المؤلفون: Chien, W. C., Sung, C. L., Bruce, R. L., Yeh, C. W., Cheng, H. Y., Liu, Z. L., Lai, E. K., Cheng, C. W., Zheng, J. X., Grun, A., Ray, A., Daudelin, D., Ho, H. Y., BrightSky, M., Lung, H. L.

المصدر: 2024 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2024 IEEE International. :1-4 May, 2024

Relation: 2024 IEEE International Memory Workshop (IMW)

المؤلفون: Syed, G. S., Brew, K., Vasilopoulos, A., Jonnalagadda, V. P., Kersting, B., Philip, T., Bragaglia, V., Ambrogio, S., Buchel, J., Giannopoulos, J., Gallo, M. Le, Cheng, C.-W., BrightSky, M., Narayanan, V., Saulnier, N., Sebastian, A.

المصدر: 2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023

Relation: 2023 International Electron Devices Meeting (IEDM)

المؤلفون: Chien, W. C., Gignac, L. M., Chou, Y. C., Yang, C. H., Gong, N., Ho, H. Y., Yeh, C. W., Cheng, H. Y., Kim, W., Kuo, I. T., Lai, E. K., Cheng, C. W., Buzi, L., Ray, A., Hsu, C. S., Daudelin, D., Bruce, R. L., BrightSky, M., Lung, H. L.

المصدر: 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2022 6th IEEE. :327-329 Mar, 2022

Relation: 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

المؤلفون: Bruce, R.L., Sarwat, S. Ghazi, Boybat, I., Cheng, C.-W., Kim, W., Nandakumar, S.R., Mackin, C., Philip, T., Liu, Z., Brew, K., Gong, N., Ok, I., Adusumilli, P., Spoon, K., Ambrogio, S., Kersting, B., Bohnstingl, T., Gallo, M. Le, Simon, A., Li, N., Saraf, I., Han, J.-P., Gignac, L., Papalia, J.M., Yamashita, T., Saulnier, N., Burr, G. W., Tsai, H., Sebastian, A., Narayanan, V., BrightSky, M.

المصدر: 2021 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2021 IEEE International. :1-6 Mar, 2021

Relation: 2021 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Cheng, H. Y., Grun, A., Chien, W C., Yeh, C. W., Ray, A., Cheng, C. W., Lai, E. K., Lavoie, C., Gignac, L., Hopstaken, M., Kuo, I. T., Hsu, C. S., Buzi, L., Bruce, R. L., Lee, D. Y., Gong, N., Bishop, D., BrightSky, M., Lung, H. L.

المصدر: 2022 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2022 International. :18.5.1-18.5.4 Dec, 2022

Relation: 2022 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Chien, W. C., Gignac, L. M., Chou, Y. C., Yang, C. H., Gong, N., Ho, H. Y., Yeh, C. W., Cheng, H. Y., Kim, W., Kuo, I. T., Lai, E. K., Cheng, C. W., Buzi, L., Ray, A., Hsu, C. S., Bruce, R. L., BrightSky, M., Lung, H. L.

المصدر: 2022 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2022 IEEE International. :P7-1-P7-4 Mar, 2022

Relation: 2022 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Cheng, H. Y., Chien, W C., Kuo, I. T., Yang, C. H., Chou, Y. C., Bruce, R. L., Lai, E. K., Daudelin, D., Yeh, C. W., Gignac, L., Cheng, C. W., Grun, A., Lavoie, C., Gong, N., Buzi, L., Ho, H. Y., Ray, A., Utomo, H., BrightSky, M., Lung, H. L.

المصدر: 2021 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2021 IEEE International. :28.6.1-28.6.4 Dec, 2021

Relation: 2021 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Cartier, E., Majumdar, A., Lee, K.-T., Ando, T., Frank, M. M., Rozen, J., Jenkins, K. A., Liang, C., Cheng, C.-W., Bruley, J., Hopstaken, M., Kerber, P., Yau, J.-B., Sun, X., Mo, R. T., Yeh, C.-C., Leobandung, E., Narayanan, V.

المصدر: 2017 47th European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), 2017 47th European. :292-295 Sep, 2017

Relation: ESSDERC 2017 - 47th IEEE European Solid-State Device Research Conference (ESSDERC)

المؤلفون: Cheng, H. Y., Kuo, I. T., Chien, W. C., Yeh, C. W., Chou, Y. C., Gong, N., Gignac, L., Yang, C. H., Cheng, C. W., Lavoie, C., Hopstaken, M., Bruce, R. L., Buzi, L., Lai, E. K., Carta, F., Ray, A., Lee, M. H., Ho, H. Y., Kim, W., BrightSky, M., Lung, H. L.

المصدر: 2020 IEEE Symposium on VLSI Technology VLSI Technology, 2020 IEEE Symposium on. :1-2 Jun, 2020

Relation: 2020 IEEE Symposium on VLSI Technology

المؤلفون: Sadana, D. K., Cheng, C.-W., Wacaser, B., Spratt, W., Shiu, K.T., Bedell, S.W.

المصدر: 2015 IEEE Custom Integrated Circuits Conference (CICC) Custom Integrated Circuits Conference (CICC), 2015 IEEE. :1-6 Sep, 2015

Relation: 2015 IEEE Custom Integrated Circuits Conference - CICC 2015