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المؤلفون: Chrong Jung Lin, H. Arakawa, Ya-Jui Lee, Chieh-Yi Lu, Te-Yuan Yin, Zih-Song Wang, Tzung-Hua Ying
المصدر: IEEE Transactions on Electron Devices. 60:254-259
مصطلحات موضوعية: Materials science, Passivation, business.industry, NAND gate, Electronic, Optical and Magnetic Materials, Reliability (semiconductor), Flash (manufacturing), Electronic engineering, Degradation (geology), Deposition (phase transition), Optoelectronics, Electrical and Electronic Engineering, Diffusion (business), business, Layer (electronics)