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1دورية أكاديمية
المؤلفون: Yu-Hsien Lin, Chao-Hsin Chien, Ching-Tzung Lin, Chun-Yen Chang, Tan-Fu Lei
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 53(4):782-789 Apr, 2006
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2مؤتمر
المؤلفون: Yu-Hsien Lin, Chao-Hsin Chien, Ching-Tzung Lin, Ching-Wei Chen, Chun-Yen Chang, Tan-Fu Lei
المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :1080-1082 2004
Relation: 2004 International Electron Devices Meeting
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3دورية أكاديمية
المؤلفون: Yu-Hsien Lin, Chao-Hsin Chien, Ching-Tzung Lin, Chun-Yen Chang, Tan-Fu Lei
المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 26(3):154-156 Mar, 2005
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4
المؤلفون: Po-Yu Li, Li-Te Wu, Ching-Tzung Lin, Tsung-Hsien Lin, Wei-En Lee
المصدر: VLSI-DAT
مصطلحات موضوعية: Materials science, Finite impulse response, business.industry, Amplifier, 020208 electrical & electronic engineering, 02 engineering and technology, Delta-sigma modulation, law.invention, CMOS, Modulation, law, 0202 electrical engineering, electronic engineering, information engineering, Optoelectronics, Figure of merit, Flicker noise, Resistor, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f1a9cd7cd39ef7eeffd75efd3c199555
https://doi.org/10.1109/vlsi-dat49148.2020.9196368 -
5
المؤلفون: Chun-Yen Chang, Chao-Hsin Chien, Ching-Tzung Lin, Yu-Hsien Lin, Tan Fu Lei
المصدر: IEEE Transactions on Electron Devices. 53:782-789
مصطلحات موضوعية: Arrhenius equation, Materials science, Analytical chemistry, Activation energy, Flash memory, Electronic, Optical and Magnetic Materials, Non-volatile memory, symbols.namesake, X-ray photoelectron spectroscopy, Nanoelectronics, Nanocrystal, symbols, Electrical and Electronic Engineering, Spectroscopy
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6
المؤلفون: Shih-Hsiung Chien, Ching-Tzung Lin, Ren-Dau Jan, Min-Yung Shih, Chen Ssu-Ying, Li-Te Wu, Tai-Haur Kuo
المصدر: CICC
مصطلحات موضوعية: Engineering, Total harmonic distortion, EMI, business.industry, Amplifier, Electrical engineering, Electronic engineering, Audio power amplifier, Delta-sigma modulation, business, Noise (electronics), Pulse-width modulation, Electromagnetic interference
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e67e56319b2552863a00a5c245951768
https://doi.org/10.1109/cicc.2014.6946068 -
7
المؤلفون: Ching-Tzung Lin, Bing-Yue Tsui
المصدر: IEEE Transactions on Electron Devices. 52:2455-2462
مصطلحات موضوعية: Materials science, business.industry, Schottky barrier, Electrical engineering, Dielectric, Electronic, Optical and Magnetic Materials, chemistry.chemical_compound, chemistry, Nanoelectronics, Silicide, MOSFET, Optoelectronics, Electrical and Electronic Engineering, business, Metal gate, High-κ dielectric, Leakage (electronics)
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8
المؤلفون: Ching-Tzung Lin, Yu-Hsien Lin, Chao-Hsin Chien, Tan Fu Lei, Chun-Yen Chang
المصدر: IEEE Electron Device Letters. 26:154-156
مصطلحات موضوعية: Non-volatile memory, Spinodal, Materials science, Average size, Nanocrystal, Analytical chemistry, Electronic engineering, Charge loss, Electrical and Electronic Engineering, Thin film, Rapid thermal annealing, Retention time, Electronic, Optical and Magnetic Materials
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9
المؤلفون: Ching-Wei Chen, Ching-Tzung Lin, Chun-Yen Chang, Tan Fu Lei, Chao-Hsin Chien, Yu-Hsien Lin
المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..
مصطلحات موضوعية: Spinodal, Materials science, business.industry, chemistry.chemical_element, Integrated circuit, Hafnium, law.invention, Non-volatile memory, chemistry, Nanoelectronics, Nanocrystal, law, Electronic engineering, Optoelectronics, Erasure, Thin film, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9402480a3abb5d80a085082b8f855daf
https://doi.org/10.1109/iedm.2004.1419387 -
10دورية أكاديمية
المؤلفون: Yu-Hsien Lin, Chao-Hsin Chien, Ching-Tzung Lin, Chun-Yen Chang, Tan-Fu Lei
المصدر: IEEE Transactions on Electron Devices; Apr2006, Vol. 53 Issue 4, p782-789, 8p, 2 Diagrams, 3 Charts, 11 Graphs