المؤلفون: Chiang, H.-L., Hadi, R. A., Wang, J.-F., Han, H.-C., Wu, J.-J., Hsieh, H.-H., Horng, J.-J., Chou, W.-S., Lien, B.-S., Chang, C.-H., Chen, Y.-C., Wang, Y.-H., Chen, T.-C., Liu, J.-C., Liu, Y.-C., Chiang, M.-H., Kao, K.-H., Pulicherla, B., Cai, J., Chang, C.-S., Su, K.-W., Cheng, K.-L., Yeh, T.-J., Peng, Y.-C., Enz, C., Chang, M.-C. F., Chang, M.-F., Wong, H.-S. P., Radu, I. P.

المصدر: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023

Relation: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)

المؤلفون: Liao, C.-Y., Hsiang, K.-Y., Lou, Z. -F., Tseng, H.-C., Lin, C.-Y., Li, Z.-X., Hsieh, F.-C., Wang, C.-C., Chang, F.-S., Ray, W.-C., Tseng, Y.-Y., Chang, S. T., Chen, T.-C., Lee, M. H.

المصدر: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2022 IEEE Symposium on. :1-2 Jun, 2022

Relation: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)

المؤلفون: Chiang, H. -L., Wang, J.-F., Lin, K. -H., Nien, C.-H., Wu, J. -J., Hsiang, K.-Y., Chuu, C. -P., Chen, Y.-W., Zhang, X. W., Liu, C. W., Wang, Tahui, Wang, C. -C., Lee, M.-H., Chang, M. -F., Chang, C.-S., Chen, T. C.

المصدر: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2022 IEEE Symposium on. :361-362 Jun, 2022

Relation: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)

المؤلفون: Hsiang, K.-Y., Liao, C.-Y., Lin, Y.-Y., Lou, Z.-F., Lin, C.-Y., Lee, J.-Y., Chang, F.-S., Li, Z.-X., Tseng, H.-C., Wang, C.-C., Ray, W.-C., Hou, T.-H., Chen, T.-C., Chang, C.-S., Lee, M. H.

المصدر: 2022 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2022 IEEE International. :P9-1-P9-4 Mar, 2022

Relation: 2022 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Khwa, W. S., Akarvardar, K., Chen, Y. S., Chiu, Y. C., Liu, J. C., Wu, J. J., Lee, H. Y., Yu, S. M., Lee, C. H., Chen, T. C., Lin, Y. C., Hsu, C. F., Lee, T. Y., Ku, T. K., Kuo, C. H., Wu, J. Y., Bao, X. Y., Chang, C. S., Chih, Y. D., Wong, H.-S. P., Chang, M. F.

المصدر: 2021 Symposium on VLSI Technology VLSI Technology, 2021 Symposium on. :1-2 Jun, 2021

Relation: 2021 Symposium on VLSI Technology

المؤلفون: Wu, C. H., Lee, C. M., Chen, Y. S., Lee, H. Y., Ambrosi, E., Hsu, C. F., Vaziri, S., Chen, Y. Y., Nien, C. H., Hwang, R. L., Liao, P. J., Hou, D. H., Lee, Y.-H., Lee, T. Y., Chen, T. C., Chang, M. F., Wong, H.-S. P., Bao, X. Y.

المصدر: 2021 Symposium on VLSI Technology VLSI Technology, 2021 Symposium on. :1-2 Jun, 2021

Relation: 2021 Symposium on VLSI Technology

المؤلفون: Chiang, H. L., Wang, J. F., Chen, T. C., Chiang, T. W., Bair, C., Tan, C. Y., Huang, L. J., Yang, H. W., Chuang, J. H., Lee, H. Y., Chiang, K., Shen, K. H., Lee, Y. J., Wang, R., Liu, C. W., Wang, T., Bao, X., Wang, E., Cai, J., Lin, C. T., Chuang, H., Wong, H. S. P., Chang, M. F.

المصدر: 2021 Symposium on VLSI Technology VLSI Technology, 2021 Symposium on. :1-2 Jun, 2021

Relation: 2021 Symposium on VLSI Technology

المؤلفون: Chiang, H. L., Chen, T. C., Wang, J. F., Mukhopadhyay, S., Lee, W. K., Chen, C. L., Khwa, W. S., Pulicherla, B., Liao, P. J., Su, K. W., Yu, K. F., Wang, T., Wong, H. S. P., Diaz, C. H., Cai, J.

المصدر: 2020 IEEE Symposium on VLSI Technology VLSI Technology, 2020 IEEE Symposium on. :1-2 Jun, 2020

Relation: 2020 IEEE Symposium on VLSI Technology

المؤلفون: Chen, T.-C., Wang, L., Goodyear, G., Yializis, A., Xin, H.

المصدر: IEEE Transactions on Microwave Theory and Techniques IEEE Trans. Microwave Theory Techn. Microwave Theory and Techniques, IEEE Transactions on. 63(11):3768-3774 Nov, 2015

المؤلفون: Ling, N. P., Chou, K. H., Jhou, C. T., Lai, M. H., Chen, T. C., Lai, C. H., Wang, L. W., Lee, G. B., Lee, M. C. M.

المصدر: The 8th Annual IEEE International Conference on Nano/Micro Engineered and Molecular Systems Nano/Micro Engineered and Molecular Systems (NEMS), 2013 8th IEEE International Conference on. :653-656 Apr, 2013

Relation: 2013 8th IEEE International Conference on Nano/Micro Engineered and Molecular Systems (NEMS)