المؤلفون: Chen, S., Chen, T., Mao, Y., Lin, S., Huang, Y., Chen, C., Lin, Y., Hsu, Y., Li, C., Chiang, W., Wong, K., Abu, P.A.R.

المصدر: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 22(23):23293-23306 Dec, 2022

المؤلفون: Wang, L., Yu, Y., Liu, W., Xu, L., Xie, C., Yang, T., Kuo, I., Wang, X., Gao, J., Huang, P., Chen, S., Chiang, W., Abu, P.A.R.

المصدر: IEEE Access Access, IEEE. 10:44046-44061 2022

المؤلفون: Chen, S., Chen, T., Huang, Y., Chen, C., Chou, H., Lin, W., Li, T., Yuan, J., Abu, P.A.R., Chiang, W.

المصدر: IEEE Access Access, IEEE. 10:118654-118664 2022

المؤلفون: Shaikh, M.O., Lin, C., Lee, D., Chiang, W., Chen, I., Chuang, C.

المصدر: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 20(17):9610-9617 Sep, 2020

المؤلفون: Hsu, Y., Wang, J., Chiang, W., Hung, C.

المصدر: IEEE Transactions on Affective Computing IEEE Trans. Affective Comput. Affective Computing, IEEE Transactions on. 11(1):85-99 Jan, 2020

المؤلفون: Chang, Y.-J., Feng, Y.-T., Chiang, W.-J., Chang, R.-J., Chiueh, M.-H., Holtz, T.

المصدر: 2017 IEEE 3rd International Future Energy Electronics Conference and ECCE Asia (IFEEC 2017 - ECCE Asia) Future Energy Electronics Conference and ECCE Asia (IFEEC 2017 - ECCE Asia), 2017 IEEE 3rd International. :1719-1724 Jun, 2017

Relation: 2017 IEEE 3rd International Future Energy Electronics Conference and ECCE Asia (IFEEC 2017 - ECCE Asia)

المؤلفون: Chen, Y., Chiang, W., Shih, M.

المصدر: IEEE Systems Journal Systems Journal, IEEE. 12(2):1632-1643 Jun, 2018

المؤلفون: Chiang, W.-C., Lan, W.-L., Tang, Y.-H., Lin, J. G.

المصدر: IEEE Transactions on Magnetics IEEE Trans. Magn. Magnetics, IEEE Transactions on. 50(1):1-4 Jan, 2014

المؤلفون: Pei, Z., Chiang, W., Shih, H., Chang, H., Yang, J.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 39(12):1912-1915 Dec, 2018

المؤلفون: Yu, C. K., Chiang, W. S., Liu, N. W., Lin, M. Z., Fang, Y. H., Lin, M. J., Lin, Benson, Huang, Michael

المصدر: 2017 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS),2017 IEEE International. :4A-6.1-4A-6.4 Apr, 2017

Relation: 2017 IEEE International Reliability Physics Symposium (IRPS)