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1مؤتمر
المؤلفون: Lin, L. C., Hsieh, E R., Kao, T. C., Lee, M. Y., Chang, J. K., Guo, J. C., Chung, S. S., Chen, T. P., Huang, S. A., Chen, T. J., Cheng, O.
المصدر: 2022 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) VLSI Technology, Systems and Applications (VLSI-TSA), 2022 International Symposium on. :1-2 Apr, 2022
Relation: 2022 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)
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2دورية أكاديمية
المؤلفون: Liu, G. F., Chen, T. J.Aff1, IDs10853023087525_cor2
المصدر: Journal of Materials Science. 58(28):11820-11839
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3مؤتمر
المؤلفون: Hsieh, E R., Tsai, W. L., Lin, Y. L., Liu, C. H., Chung, S. S., Tang, Y. T., Su, J. R., Chen, T. P., Huang, S. A., Chen, T. J., Cheng, O.
المصدر: 2021 Symposium on VLSI Technology VLSI Technology, 2021 Symposium on. :1-2 Jun, 2021
Relation: 2021 Symposium on VLSI Technology
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4دورية أكاديمية
المؤلفون: Liu, G. F., Chen, T. J.Aff1, IDs12540022011896_cor2
المصدر: Metals and Materials International. 28(12):2919-2933
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5مؤتمر
المؤلفون: Wu, C. M., Chen, T. J., Lee, Y. D., Chen, T. F.
المصدر: 2016 IEEE International Conference on Management of Innovation and Technology (ICMIT) Management of Innovation and Technology (ICMIT), 2016 IEEE International Conference on. :37-42 Sep, 2016
Relation: 2016 IEEE International Conference on Management of Innovation and Technology (ICMIT)
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6مؤتمر
المؤلفون: Hsieh, E. R., Jiang, M. J., Chen, H. W., Lin, J. L., Chung, Steve S., Chen, T. P., Yeah, Y. H., Chen, T. J., Cheng, Osbert
المصدر: 2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM) Electron Devices Technology and Manufacturing Conference (EDTM), 2018 IEEE 2nd. :148-150 Mar, 2018
Relation: 2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM)
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7مؤتمر
المؤلفون: Xiao, Y., Hsieh, E. R., Chung, Steve S., Chen, T. R, Huang, S. A., Chen, T. J., Cheng, Osbert
المصدر: 2019 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2019 IEEE International. :21.5.1-21.5.4 Dec, 2019
Relation: 2019 IEEE International Electron Devices Meeting (IEDM)
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8مؤتمر
المؤلفون: Hsieh, E. R., Chang, H. Y., Chung, Steve S., Chen, T. P., Huang, S. A., Chen, T. J., Cheng, Osbert, Wong, S. Simon
المصدر: 2019 Symposium on VLSI Technology VLSI Technology, 2019 Symposium on. :T138-T139 Jun, 2019
Relation: 2019 Symposium on VLSI Technology
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9مؤتمر
المؤلفون: Hsieh, E. R., Wang, H. W., Liu, C. H., Chung, Steve S., Chen, T. P., Huang, S.A., Chen, T. J., Cheng, Osbert
المصدر: 2019 Symposium on VLSI Technology VLSI Technology, 2019 Symposium on. :T118-T119 Jun, 2019
Relation: 2019 Symposium on VLSI Technology
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10مؤتمر
المؤلفون: Luo, Y. C., Li, F. L., Hsieh, E. R., Liu, C. H., Chung, Steve S., Chen, T. P., Huang, S. A., Chen, T. J., Chenz, Osbert
المصدر: 2019 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) VLSI Technology, Systems and Application (VLSI-TSA), 2019 International Symposium on. :1-2 Apr, 2019
Relation: 2019 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA)