المؤلفون: Chen, Chia-Hsiang, Chang, Chih-Yang, Weng, Chih-Hui, Kuo, Tsung-Han, Wang, Chia-Yu, Shih, Meng-Chun, Chiang, Tien-Wei, Lee, Yuan-Jen, Wang, Roger, Shen, Kuei-Hung, Hung, Arthur, Chuang, Harry

المصدر: 2021 Symposium on VLSI Technology VLSI Technology, 2021 Symposium on. :1-2 Jun, 2021

Relation: 2021 Symposium on VLSI Technology

المؤلفون: Wang, Chia-Yu, Shih, Meng-Chun, Weng, Chih-Hui, Chen, Chia-Hsiang, Chang, Chih-Yang, Wang, Wayne, Chiang, Tien-Wei, Hung, Arthur, Chuang, Harry, Gallagher, William J.

المصدر: 2020 IEEE Symposium on VLSI Technology VLSI Technology, 2020 IEEE Symposium on. :1-2 Jun, 2020

Relation: 2020 IEEE Symposium on VLSI Technology

المؤلفون: Shih, Yi-Chun, Lee, Chia-Fu, Chang, Yen-An, Lee, Po-Hao, Lin, Hon-Jarn, Chen, Yu-Lin, Lo, Chieh-Pu, Lin, Ku-Feng, Chiang, Tien-Wei, Lee, Yuan-Jen, Shen, Kuei-Hung, Wang, Roger, Wang, Wayne, Chuang, Harry, Wang, Eric, Chih, Yu-Der, Chang, Jonathan

المصدر: 2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :11.4.1-11.4.4 Dec, 2020

Relation: 2020 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Gallagher, W.J., Chien, Eric, Chiang, Tien-Wei, Huang, Jian-Cheng, Shih, Meng-Chun, Wang, C.Y., Weng, Chih-Hui, Chen, Sean, Bair, Christine, Lee, George, Shih, Yi-Chun, Lee, Chia-Fu, Lee, Po-Hao, Wang, Roger, Shen, Kuei- Hung, Wu, J. J., Wang, Wayne, Chuang, Harry

المصدر: 2019 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2019 IEEE International. :2.7.1-2.7.4 Dec, 2019

Relation: 2019 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Gallagher, W.J., Chien, Eric, Chiang, Tien-Wei, Huang, Jian-Cheng, Shih, Meng-Chun, Wang, C.Y., Bair, Christine, Lee, George, Shih, Yi-Chun, Lee, Chia-Fu, Wang, Roger, Shen, Kuei-Hung, Wu, J.J., Wang, Wayne, Chuang, Harry

المصدر: 2019 Symposium on VLSI Technology VLSI Technology, 2019 Symposium on. :T190-T191 Jun, 2019

Relation: 2019 Symposium on VLSI Technology

المؤلفون: Wang, Chia-Yu, Shih, Meng-Chun, Lee, Yung-Huei, Wang, Wayne, Thomas, Luc, Lee, Yuan-Jen, Liu, Huanlong, Zhu, Jian, Jan, Guenole, Wang, Allen, Zhong, Tom, Wang, Po-Kang, Lin, Derek, Chen, Chia-Hsiang, Chang, Chih-Yang, Weng, Chih-Hui, Chiang, Tien-Wei, Shen, Kuei-Hung, Gallagher, William J., Chuang, Harry

المصدر: 2017 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2017 IEEE International. :21.1.1-21.1.4 Dec, 2017

Relation: 2017 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Jian-Cheng Huang, William J. Gallagher, Christine Bair, Eric Chien, J. J. Wu, C.Y. Wang, Lee Chia-Fu, Meng-Chun Shih, Wayne Wang, Kuei-Hung Shen, Roger Wang, Chiang Tien-Wei, Yi-Chun Shih, George Lee, Harry Chuang

المصدر: VLSI Circuits

مصطلحات موضوعية: 010302 applied physics, Very-large-scale integration, Random access memory, Magnetoresistive random-access memory, Hardware_MEMORYSTRUCTURES, Computer science, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Non-volatile memory, ComputingMilieux_GENERAL, Computer architecture, Hardware_GENERAL, 0103 physical sciences, 0210 nano-technology

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::939cbd8ea519fc261c477cff97b441c3
https://doi.org/10.23919/vlsit.2019.8776547

المؤلفون: Luc Thomas, Allen Wang, Yung-Huei Lee, Derek Lin, Po-Kang Wang, Guenole Jan, Harry Chuang, Chang Chih-Yang, Chen Chia-Hsiang, William J. Gallagher, Wayne Wang, Tom Zhong, Jian Zhu, Chih-Hui Weng, Yuan-Jen Lee, Chiang Tien-Wei, Chia-Yu Wang, Kuei-Hung Shen, Huanlong Liu, Meng-Chun Shih

المصدر: 2017 IEEE International Electron Devices Meeting (IEDM).

مصطلحات موضوعية: 010302 applied physics, 021110 strategic, defence & security studies, Magnetoresistive random-access memory, Materials science, Electromagnet, 0211 other engineering and technologies, Failure rate, 02 engineering and technology, Polarization (waves), Chip, 01 natural sciences, Engineering physics, Magnetic field, law.invention, law, Soldering, 0103 physical sciences, Perpendicular

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8dd9c46601e11efb6958d0b3ed2d3d16
https://doi.org/10.1109/iedm.2017.8268432

المؤلفون: Luc Thomas, Harry Chuang, Yuan-Jen Lee, Tom Zhong, Derek Lin, Po-Kang Wang, Yung-Huei Lee, Kuei-Hung Shen, Huanlong Liu, Terry Torng, Yu-Jen Wang, Jian Zhu, Chiang Tien-Wei, Meng-Chun Shih, Chia-Yu Wang, William J. Gallagher, Guenole Jan, Wayne Wang

المصدر: 2016 IEEE Symposium on VLSI Technology.

مصطلحات موضوعية: 010302 applied physics, Magnetoresistive random-access memory, business.industry, Computer science, Automotive industry, Electrical engineering, 02 engineering and technology, Chip, 01 natural sciences, 020202 computer hardware & architecture, Reflow soldering, Microcontroller, Reliability (semiconductor), Embedded system, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Perpendicular, Data retention, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::4644b1ae211f5fa1063aa733905d2315
https://doi.org/10.1109/vlsit.2016.7573411

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