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المؤلفون: King-Yuen Wong, Fu-Wei Yao, Chung-Yi Yu, Chih-Chieh Yeh, Yun-Hsiang Wang, Wen-De Wang, Yu-Syuan Lin, Ru-Yi Su, Ming-Huei Lin, S.-C. Liu, M.-H. Chang, Jan-Wen You, C.H. Tsai, S.-P. Wang, Man-Ho Kwan, Haw-Yun Wu, C. B. Wu, Ching-Ray Chen, Alex Kalnitsky, Tze-Chiang Huang, Chan-Hong Chern, L. Y. Tsai, H. C. Tuan, W.-C. Yang, J. L. Yu, Chen Po-Chih
المصدر: 2017 IEEE International Electron Devices Meeting (IEDM).
مصطلحات موضوعية: 010302 applied physics, Scheme (programming language), Buck converter, business.industry, Computer science, 020208 electrical & electronic engineering, Electrical engineering, 02 engineering and technology, 01 natural sciences, Aluminum gallium nitride, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Power semiconductor device, Channel modulation, business, Low voltage, computer, computer.programming_language, Electronic circuit
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3359bea377394fc519c97cbda076c7a6
https://doi.org/10.1109/iedm.2017.8268488 -
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المؤلفون: K.-Y. Roy Wong, Chen Po-Chih, C. B. Wu, Ching-Ray Chen, C. W. Hsiung, Ming-Huei Lin, F. J. Yang, Liao Yan-Jie, M. W. Tsai, Yani Lai, Chiu Hsien-Kuang, Tom Tsai, Man-Ho Kwan, Sheng-Da Liu, Burn Jeng Lin, Chang Yu-Chi, Jan-Wen You, Alex Kalnitsky, Chen-Shien Chen, M.-H. Chang, J. L. Yu, L. Y. Tsai, Yu-Syuan Lin, P.-C. Liu, Ru-Yi Su, Fu-Wei Yao, H. C. Tuan, L. C. Chen, Haw-Yun Wu, K.-L. Chiu, Chia-Shiung Tsai, Chung-Yi Yu, S.-P. Wang, G. P. Lansbergen, Chiang Chen-Hao
المصدر: 2015 IEEE International Electron Devices Meeting (IEDM).
مصطلحات موضوعية: Materials science, business.industry, Transistor, Schottky diode, Gallium nitride, Capacitance, law.invention, chemistry.chemical_compound, chemistry, law, Logic gate, Optoelectronics, business, MISFET, AND gate, Leakage (electronics)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b7faa0d215059670d3d4fc905d6e081b
https://doi.org/10.1109/iedm.2015.7409663 -
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المؤلفون: P. C. Chen, Chang Yu-Chi, Haw-Yun Wu, C. W. Hsiung, C. B. Wu, J. L. Tsai, Alex Kalnitsky, Yu-Syuan Lin, J. L. Yu, Fu-Wei Yao, Ru-Yi Su, M. W. Tsai, Yani Lai, Man Ho Kwan, Chung-Yi Yu, Ming-Huei Lin, M.-H. Chang, Chiu Hsien-Kuang, S.-P. Wang, Lin Hsing-Chih, G. P. Lansbergen, P.-C. Liu, King-Yuen Wong, L. C. Chen, Ching-Ray Chen, Wu Cheng-Ta, F. J. Yang, H. C. Tuan
المصدر: 2014 IEEE International Electron Devices Meeting.
مصطلحات موضوعية: Reliability (semiconductor), Materials science, business.industry, Electrical engineering, Optoelectronics, Breakdown voltage, Field-effect transistor, Wafer, High voltage, business, Epitaxy, Cmos compatible, Power (physics)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ae1841ade0c92d1ddbbd5e8ec22c1875
https://doi.org/10.1109/iedm.2014.7047073 -
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المؤلفون: Yu-Syuan Lin, Alex Kalnitsky, Ru-Yi Su, C. W. Hsiung, P.-C. Liu, Ming-Huei Lin, Chiu Hsien-Kuang, F. J. Yang, H. C. Tuan, King-Yuen Wong, S. D. Liu, J. L. Yu, Fu-Wei Yao, C. J. Yu, Xiaomeng Chen, C. L. Tsai, Yani Lai, Chia-Shiung Tsai, Ching-Ray Chen, Chen Po-Chih, G. P. Lansbergen, Chung-Yi Yu, Chiang Chen-Hao
المصدر: 2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD).
مصطلحات موضوعية: Reliability (semiconductor), Materials science, business.industry, Contact resistance, Electrical engineering, Optoelectronics, Breakdown voltage, Algan gan, Substrate (electronics), business, Epitaxy, Layer (electronics), Bias stress
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::15f0b75d4642c065a0ced749472125e9
https://doi.org/10.1109/ispsd.2014.6855974