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1دورية أكاديمية
المؤلفون: Chih-Hsin Yu, Min-hwa Chi, Yuan-Hung Liou, Yeur-Luen Tu, Chi-San Wu, Yu-Shen Chen, Chib-Yang Pai, Chia-Shiung Tsai
المصدر: IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 15(4):478-485 Nov, 2002
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2دورية أكاديمية
المؤلفون: Wen-Ting Chu, Hao-Hsiung Lin, Yeur-Luen Tu, Yu-Hsiung Wang, Chia-Ta Hsieh, Hung-Cheng Sung, Yung-Tao Lin, Chia-Shiung Tsai, Wang, C.S.
المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 25(9):616-618 Sep, 2004
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3مؤتمر
المؤلفون: Dun-Nian Yaung, Shou-Gwo Wuu, Ho-Ching Chien, Tzu-Hsuan Hsu, Chien-Hsien Tseng, Jeng-Shyan Lin, Jieh-Jang Chen, Chin-Hsin Lo, Chung-Yi Yu, Chia-Shiung Tsai, Wang, C.S.
المصدر: IEEE International Electron Devices Meeting 2003 Electron devices IEDM'03 Electron Devices Meeting, 2003. IEDM '03 Technical Digest. IEEE International. :16.5.1-16.5.4 2003
Relation: IEEE International Electron Devices Meeting 2003
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4
المؤلفون: Yuan-Chih Hsieh, Lan-Lin Chao, Xin-Hua Huang, David Huang, Ping-Yin Liu, Chun-Wen Cheng, Cindy Colinge, Chia-Shiung Tsai
المصدر: ECS Transactions. 50:151-158
مصطلحات موضوعية: Materials science, media_common.quotation_subject, Design of experiments, Metallurgy, Eutectic bonding, Quality (business), Wafer-level packaging, Manufacturing engineering, media_common
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5
المؤلفون: K.-Y. Roy Wong, Chen Po-Chih, C. B. Wu, Ching-Ray Chen, C. W. Hsiung, Ming-Huei Lin, F. J. Yang, Liao Yan-Jie, M. W. Tsai, Yani Lai, Chiu Hsien-Kuang, Tom Tsai, Man-Ho Kwan, Sheng-Da Liu, Burn Jeng Lin, Chang Yu-Chi, Jan-Wen You, Alex Kalnitsky, Chen-Shien Chen, M.-H. Chang, J. L. Yu, L. Y. Tsai, Yu-Syuan Lin, P.-C. Liu, Ru-Yi Su, Fu-Wei Yao, H. C. Tuan, L. C. Chen, Haw-Yun Wu, K.-L. Chiu, Chia-Shiung Tsai, Chung-Yi Yu, S.-P. Wang, G. P. Lansbergen, Chiang Chen-Hao
المصدر: 2015 IEEE International Electron Devices Meeting (IEDM).
مصطلحات موضوعية: Materials science, business.industry, Transistor, Schottky diode, Gallium nitride, Capacitance, law.invention, chemistry.chemical_compound, chemistry, law, Logic gate, Optoelectronics, business, MISFET, AND gate, Leakage (electronics)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b7faa0d215059670d3d4fc905d6e081b
https://doi.org/10.1109/iedm.2015.7409663 -
6
المؤلفون: H.C. Chu, Chia-Shiung Tsai, S.W. Huang, Hsien-Hsin Lin, W. S. Liao, Chung-Hao Tsai, S.P. Jeng, Doug C. H. Yu, C.Y. Pai, C.H. Chang, H.P. Hu, W.C. Chiang, Shang-Yun Hou, T.H. Liu
المصدر: 2014 IEEE International Electron Devices Meeting.
