المؤلفون: Chen, P.S., Liu, J.Y.

المصدر: In New Astronomy January 2024 105

المؤلفون: Liao, Y.C., Chen, P.S., Tsai, P.H., Jang, J.S.C., Hsieh, K.C., Chen, C.Y., Huang, J.C., Wu, H.J., Tsao, I.Y.

المصدر: In Results in Materials December 2022 16

المؤلفون: Liao, Y.C., Chen, P.S., Tsai, P.H., Jang, J.S.C., Hsieh, K.C., Chang, H.W., Chen, C.Y., Huang, J.C., Wu, H.J., Lo, Y.C., Huang, C.W., Tsao, I.Y.

المصدر: In Intermetallics April 2022 143

المؤلفون: Chen, P.S., Liu, J.Y., Shan, H.G.

المصدر: In New Astronomy November 2021 89

المؤلفون: Liao, Y.C., Ye, W.T., Chen, P.S., Tsai, P.H., Jang, J.S.C., Hsieh, K.C., Chen, C.Y., Huang, J.C., Wu, H.J., Lo, Y.C., Huang, C.W., Tsao, I.Y.

المصدر: In Intermetallics August 2021 135

المؤلفون: Wei-Ming Liao, Wei-Ting Lai, Pei-Wen Li, Ming-Ting Kuo, Chen, P.S., Tsai, M.-J.

المصدر: 5th IEEE Conference on Nanotechnology, 2005. Nanotechnology Nanotechnology, 2005. 5th IEEE Conference on. :549-552 vol. 2 2005

Relation: 2005 5th IEEE International Conference on Nanotechnology

المؤلفون: Chen, P.S., Tsai, L.M.F., Ying-Chieh Chen, Yee, G.

المصدر: First International Workshop on Systematic Approaches to Digital Forensic Engineering (SADFE'05) Digital Forensic Engineering Systematic Approaches to Digital Forensic Engineering, 2005. First International Workshop on. :40-47 2005

Relation: First International Workshop on Systematic Approaches to Digital Forensic Engineering

المؤلفون: Tzeng, P.J., Maikap, S., Lai, W.Z., Liang, C.S., Chen, P.S., Lee, L.S., Liu, C.W.

المصدر: Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) Physical and failure analysis of integrated circuits Physical and Failure Analysis of Integrated Circuits, 2004. IPFA 2004. Proceedings of the 11th International Symposium on the. :29-32 2004

Relation: Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004

المؤلفون: Chen, P.S., Lee, S.W., Lee, M.H., Liu, C.W., Tsai, M.-J.

المصدر: 2004 Semiconductor Manufacturing Technology Workshop Proceedings (IEEE Cat. No.04EX846) Semiconductor manufacturing technology Semiconductor Manufacturing Technology Workshop Proceedings, 2004. :79-82 2004

Relation: 2004 Semiconductor Manufacturing Technology Workshop Proceedings

المؤلفون: Lai, L.S., Liang, C.S., Chen, P.S., Hsu, Y.M., Liu, Y.H., Tseng, Y.T., Lu, S.C., Tsai , M.-J., Liu, C.W., Rosenblad, C., Buschbaum, T., Buschbeck, M., Ramm, J.

المصدر: 2003 International Symposium on VLSI Technology, Systems and Applications. Proceedings of Technical Papers. (IEEE Cat. No.03TH8672) VLSI technology, systems and applications VLSI Technology, Systems, and Applications, 2003 International Symposium on. :113-116 2003

Relation: 2003 International Symposium on VLSI Technology, Systems and Applications. Proceedings of Technical Papers