نتائج البحث - "Chi-Kai Wang"

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دورية أكاديمية

In-TFT-Array-Process Micro Defect Inspection Using Nonlinear Principal Component Analysis

المؤلفون: Zhi-Hao Kang, Jih-Shang Hwang, Ching-Shun Chen, Wei-Zhi Lin, Yung Ting, Chi-Kai Wang, Yi-Hung Liu

المصدر: International Journal of Molecular Sciences, Vol 10, Iss 10, Pp 4498-4514 (2009)

مصطلحات موضوعية: thin film transistor liquid crystal display, TFT array process, automatic optical inspection, defect inspection, kernel principal component analysis, support vector machine, Biology (General), QH301-705.5, Chemistry, QD1-999

وصف الملف: electronic resource

Relation: http://www.mdpi.com/1422-0067/10/10/4498/; https://doaj.org/toc/1422-0067

URL الوصول: https://doaj.org/article/b8503fa828bc4b7eaf39ac78e33f131b

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مؤتمر

Investigation of energy harvest and storage by using curve-shape piezoelectric unimorph

المؤلفون: Yung Ting, Gunawan Hariyanto, Bing Kuan Hou, Ricky, Setiawan, Sugondo Amelia, Chi-Kai Wang

المصدر: 2009 IEEE International Symposium on Industrial Electronics Industrial Electronics, 2009. ISIE 2009. IEEE International Symposium on. :2047-2052 Jul, 2009

Relation: 2009 IEEE International Symposium on Industrial Electronics (ISIE 2009)

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مؤتمر

A novel approach to generate artificial outliers for support vector data description

المؤلفون: Chi-Kai Wang, Yung Ting, Yi-Hung Liu, Gunawan Hariyanto

المصدر: 2009 IEEE International Symposium on Industrial Electronics Industrial Electronics, 2009. ISIE 2009. IEEE International Symposium on. :2202-2207 Jul, 2009

Relation: 2009 IEEE International Symposium on Industrial Electronics (ISIE 2009)

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مؤتمر

A novel approach of feature classification using Support Vector Data Description combined with interpolation method

المؤلفون: Chi-Kai Wang, Yung Ting, Yi-Hung Liu

المصدر: 2008 34th Annual Conference of IEEE Industrial Electronics Industrial Electronics, 2008. IECON 2008. 34th Annual Conference of IEEE. :1828-1832 Nov, 2008

Relation: IECON 2008 - 34th Annual Conference of IEEE Industrial Electronics

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A Novel Approach for Raising the Accuracy of SVDD

المؤلفون: Chi-Kai Wang, I-Hsuan Huang, Chao-Hsing Hsu

المصدر: 2012 International Conference on Computing, Measurement, Control and Sensor Network.

مصطلحات موضوعية: Computer science, business.industry, Pattern recognition, Base (topology), computer.software_genre, Raising (linguistics), Set (abstract data type), Support vector machine, Range (mathematics), Classification result, Outlier, One-class classification, Data mining, Artificial intelligence, business, computer

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::dd8271e6d4d51def43581589c6cb1306
https://doi.org/10.1109/cmcsn.2012.58

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An approach for raising the accuracy of one-class classifiers

المؤلفون: Chi-Kai Wang, Yi-Hung Liu, Yung Ting

المصدر: ICARCV

مصطلحات موضوعية: business.industry, Pattern recognition, Hypersphere, Base (topology), computer.software_genre, Set (abstract data type), Support vector machine, Range (mathematics), ComputingMethodologies_PATTERNRECOGNITION, Kernel (statistics), Outlier, One-class classification, Data mining, Artificial intelligence, business, computer, Mathematics

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f515797850c5cbfd1d9cf54f7a648278
https://doi.org/10.1109/icarcv.2010.5707217

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Applying Least Squares Support Vector Regression with Genetic Algorithms for Radio-Wave Path-Loss Prediction in Suburban Environment

المؤلفون: Jen-Chang Lin, Kuo-Ping Lin, Kuo-Chen Hung, Chi-Kai Wang, Ping-Feng Pai

المصدر: Lecture Notes in Electrical Engineering ISBN: 9783642129896

مصطلحات موضوعية: Artificial neural network, Computer science, business.industry, Generalized least squares, computer.software_genre, Machine learning, Least squares, Regression, Support vector machine, Partial least squares regression, Least squares support vector machine, Artificial intelligence, Data mining, Total least squares, business, computer

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::cc1d063515078d46a969aef383bef1ef
https://doi.org/10.1007/978-3-642-12990-2_100

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In-TFT-array-process micro defect inspection using nonlinear principal component analysis

المؤلفون: Yung Ting, Chi-Kai Wang, Ching-Shun Chen, Wei-Zhi Lin, Yi-Hung Liu, Jih-Shang Hwang, Zhi-Hao Kang

المصدر: International Journal of Molecular Sciences
Volume 10
Issue 10
Pages: 4498-4514
International Journal of Molecular Sciences, Vol 10, Iss 10, Pp 4498-4514 (2009)

مصطلحات موضوعية: Transistors, Electronic, Computer science, Thin-film-transistor liquid-crystal display, Hardware_PERFORMANCEANDRELIABILITY, thin film transistor liquid crystal display, Catalysis, Kernel principal component analysis, Article, law.invention, lcsh:Chemistry, Inorganic Chemistry, law, support vector machine, Physical and Theoretical Chemistry, lcsh:QH301-705.5, Molecular Biology, Spectroscopy, Principal Component Analysis, Liquid-crystal display, business.industry, Organic Chemistry, Pattern recognition, General Medicine, kernel principal component analysis, Real image, Inspection time, Computer Science Applications, Liquid Crystals, Support vector machine, lcsh:Biology (General), lcsh:QD1-999, Thin-film transistor, defect inspection, Principal component analysis, automatic optical inspection, Artificial intelligence, business, Algorithms, TFT array process