المؤلفون: Mittal, Soumya, Urban, Szczepan, Chung, Kun Young, Janicki, Jakub, Cheng, Wu-Tung, Parley, Martin, Sharma, Manish, Nicholson, Shaun

المصدر: 2022 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2022 IEEE International. :420-426 Sep, 2022

Relation: 2022 IEEE International Test Conference (ITC)

المؤلفون: Zheng, Shi-Xuan, Yeh, Chung-Yu, Lee, Kuen-Jong, Wang, Chen, Cheng, Wu-Tung, Kassab, Mark, Rajski, Janusz, Reddy, Sudhakar M.

المصدر: 2022 IEEE 40th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2022 IEEE 40th. :1-7 Apr, 2022

Relation: 2022 IEEE 40th VLSI Test Symposium (VTS)

المؤلفون: Lin, Xijiang, Cheng, Wu-Tung, Kobayashi, Takeo, Glowatz, Andreas

المصدر: 2021 IEEE 30th Asian Test Symposium (ATS) ATS Asian Test Symposium (ATS), 2021 IEEE 30th. :103-108 Nov, 2021

Relation: 2021 IEEE 30th Asian Test Symposium (ATS)

المؤلفون: Tsai, Fong-Jyun, Ye, Chong-Siao, Lee, Kuen-Jong, Zheng, Shi-Xuan, Huang, Yu, Cheng, Wu-Tung, Reddy, Sudhakar M., Kassab, Mark, Rajski, Janusz, Wang, Chen, Zawada, Justyna

المصدر: 2020 IEEE International Test Conference (ITC) Test Conference (ITC), 2020 IEEE International. :1-10 Nov, 2020

Relation: 2020 IEEE International Test Conference (ITC)

المؤلفون: Lai, Liyang, Zhang, Qiting, Tsai, Hans, Cheng, Wu-Tung

المصدر: 2020 IEEE International Test Conference in Asia (ITC-Asia) Test Conference in Asia (ITC-Asia), 2020 IEEE International. :118-123 Sep, 2020

Relation: 2020 IEEE International Test Conference in Asia (ITC-Asia)

المؤلفون: Tsai, Fong-Jyun, Ye, Chong-Siao, Huang, Yu, Lee, Kuen-Jong, Cheng, Wu-Tung, Reddy, Sudhakar M., Kassab, Mark, Rajski, Janusz, Zheng, Shi-Xuan

المصدر: 2020 IEEE International Test Conference in Asia (ITC-Asia) Test Conference in Asia (ITC-Asia), 2020 IEEE International. :130-135 Sep, 2020

Relation: 2020 IEEE International Test Conference in Asia (ITC-Asia)

المؤلفون: Wang, Naixing, Wang, Chen, Tsai, Kun-Han, Cheng, Wu-Tung, Lin, Xijiang, Kassab, Mark, Pomeranz, Irith

المصدر: 2019 IEEE 28th Asian Test Symposium (ATS) ATS Asian Test Symposium (ATS), 2019 IEEE 28th. :19-195 Dec, 2019

Relation: 2019 IEEE 28th Asian Test Symposium (ATS)

المؤلفون: Wu, Cheng-Hung, Huang, Yu, Lee, Kuen-Jong, Cheng, Wu-Tung, Veda, Gaurav, Reddy, Sudhakar, Hu, Chun-Cheng, Ye, Chong-Siao

المصدر: 2019 IEEE 28th Asian Test Symposium (ATS) ATS Asian Test Symposium (ATS), 2019 IEEE 28th. :1-15 Dec, 2019

Relation: 2019 IEEE 28th Asian Test Symposium (ATS)

المؤلفون: Tian, Yue, Veda, Gaurav, Cheng, Wu-Tung, Sharma, Manish, Tang, Huaxing, Bawaskar, Neerja, Reddy, Sudhakar M.

المصدر: 2019 IEEE European Test Symposium (ETS) Test Symposium (ETS), 2019 IEEE European. :1-6 May, 2019

Relation: 2019 IEEE European Test Symposium (ETS)

المؤلفون: Tang, Huaxing, Sharma, Manish, Cheng, Wu-Tung, Veda, Gaurav, Gehringer, Douglas, Knowles, Matt, D'Souza, Jayant, Sekar, Kannan, Bawaskar, Neerja, Pan, Yan

المصدر: 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) Advanced Semiconductor Manufacturing Conference (ASMC), 2019 30th Annual SEMI. :1-7 May, 2019

Relation: 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)