مصطلحات موضوعية: Materials science, business.industry, Electrical engineering, Three-dimensional integrated circuit, Equivalent oxide thickness, Decoupling capacitor, Capacitance, law.invention, Capacitor, law, Interposer, Optoelectronics, business, Decoupling (electronics), High-κ dielectric
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6013d9e3d3041100d0cc1b8d304f95ad
https://doi.org/10.1109/iedm.2014.7047119 -
7
المؤلفون: C. W. Hsiung, Chia-Shiung Tsai, C. L. Tsai, J. L. Yu, Chou Chien-Chih, Chiu Hsien-Kuang, Ping Chen Chen, King-Yuen Wong, F. J. Yang, H. C. Tuan, C. J. Yu, Sheng-Da Liu, Fu-Wei Yao, Chung-Hao Tsai, Yu-Syuan Lin, Ru-Yi Su, Xiaomeng Chen, Alex Kalnitsky, G. P. Lansbergen
المصدر: 2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD).
مصطلحات موضوعية: Materials science, Silicon, business.industry, chemistry.chemical_element, Algan gan, Substrate (electronics), Nitride, Threshold voltage, Trap (computing), Reliability (semiconductor), chemistry, Optoelectronics, Positive bias, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d01b1c02f3be2ff85e55ca77c2e4bd9b
https://doi.org/10.1109/ispsd.2014.6856034 -
8
المؤلفون: Yu-Syuan Lin, Alex Kalnitsky, Ru-Yi Su, C. W. Hsiung, P.-C. Liu, Ming-Huei Lin, Chiu Hsien-Kuang, F. J. Yang, H. C. Tuan, King-Yuen Wong, S. D. Liu, J. L. Yu, Fu-Wei Yao, C. J. Yu, Xiaomeng Chen, C. L. Tsai, Yani Lai, Chia-Shiung Tsai, Ching-Ray Chen, Chen Po-Chih, G. P. Lansbergen, Chung-Yi Yu, Chiang Chen-Hao
المصدر: 2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD).
مصطلحات موضوعية: Reliability (semiconductor), Materials science, business.industry, Contact resistance, Electrical engineering, Optoelectronics, Breakdown voltage, Algan gan, Substrate (electronics), business, Epitaxy, Layer (electronics), Bias stress
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::15f0b75d4642c065a0ced749472125e9
https://doi.org/10.1109/ispsd.2014.6855974 -
9
المؤلفون: W.P. Mo, S. Takahashi, R.J. Lin, Kuo-Ching Huang, Gene. Hung, C.C. Chuang, Jhy-Jyi Sze, S.Y. Chen, F.J. Shiu, R.L. Lee, Jeng-Shyan Lin, Chung Wang, S. G. Wuu, W.I. Hsu, Chia-Shiung Tsai, Yeur-Luen Tu, D.N. Yaung, H.Y. Cheng, S.J. Tsai, T.H. Hsu, W.H. Wu, Y.P. Chao, S.T. Tsai, Wen-De Wang, Jen-Cheng Liu, Ta-Wei Wang, Chi-Chuan Wang
المصدر: 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers.
مصطلحات موضوعية: CMOS sensor, Pixel, Computer science, business.industry, Page layout, Process (computing), computer.software_genre, Application-specific integrated circuit, Sensor array, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, Wafer, Image sensor, business, computer
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c5143c8683d3a586b5263ebe5180e7cd
https://doi.org/10.1109/vlsit.2014.6894429 -
10
المؤلفون: Chung S. Wang, Yeur-Luen Tu, Hung-Cheng Sung, Wen-Ting Chu, Yung-Tao Lin, Yu-Hsiung Wang, Hao-Hsiung Lin, Chia-Ta Hsieh, Chia-Shiung Tsai
المصدر: IEEE Electron Device Letters. 25:616-618
مصطلحات موضوعية: Materials science, Bridging (networking), business.industry, Electrical engineering, Integrated circuit, Flash memory, Electronic, Optical and Magnetic Materials, law.invention, Ammonia, chemistry.chemical_compound, chemistry, X-ray photoelectron spectroscopy, law, Optoelectronics, Grain boundary, Electrical and Electronic Engineering, business, Nitriding, Shrinkage
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9f3196a3f0ceeb23ff3b50824e7ec05e
https://doi.org/10.1109/led.2004.833825
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