., Chen, C.Y., Huang, J.C., Wu, H.J., Lo, Y.C., Huang, C.W., Tsao, I.Y.
المصدر: In Intermetallics April 2022 143
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4دورية أكاديمية
المؤلفون: Chen, P.S., Liu, J.Y., Shan, H.G.
المصدر: In New Astronomy November 2021 89
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5دورية أكاديمية
المؤلفون: Liao, Y.C., Ye, W.T., Chen, P.S., Tsai, P.H., Jang, J.S.C., Hsieh, K.C., Chen, C.Y., Huang, J.C., Wu, H.J., Lo, Y.C., Huang, C.W., Tsao, I.Y.
المصدر: In Intermetallics August 2021 135
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6مؤتمر
المؤلفون: Wei-Ming Liao, Wei-Ting Lai, Pei-Wen Li, Ming-Ting Kuo, Chen, P.S., Tsai, M.-J.
المصدر: 5th IEEE Conference on Nanotechnology, 2005. Nanotechnology Nanotechnology, 2005. 5th IEEE Conference on. :549-552 vol. 2 2005
Relation: 2005 5th IEEE International Conference on Nanotechnology
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7مؤتمر
المؤلفون: Chen, P.S., Tsai, L.M.F., Ying-Chieh Chen, Yee, G.
المصدر: First International Workshop on Systematic Approaches to Digital Forensic Engineering (SADFE'05) Digital Forensic Engineering Systematic Approaches to Digital Forensic Engineering, 2005. First International Workshop on. :40-47 2005
Relation: First International Workshop on Systematic Approaches to Digital Forensic Engineering
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8مؤتمر
المؤلفون: Tzeng, P.J., Maikap, S., Lai, W.Z., Liang, C.S., Chen, P.S., Lee, L.S., Liu, C.W.
المصدر: Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) Physical and failure analysis of integrated circuits Physical and Failure Analysis of Integrated Circuits, 2004. IPFA 2004. Proceedings of the 11th International Symposium on the. :29-32 2004
Relation: Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004
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9مؤتمر
المؤلفون: Chen, P.S., Lee, S.W., Lee, M.H., Liu, C.W., Tsai, M.-J.
المصدر: 2004 Semiconductor Manufacturing Technology Workshop Proceedings (IEEE Cat. No.04EX846) Semiconductor manufacturing technology Semiconductor Manufacturing Technology Workshop Proceedings, 2004. :79-82 2004
Relation: 2004 Semiconductor Manufacturing Technology Workshop Proceedings
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10مؤتمر
المؤلفون: Lai, L.S., Liang, C.S., Chen, P.S., Hsu, Y.M., Liu, Y.H., Tseng, Y.T., Lu, S.C., Tsai , M.-J., Liu, C.W., Rosenblad, C., Buschbaum, T., Buschbeck, M., Ramm, J.
المصدر: 2003 International Symposium on VLSI Technology, Systems and Applications. Proceedings of Technical Papers. (IEEE Cat. No.03TH8672) VLSI technology, systems and applications VLSI Technology, Systems, and Applications, 2003 International Symposium on. :113-116 2003
Relation: 2003 International Symposium on VLSI Technology, Systems and Applications. Proceedings of Technical Papers