المؤلفون: Gi-Chun Lee, Yong-Bum Lee, Tae-Yeon Nam, Cheong-Gwang Yang, Sung-Hyun Kim, Eun-Taek Song, Sang-Duck Kim, Jae-Hoon Kim

المصدر: Journal of Applied Reliability. 21:352-360

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::24f49d60d7330ac9a3c5c3ef4a0e3a0d
https://doi.org/10.33162/jar.2021.12.21.4.352